Optically encoded particles through porosity variation
The invention concerns a particle having a code from a library of codes embedded in its physical structure by refractive index changes between different regions of the particle. In preferred embodiments, a thin film possesses porosity that varies in a manner to produce a code detectable in the reflectivity spectrum. An assay detection method uses such a particle and detects a spectral shift in the presence of an analyte. Additional embodiments are disclosed including additional features.
1. A traceable encoded micron-sized semiconductor particle or insulator particle having an integral and ordered physical multi-layer porosity structure with multiple porosity interfaces between consecutive multiple porosity layers, the multiple porosity layers having multiple optical thicknesses, wherein the physical multi-layer porosity structure of the multiple porosity interfaces, multiple porosity layers and multiple optical thicknesses is tailored with an optical signature in the form of an interference pattern in a reflectivity spectrum specifying the computer waveform that etched the particle.
2. The particle of claim 1 , further comprising a receptor within the pores of the physical multi-layer porosity structure.
3. The particle of claim 2 , wherein said receptor is a receptor for a biological analyte.
4. The particle of claim 2 , wherein said receptor is a receptor for a chemical analyte.
5. The particle of claim 2 , wherein said receptor is a receptor for a gaseous analyte.
6. The particle of claim 2 , further comprising a fluorescence tag within the pores of the particle for assaying the particle.
7. The particle of claim 1 , wherein the particle comprises porous silicon.
8. A library of optically traceable encoded particles, comprising a plurality of particles, wherein each individual particle has a unique integral and ordered physical multi-layer porosity structure with multiple porosity interfaces between consecutive multiple porosity layers, the multiple porosity layers having multiple optical thicknesses, wherein the physical multi-layer porosity structure of the multiple porosity interfaces, multiple porosity layers and multiple optical thicknesses is tailored with an optical signature in the form of an interference pattern in a reflectivity spectrum specifying the computer waveform that etched the particle.
9. The library of claim 8 , wherein the multiple porosity interfaces comprise generally planar interfaces.
10. The particle of claim 1 , wherein the multiple porosity interfaces comprise generally planar interfaces.
11. A plurality of groups of particles of claim 1 , wherein a first group consists of a plurality of identically structured particles, each of which is configured to produce a first optical signature in the form of an interference pattern in a reflectivity spectrum specifying the computer waveform that etched the first group of particles, and a second group consists of a plurality of identically structured particles, each of which is configured to produce a second optical signature in the form of an interference pattern in a reflectivity spectrum specifying the computer waveform that etched the second group of particles.
12. The particle of claim 1 , comprising an exposed surface for accepting analyte into pores of the physical multi-layer porous structure.
13. The particle of claim 12 , wherein the exposed surface comprises an ozone-oxidized hydrophilic surface.
14. A traceable encoded micro-sized semiconductor particle or insulator particle, comprising:
a first porous layer, with a first porosity; and
a second porous layer with a second porosity that is different than the first porosity,
wherein the porosity of the first porous layer transitions to the second porous layer through a gradual or abrupt porosity interface, and
wherein the first porosity, the second porosity, and the transition from the first porous layer to the second porous layer is tailored and configured to produce an optical signature defined by an interference pattern in a reflectivity spectrum specifying the computer waveform that etched the particle,
wherein at least one of the first and second porous layers provides an exposed planar surface.
15. The particle of claim 1 , wherein a Fourier transform of the interference pattern in the reflectivity spectrum comprises a distinct series of peaks that define the optical signature.
16. The particle of claim 8 , wherein a Fourier transform of the interference pattern in the reflectivity spectrum comprises a distinct series of peaks that define the optical signature that is unique for each of the plurality of particles.
17. The particle of claim 14 , wherein a Fourier transform of the interference pattern in the reflectivity spectrum comprises a distinct series of peaks that define the optical signature.