IP Library Granted Patent US 6,940,318
Granted Patent B1
US 6,940,318 · App. 10/605,534 · Granted Sep 6, 2005

Accurate voltage comparator with voltage-to-current converters for both reference and input voltages

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Quick Facts
Patent No.
US 6,940,318
App. No.
10/605,534
Granted
Sep 6, 2005
Kind
B1
Abstract

A stable voltage that is independent of supply voltage is applied to a pair of current sources. A first current source generates a first current that passes through a first resistor, setting a compare-in-put voltage. A source-input voltage is applied to the first current source to vary the first current and the compare-input voltage. A second current source generates a stable current that passes through a second resistor, setting a reference voltage. The compare-input voltage and the reference voltage are applied to inputs of a comparator that generates an output voltage that indicates when the source-input voltage causes the compare-input voltage to rise past the reference voltage. The first and second currents track each other over temperature and process variations and are independent of supply voltage. A more accurate comparison of the source-input voltage is thus made.

Claims (41)

1. A voltage sensor circuit comprising:

a source-input node having a source-input voltage that is varied by a voltage source, the voltage sensor circuit sensing the source-input voltage of the source-input node;

a first current source, responsive to the source-input voltage, for generating a first current that varies with variations in the source-input voltage;

a first resistor, coupled to the first current source and receiving the first current, for generating a compare-input voltage on a compare-input node in response to the first current, the compare-input voltage varying with variations in the first current;

a second current source for generating a second current that is insensitive to variations in the source-input voltage;

a second resistor, coupled to the second current source and receiving the second current, for generating a reference voltage on a reference node in response to the second current, the reference voltage varying with variations in the second current;

a stable node, coupled to the first current source and coupled to the second current source, the stable node having a stable voltage that is relatively insensitive to changes in a supply voltage;

a comparator coupled to the compare-input node and the reference node, for comparing the compare-input voltage to the reference voltage and generating an output voltage at an output node that indicates when the compare-input voltage is above the reference voltage;

wherein the first current source comprises:

a first mirror transistor having a channel that conducts the first current between the stable node and the compare-input node in response to a first gate node;

a first setting transistor, with a gate connected to the first gate node, having a channel that conducts a first setting current between the stable node and the first gate node;

a first sensing transistor having a channel that conducts a portion of the first setting current from the first gate node, the first sensing transistor having a gate connected to the source-input voltage;

wherein the second current source comprises:

a second mirror transistor having a channel that conducts the second current between the stable node and the reference node in response to a second gate node;

a second setting transistor, with a gate connected to the second gate node, having a channel that conducts a second setting current between the stable node and the second gate node; and

a second sensing transistor having a channel that conducts a portion of the second setting current from the second gate node, the second sensing transistor having a gate connected to a fixed voltage.

2. The voltage sensor circuit of claim 1 wherein the fixed voltage applied to the gate of the second sensing transistor is the stable voltage.

3. The voltage sensor circuit of claim 2 wherein the first and second mirror transistors and the first and second setting transistors are p-channel transistors;

wherein the first and second sensing transistors are n-channel transistors.

4. The voltage sensor circuit of claim 3 wherein a cross-over voltage of the source-input voltage that causes the output voltage to change states varies less than +/−4% over a temperature range from −40 to +85 degrees C.

5. The voltage sensor circuit of claim 1 further comprising:

a voltage generator for generating the stable voltage on the stable node that is independent of the supply voltage to the comparator.

6. The voltage sensor circuit of claim 5 wherein the voltage generator is a band-gap voltage generator.

7. The voltage sensor circuit of claim 6 wherein the comparator is powered by the supply voltage.

8. A temperature-insensitive voltage sensor comprising:

an input voltage from a varying voltage source;

compare means, having a first input and a second input, for comparing voltages on the first and second inputs to generate an output;

first resistor means, receiving a first current, for generating a compare voltage on the first input of the compare means;

first mirror transistor means, having a gate connected to a first gate node, for generating the first current from a stable node to the first input of the compare means and to the first resistor means;

first current-source transistor means, having a gate and a drain connected to the first gate node and a source connected to the stable node, for generating a first gate voltage on the first gate node;

first sensing transistor means, having a gate driven by the input voltage, for varying a first sink current from the first gate node in response to the input voltage;

second resistor means, receiving a second current, for generating a reference voltage on the second input of the compare means;

second mirror transistor means, having a gate connected to a second gate node, for generating the second current from the stable node to the second input of the compare means and to the second resistor means;

second current-source transistor means, having a gate and a drain connected to the second gate node and a source connected to the stable node, for generating a second gate voltage on the second gate node; and

second sensing transistor means, having a gate driven by a constant voltage, for generating a second sink current from the second gate node.

9. The temperature-insensitive voltage sensor of claim 8 further comprising:

stable-voltage generator means for generating a stable voltage on the stable node, the stable voltage being insensitive to a supply voltage to the compare means.

10. The temperature-insensitive voltage sensor of claim 9 wherein the first and second sensing transistor means are n-channel transistors having grounded sources;

wherein the first and second mirror transistor means are p-channel transistors having sources connected to the stable node;

wherein the first and second current-source transistor means are p-channel transistors having sources connected to the stable node and each having a drain shorted to a gate.

11. The temperature-insensitive voltage sensor of claim 10 wherein the constant voltage to the gate of the second sensing transistor means is the stable voltage.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 26, 2017
From: PERICOM SEMICONDUCTOR CORPORATION
To: DIODES INCORPORATED
Reel/Frame 044975/0554 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 2, 2003
From: WONG, ANTHONY YAP
To: PERICOM SEMICONDUCTOR CORP.
Reel/Frame 014171/0103 →