IP Library › Granted Patent US 7,254,168
Granted Patent B2
US 7,254,168 · App. 10/625,951 · Granted Aug 7, 2007

Method for decomposing timing jitter on arbitrary serial data sequences

Assignee: Tektronix, Inc.
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Quick Facts
Patent No.
US 7,254,168
App. No.
10/625,951
Granted
Aug 7, 2007
Kind
B2
Abstract

A method and apparatus for decomposing timing jitter on arbitrary serial data sequences. Specifically, in one embodiment according to the present invention, a method is provided of decomposing timing jitter on a signal under test (SUT) comprising an arbitrary serial data stream. The method comprises performing a statistical analysis on a group of measurements, where each measurement comprises a timing jitter value and an associated bit pattern representing the bits falling within an analysis window, said window being successively located at a plurality of positions within the data stream.

Claims (30)

1. A method of decomposing timing jitter on a signal under test (SUT) comprising an arbitrary serial data stream, said method comprising:

forming a group of measurements, where each measurement includes a timing jitter value and an associated bit pattern representing bits falling within an analysis window of a chosen length, said analysis window being successively located at a plurality of positions within the SUT; and

performing a statistical analysis on said group of measurements to calculate a mean value of inter-symbol interference (ISI) associated with each bit pattern.

2. The method of claim 1 , wherein said ISI is determined for a specified edge polarity only.

3. The method of claim 1 , further comprising separating random and periodic jitter from said timing jitter.

4. The method of claim 1 , further comprising estimating duty cycle distortion (DCD) from said timing jitter.

5. The method of claim 4 , further comprising removing said DCD from said timing utter.

6. The method of claim 4 , further comprising estimating the probability density function (PDF) of said ISI plus said DCD.

7. The method of claim 1 , further comprising removing said ISI from siad timing jitter.

8. The method of claim 1 , further comprising estimating a probability density function (PDF) of said ISI.

9. A test and measurement device, comprising:

an acquisition module, for acquiring signal under test SUT to produce a sample stream;

a processing module, for

forming a group of measurements, where each measurement includes a timing jitter value and an associated bit pattern representing bits falling within an analysis window of a chosen length, said analysis window being successively located at a plurality of positions within the sampl stream, and

performing a statistical analysis on said group of measurements to calculate a mean value of inter-symbol interference (ISI) associated with each bit pattern; and

a display module, for displaying results of said statistical analysis.

10. The test and measurement device of claim 9 , wherein said processing module is further for determining said ISI for a specified edge polarity only.

11. The test and measurement device of claim 9 , wherein said processing module is further for separating random and periodic jitter from said timing utter.

12. The test and measurement device of claim 9 , wherein said processing module is further for estimating duty cycle distortion (DCD) from said timing jitter.

13. The test and measurement device of claim 12 , wherein said processing module is further for removing said DCD from said timing jitter.

14. The test and measurement device of claim 9 , wherein said processing module is further for removing said ISI from said timing jitter.

15. A computer-readable media for storing software instructions which when executed by a processor perform the steps of:

decomposing timing jitter on a signal under test (SUT), the SUT being an arbitrary serial data stream, by

forming a group of measurements, where each measurement includes a timing jitter value and an associated bit pattern representing bits falling within an analysis window of a chosen length, said analysis window being successively located at a plurality of positions within the arbitrary serial data stream; and

performing a statistical analysis on said group of measurements to calculate the a mean value of inter-symbol interference (ISI) associated with each bit pattern.

16. The computer-readable media of claim 15 , wherein said ISI is determined for a specified edge polarity only.

17. The computer-readable media of claim 15 , further comprising instructions for separating random and periodic jitter from said timing jitter.

18. The computer-readable media of claim 15 , further comprising instructions for estimating duty cycle distortion (DCD) from said timing jitter.

19. The computer-readable media of claim 18 , further comprising instructions for removing said DCD from said timing jitter.

20. The computer-readable media of claim 15 , further comprising instructions for removing said ISI from said timing jitter.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2007
From: GUENTHER, MARK L.
To: TEKTRONIX, INC.
Reel/Frame 019481/0978 →
Continuity (2)
Provisional Application 6042263100 · Oct 29, 2002
Related Publication 20040136450A1 · Jul 15, 2004