Method and apparatus for determining the influencing of the state of polarization by an optical system; and an analyser
View Patent ↗A method and an apparatus for determining the influencing of the state of polarization of optical radiation by an optical system under test, wherein radiation with a defined entrance state of polarization is directed onto the optical system, the exit-side state of polarization is measured, and the influencing of the state of polarization is determined by the optical system with the aid of evaluation of the exit state of polarization with reference to the entrance state of polarization. An analyser arrangement which can be used for this purpose is also disclosed. The method and the apparatus are used, e.g., to determine the influencing of the state of polarization of optical radiation by an optical imaging system of prescribable aperture, the determination being performed in a pupil-resolved fashion.
1. A method for determining the influencing of the state of polarization of optical radiation by an optical system, comprising
directing entrance-side radiation with a defined entrance state of polarization onto the optical system,
measuring the exit state of polarization by radiation emerging from the optical system, and
determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein the influencing of the state of polarization caused by the optical system of prescribable aperture is determined with pupil resolution; and
wherein an associated ellipsometric measurement is carried out;
wherein the optical system is a microlithography objective.
2. A method according to claim 1 , wherein the defined entrance state of polarization is provided in an object plane of the optical system, and the exit state of polarization is measured with pupil resolution within a prescribable pupil range of the optical system.
3. A method according to claim 1 , wherein evaluating the measured exit state of polarization includes a determination of the phase-reduced Jones matrix.
4. A method for determining the influencing of the state of polarization of optical radiation by an optical system, comprising
directing entrance-side radiation with a defined entrance state of polarization onto the optical system,
measuring the exit state of polarization by radiation emerging from the optical system, and
determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein the influencing of the state of polarization caused by the optical system of prescribable aperture is determined with pupil resolution;
wherein an associated ellipsometric measurement is carried out; and
wherein a spatially incoherent point light radiation emanating from the object plane of the optical system is provided as entrance-side radiation.
5. A method for determining the influencing of the state of polarization of optical radiation by an optical system, comprising
directing entrance-side radiation with a defined entrance state of polarization onto the optical system,
measuring the exit state of polarization by radiation emerging from the optical system, and
determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein the influencing of the state of polarization caused by the optical system of prescribable aperture is determined with pupil resolution; and
wherein directing entrance side radiation with the defined entrance state of polarization, measuring the exit state of polarization and evaluating the measured exit state of polarization include a shearing interferometric measurement or a point diffraction interferometric measurement.
6. A method according to claim 5 , wherein the result of the shearing interferometric measurement or of the point-diffraction interferometric measurement is subjected to a downstream polarization analysis.
7. An apparatus for determining the influencing of the state of polarization of optical radiation by an optical system, comprising:
means for providing entrance-side radiation, directed onto the optical system, with a defined entrance state of polarization,
polarization detector means for measuring the exit state of polarization of radiation emerging from the optical system, and
an evaluation unit for determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein
the polarization detector means is configured to measure the exit state of polarization with pupil resolution;
the evaluation unit is configured to determine the influencing of the state of polarization with pupil resolution;
the means for providing the entrance-side radiation includes a perforated mask in an object plane of the optical system and a first polarization means, upstream from the perforated mask; and
the first polarization means includes a polarizer unit and/or a compensator unit in serial arrangement, which can be set to various spatial orientations.
8. An apparatus according to claim 7 , wherein the means for providing the entrance-side radiation includes a diffusing screen in front of the first polarization means.
9. An apparatus according to claim 7 , wherein the polarization detector means includes a CCD detector and a second polarization means, upstream from the CCD detector.
10. An apparatus according to claim 7 , wherein the evaluation unit is configured for determining the phase-reduced or complete, pupil-resolved Jones matrix.
11. An apparatus for determining the influencing of the state of polarization of optical radiation by an optical system, comprising:
means for providing entrance-side radiation, directed onto the optical system, with a defined entrance state of polarization,
polarization detector means for measuring the exit state of polarization of radiation emerging from the optical system, and
an evaluation unit for determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein
the polarization detector means is configured to measure the exit state of polarization with pupil resolution;
the evaluation unit is configured to determine the influencing of the state of polarization with pupil resolution;
the means for providing the entrance-side radiation includes a perforated mask in an object plane of the optical system and a first polarization means, upstream from the perforated mask; and
the first polarization means includes a polarizer unit and/or a compensator unit in serial arrangement, which can be set to various spatial orientations
the polarization detector means includes a shearing interferometer unit or a point-diffraction interferometry unit.
12. A method for determining the influencing of the state of polarization of optical radiation by an optical system, comprising:
directing entrance-side radiation with a defined en-trance state of polarization onto the optical system,
measuring the exit state of polarization by radiation emerging from the optical system, and
determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein the influencing of the state of polarization caused by the optical system of prescribable aperture is determined with pupil resolution; and
wherein a spatially incoherent point light radiation emanating from the object plane of the optical system is provided as entrance-side radiation.
13. A method according to claim 12 , wherein the defined entrance state of polarization is provided in an object plane of the optical system, and the exit state of polarization is measured with pupil resolution within a prescribable pupil range of the optical system.
14. A method according to claim 12 , wherein evaluating the measured exit state of polarization includes a determination of the phase-reduced Jones matrix; and
an associated ellipsometric measurement is carried out.
15. A method for determining the influencing of the state of polarization of optical radiation by an optical system, comprising:
directing entrance-side radiation with a defined en-trance state of polarization onto the optical system,
measuring the exit state of polarization by radiation emerging from the optical system, and
determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein the influencing of the state of polarization caused by the optical system of prescribable aperture is determined with pupil resolution;
wherein a spatially incoherent point light radiation emanating from the object plane of the optical system is provided as entrance-side radiation; and
wherein directing entrance side radiation with the defined entrance state of polarization, measuring of the exit state of polarization and evaluating the measured exit state of polarization include a shearing interferometric measurement or a point diffraction interferometric measurement.
16. A method according to claim 15 , wherein the result of the shearing interferometric measurement or of the point-diffraction interferometric measurement is subjected to a downstream polarization analysis.
17. An apparatus for determining the influencing of the state of polarization of optical radiation by an optical system, comprising:
means for providing entrance-side radiation, directed onto the optical system, with a de-fined entrance state of polarization,
polarization detector means for measuring the exit state of polarization of radiation emerging from the optical system, and
an evaluation unit for determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein
the polarization detector means are configured to measure the exit state of polarization with pupil resolution;
the evaluation unit is configured to determine the influencing of the state of polarization with pupil resolution; and
the means for providing the entrance-side radiation includes a perforated mask in an object plane of the optical system and a first polarization means, upstream of the perforated mask.
18. An apparatus according to claim 17 , wherein the means for providing the entrance-side radiation includes a diffusing screen in front of the first polarization means.
19. An apparatus according to claim 17 , wherein the polarization detector means includes a CCD detector and a second polarization means upstream from the CCD detector.
20. An apparatus according to claim 17 , wherein the evaluation unit is configured for determining the phase-reduced or complete, pupil-resolved Jones matrix.
21. An apparatus for determining the influencing of the state of polarization of optical radiation by an optical system, comprising:
means for providing entrance-side radiation, directed onto the optical system, with a de-fined entrance state of polarization,
polarization detector means for measuring the exit state of polarization of radiation emerging from the optical system, and
an evaluation unit for determining the influencing of the state of polarization by the optical system by means of evaluating the measured exit state of polarization with reference to the entrance state of polarization,
wherein
the polarization detector means are configured to measure the exit state of polarization with pupil resolution;
the evaluation unit is configured to determine the influencing of the state of polarization with pupil resolution; and
the means for providing the entrance-side radiation includes a perforated mask in an object plane of the optical system and a first polarization means, upstream of the perforated mask; and
the polarization detector means includes a shearing interferometer unit or a point-diffraction interferometry unit.