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App. No. 10/639,737 · Confirmation No. 5906

Low defect density silicon

Expressly Abandoned -- During Examination View Publication ↗
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 Code Description Pages PDF
2005-05-25 ABN.EXPRESS Internal document noting that an Express Abandonment request has been processed 2 View
2005-05-17 EABN Letter Express Abandonment of the application 2 View
2004-11-17 CTNF Non-Final Rejection 5 View
2004-11-17 1449 List of References cited by applicant and considered by examiner 10 View
2004-11-17 892 List of references cited by examiner 1 View
2004-11-17 FWCLM Index of Claims 1 View
2004-11-17 BIB Bibliographic Data Sheet 2 View
2004-11-17 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2003-12-08 SPEC Specification 33 View
2003-12-08 CLM Claims 5 View
2003-12-08 ABST Abstract 1 View
2003-11-18 IDS Information Disclosure Statement (IDS) Form (SB08) 11 View
2003-11-10 PEFN Pre-Exam Formalities Notice 2 View
2003-08-12 TRNA Transmittal of New Application 4 View
2003-08-12 SPEC Specification 33 View
2003-08-12 CLM Claims 5 View
2003-08-12 ABST Abstract 1 View
2003-08-12 DRW Drawings-only black and white line drawings 17 View
2003-08-12 OATH Oath or Declaration filed 7 View
2003-08-12 ADS Application Data Sheet 2 View
2003-08-12 WFEE Fee Worksheet (SB06) 1 View
2003-08-12 WFEE Fee Worksheet (SB06) 1 View
2003-08-12 ARTIFACT Artifact sheet indicating an item has been filed which cannot be scanned 1 View
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Quick Facts
App. No.
10/639,737
Filed
2003-08-12
Pub. No.
US20040070012A1
Art Unit
1722