IP Library Granted Patent US 6,919,137
Granted Patent B2
US 6,919,137 · App. 10/665,492 · Granted Jul 19, 2005

High-strength solder joint

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Quick Facts
Patent No.
US 6,919,137
App. No.
10/665,492
Granted
Jul 19, 2005
Kind
B2
Abstract

A soldering method achieving a high-strength joint between a solder and an nickel/gold electroless plated surface is disclosed. The nickel/gold electroless plated layer is soldered using a solder including tin (Sn), silver (Ag), and copper (Cu). At a solder joint, a layer sturcture of nickel layer/intermetallic compound layer/solder layer is formed. The intermetallic compound layer is composed mainly of tin (Sn) and copper (Cu), and further including nickel (Ni). The intermetallic compound layer has cauliflower-shaped surfaces formed in a solder-layer's side thereof.

Claims (59)

1. A solder joint between a solder and a conductor terminal formed on a wiring structure, comprising:

a nickel layer formed by nickel-phosphorus electroless plating on the conductor terminal;

an intermetallic compound layer formed on the nickel layer, the intermetallic compound layer including tin (Sn), copper (Cu),and nickel (Ni); and

a solder layer formed on the intermetallic compound layer, the solder layer including tin (Sn), silver (Ag), and copper (Cu).

2. The solder joint according to claim 1 , wherein the intermetallic compound is composed mainly of tin (Sn) and copper (Cu).

3. The solder joint according to claim 1 , wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof.

4. The solder joint according to claim 1 , wherein the conductor terminal is composed mainly of copper.

5. A solder joint between a solder and a conductor terminal formed on a wiring structure, comprising:

a nickel layer formed by nickel-phosphorus electroless plating on the conductor terminal;

an intermetallic compound layer formed on the nickel layer; and

a solder layer formed on the intermetallic compound layer,

wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof, the botryoidal surfaces comprising tin, copper, and nickel.

6. The solder joint according to claim 5 , wherein the conductor terminal is composed mainly of copper.

7. The solder joint of claim 5 , wherein, the solder layer includes tin (Sn), silver (Ag), and copper (Cu).

8. A wiring structure having a plurality of conductor terminals formed thereon, each of which is soldered to form a solder joint, the solder joint comprising:

a nickel layer formed by nickel-phosphorus electroless plating on a said conductor terminal;

an intermetallic compound layer formed on the nickel layer, the intermetallic compound layer including tin (Sn), copper (Cu),and nickel (Ni); and

a solder layer formed on the intermetallic compound layer, the solder layer including tin (Sn), silver (Ag), and copper (Cu).

9. The wiring structure according to claim 8 , wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof.

10. A wiring structure having a plurality of conductor terminals formed thereon, each of which is soldered to form a solder joint, the solder joint comprising:

a nickel layer formed by nickel-phosphorus electroless plating on a said conductor terminal;

an intermetallic compound layer formed on the nickel layer; and

a solder layer formed on the intermetallic compound layer,

wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof, the botryoidal surfaces comprising tin, copper, and nickel.

11. The wiring structure of claim 10 , wherein, the solder layer includes tin (Sn), silver (Ag), and copper (Cu).

12. A device comprising:

a wiring substrate having a plurality of substrate terminals formed thereon; and

a functional circuit having a plurality of circuit terminals, wherein the substrate terminals are soldered to respective ones of the circuit terminals at solder joints,

wherein each of the solder joints comprises:

a nickel layer formed by nickel-phosphorus electroless plating on each of a corresponding substrate terminal and a corresponding circuit terminal;

an intermetallic compound layer formed on the nickel layer, the intermetallic compound layer including tin (Sn), copper (Cu),and nickel (Ni); and

a solder layer formed on the intermetallic compound layer, the solder layer including tin (Sn), silver (Ag), and copper (Cu).

13. The device according to claim 12 , wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof.

14. A device comprising:

a wiring substrate having a plurality of substrate terminals formed thereon; and

a functional circuit having a plurality of circuit terminals, wherein the substrate terminals are electrically connected to respective ones of the circuit terminals at solder joints,

wherein each of the solder joints comprises:

a nickel layer formed by nickel-phosphorus electroless plating on each of a corresponding substrate terminal and a corresponding circuit terminal;

an intermetallic compound layer formed on the nickel layer; and

a solder layer formed on the intermetallic compound layer,

wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof, the botryoidal surfaces comprising tin, copper, and nickel.

15. The device of claim 14 , wherein, the solder layer includes tin (Sn), silver (Ag), and copper (Cu).

16. A device comprising:

a printed circuit substrate having a plurality of substrate terminals formed thereon; and

a semiconductor chip package having a plurality of package terminals, wherein the substrate terminals are soldered to respective ones of the package terminals at solder joints,

wherein each of the solder joints comprises:

a nickel layer formed by nickel-phosphorus electroless plating on each of a corresponding substrate terminal and a corresponding package terminal;

an intermetallic compound layer formed on the nickel layer, the intermetallic compound layer including tin (Sn), copper (Cu), and nickel (Ni); and

a solder layer formed on the intermetallic compound layer, the solder layer including tin (Sn), silver (Ag), and copper (Cu).

17. The device according to claim 16 , wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof.

18. A device comprising:

a printed circuit substrate having a plurality of substrate terminals formed thereon; and

a semiconductor chip package having a plurality of package terminals, wherein the substrate terminals are soldered to respective ones of the package terminals at solder joints,

wherein each of the solder joints comprises:

a nickel layer formed by nickel-phosphorus electroless plating on each of a corresponding substrate terminal and a corresponding package terminal;

an intermetallic compound layer formed on the nickel layer; and

a solder layer formed on the intermetallic compound layer,

wherein the intermetallic compound layer has botryoidal surfaces formed in a solder-layer's side thereof, the botryoidal surfaces comprising tin, copper, and nickel.

19. The device of claim 18 , wherein, the solder layer includes tin (Sn), silver (Ag), and copper (Cu).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2015
From: NEC CORPORATION
To: GODO KAISHA IP BRIDGE 1
Reel/Frame 034834/0806 →