IP Library Granted Patent US 6,901,349
Granted Patent B2
US 6,901,349 · App. 10/644,717 · Granted May 31, 2005

Analysis apparatus and analysis method

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Quick Facts
Patent No.
US 6,901,349
App. No.
10/644,717
Granted
May 31, 2005
Kind
B2
Abstract

An analysis apparatus has a measurement head for measuring characteristics of a sample, a calibration conditions file comprising at least one calibration condition obtained by carrying out device calibration for the measurement head in advance, and a measurement head controller for designating one of the calibration conditions within the calibration conditions file. Measurement sequence data comprised of a sequence of measurement steps has measurement conditions for carrying out measurements by the measurement head and the calibration conditions designated by the measurement head controller. A measurement device refers to each measurement step of the measurement sequence data and carries out measurement after inputting the measurement conditions and the calibration conditions for each measurement step to the measurement head.

Claims (9)

1. An analysis apparatus comprising:

a measurement head for measuring characteristics of a sample;

a calibration conditions file comprising at least one calibration condition obtained by carrying out device calibration for the measurement head in advance;

designation means for designating one of the calibration conditions within the calibration conditions file;

a measurement sequence data comprised of data representing a sequence of measurement steps comprising measurement conditions for carrying out measurements by the measurement head and the calibration conditions designated by the designation means; and

measurement means for referring to each measurement step of the measurement sequence and carrying out measurement after inputting the measurement conditions and the calibration conditions for each measurement step to the measurement head.

2. An analysis apparatus according to claim 1 ; further comprising means for saving calibration conditions obtained by carrying out device calibration on the measurement head in advance as a file in the calibration conditions file and designating the calibration conditions used in each measurement step in the measurement sequence using a calibration conditions file name.

3. An analysis apparatus according to claim 1 ; wherein the analysis apparatus is a thermal analysis apparatus; and wherein the measurement head has a furnace for heating the sample and control means for measuring physical characteristics of the sample while varying the temperature of the furnace.

4. An analysis apparatus according to claim 2 ; wherein the analysis apparatus is a thermal analysis apparatus; and wherein the measurement head has a furnace for heating the sample and control means for measuring physical characteristics of the sample while varying the temperature of the furnace.

Assignments (2)
CHANGE OF NAME Recorded Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2005
From: NAGASAA, JUN
To: SII NANOTECHNOLOGY INC.
Reel/Frame 016494/0871 →