Thin scale outline package

1. A semiconductor die stack comprising:

at least two semiconductor dies vertically stacked upon each other, each semiconductor die defines opposed top and bottom surfaces and opposed pairs of longitudinal and lateral side surfaces;

leads which extend out from at least one of the side surfaces of each of the semiconductor dies, the leads define first end portions, middle portions, second end portions, first junctions and second junctions, the second junctions of the leads of the upper semiconductor die are electrically connected to respective ones of the first junctions of the leads of the lower semiconductor die, the first and second junctions of the leads of the upper and lower semiconductor dies are bent in opposing directions;

the middle portions of the leads of the upper semiconductor die being electrically connected to respective ones of the first junctions of the leads of the lower semiconductor die;

the first junctions of the leads of the upper and lower semiconductor dies having a bend radii, bend distances, and bend angles, the bend radii, bend distances and bend angles of the first junctions of the leads of the upper and lower semiconductor dies being equal to each other; and

the second junctions of the leads of the upper semiconductor die have a flared ski tip configuration.

2. A semiconductor die stack comprising:

at least two semiconductor dies vertically stacked upon each other, each semiconductor die defines opposed top and bottom surfaces and opposed pairs of longitudinal and lateral side surfaces;

leads which extend out from at least one of the side surfaces of each of the semiconductor dies, the leads define first end portions, middle portions, second end portions, first junctions and second junctions, the second junctions of the leads of the upper semiconductor die are electrically connected to respective ones of the first junctions of the leads of the lower semiconductor die, the first and second junctions of the leads of the upper and lower semiconductor dies are bent in opposing directions,

the first junctions of the leads of the upper semiconductor die being electrically connected to respective ones of the middle portions of the leads of the lower semiconductor die;

bend distances of the first junctions of the leads of the upper semiconductor die being greater than the bend distances of the first junctions of the leads of the lower semiconductor die.

3. The semiconductor die stack of claim 2 wherein the difference between the bend distances of the first junctions of the leads of the upper and lower semiconductor dies is at least a width of the leads of the lower semiconductor die.

4. The semiconductor die stack of claim 3 wherein the second junctions of the leads of the upper semiconductor die have a flared ski tip configuration.

5. A semiconductor die stack comprising:

at least two semiconductor dies vertically stacked upon each other, each semiconductor die defines opposed top and bottom surfaces and opposed pairs of longitudinal and lateral side surfaces;

leads which extend out from at least one of the side surfaces of each of the semiconductor dies, the leads define first end portions, middle portions, second end portions, first junctions and second junctions, the second junctions of the leads of the upper semiconductor die are electrically connected to respective ones of the first junctions of the leads of the lower semiconductor die, the first and second junctions of the leads of the upper and lower semiconductor dies are bent in opposing directions; and

at least one narrow jumper strip electrically connected to adjacent leads of at least one of the semiconductor dies.

6. The semiconductor die stack of claim 5 wherein the narrow jumper strip(s) is electrically connected to the middle portions of the adjacent leads.

7. The semiconductor die stack of claim 6 wherein the narrow jumper strip has a cross sectional area along its length equal to a cross sectional area along the height of the leads to which the narrow jumper strips are attached.

8. The semiconductor die stack of claim 7 wherein the narrow jumper strip(s) may be fabricated from the same material as the leads of the semiconductor die.

9. A semiconductor die stack comprising:

at least two semiconductor dies vertically stacked upon each other, each semiconductor die defines opposed top and bottom surfaces and opposed pairs of longitudinal and lateral side surfaces;

leads which extend out from at least one of the side surfaces of each of the semiconductor dies, the leads define first end portions, middle portions, second end portions, first junctions and second junctions, the second junctions of the leads of the upper semiconductor die are electrically connected to respective ones of the first junctions of the leads of the lower semiconductor die, the first and second junctions of the leads of the upper and lower semiconductor dies are bent in opposing directions; and

at least one wide jumper strip electrically connected to at least two leads of at least one of the semiconductor dies, the at least two leads which are electrically connected to the wide jumper strip have at least one interposed lead there between.

10. The semiconductor die stack of claim 9 wherein the wide jumper strip has a C shaped configuration.

11. The semiconductor die stack of claim 10 further comprising dielectric between the wide jumper strip and the interposed lead(s).

12. The semiconductor die stack of claim 11 wherein the wide jumper strip is electrically connected to the middle portions of the leads.

13. The semiconductor die stack of claim 12 wherein the wide jumper strip has a cross sectional area along its length equal to a cross sectional area along a height of the leads to which the wide jumper strip is attached.

14. The semiconductor die stack of claim 13 wherein the wide jumper strip may be fabricated from the same material as the leads of the semiconductor die.