IP Library Granted Patent US 6,974,761
Granted Patent B2
US 6,974,761 · App. 10/670,719 · Granted Dec 13, 2005

Method of forming a semiconductor laser chip having a marker

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Quick Facts
Patent No.
US 6,974,761
App. No.
10/670,719
Granted
Dec 13, 2005
Kind
B2
Abstract

A method of manufacturing a semiconductor laser chip has following steps. First, a semiconductor substrate including an active layer and a block layer is provided. An electrode line pattern and a marker are formed on the semiconductor substrate. The semiconductor substrate is etched to form a W channel. Then, an oxide layer is formed on the semiconductor substrate to cover the electrode line pattern and the marker. A part of the oxide layer to form an electrode contact that exposes the electrode line pattern. A mounting electrode is formed on the electrode line pattern. Finally, the semiconductor substrate is divided into a plurality of semiconductor laser chip.

Claims (26)

1. A method of manufacturing a semiconductor laser chip comprising:

providing a semiconductor substrate including an active layer and a block layer;

forming an electrode line pattern and a marker on the semiconductor substrate;

etching the semiconductor substrate to form a W channel;

forming an oxide layer on the semiconductor substrate to cover the electrode line pattern and the marker;

removing a part of the oxide layer to form an electrode contact that exposes the electrode line pattern;

forming a mounting electrode on the electrode line pattern; and

dividing the semiconductor substrate into a plurality of semiconductor laser chip.

2. A method of manufacturing a semiconductor laser chip according to claim 1 , wherein the electrode line pattern is formed at a junction side of the semiconductor substrate.

3. A method of manufacturing a semiconductor laser chip according to claim 1 , wherein the semiconductor substrate is an InP substrate.

4. A method of manufacturing a semiconductor laser chip according to claim 1 , further comprising performing a sintering so as to ensure an ohmic contact between the electrode line pattern and the semiconductor substrate.

5. A method of manufacturing a semiconductor laser chip according to claim 1 , wherein the electrode line pattern and the marker are formed of AuZu.

6. A method of manufacturing a semiconductor laser chip according to claim 1 , further comprising etching the oxide layer at a portion that is a peripheral region of the semiconductor laser chip.

7. A method of manufacturing a semiconductor laser chip according to claim 1 , further comprising coating an end surface of the semiconductor laser chip.

8. A method of manufacturing a semiconductor laser chip having a marker for detecting a position of the chip, the method comprising:

providing a semiconductor substrate including an active layer and a block layer;

forming an electrode line pattern and a marker on the semiconductor substrate;

forming an oxide layer on the semiconductor substrate so as to cover the electrode line pattern and the marker;

removing a part of the oxide layer to form an electrode contact that exposes the electrode line pattern;

forming a mounting electrode on the electrode line pattern; and

dividing the semiconductor substrate into a plurality of semiconductor laser chip.

9. A method of manufacturing a semiconductor laser chip according to claim 8 , wherein the semiconductor substrate is an InP substrate.

10. A method of manufacturing a semiconductor laser chip according to claim 8 , further comprising performing a sintering so as to ensure an ohmic contact between the electrode line pattern and the semiconductor substrate.

11. A method of manufacturing a semiconductor laser chip according to claim 8 , wherein the electrode line pattern and the marker are formed of AuZu.

12. A method of manufacturing a semiconductor laser chip according to claim 8 , wherein the semiconductor laser chip includes a plurality of markers.

13. A method of manufacturing a semiconductor laser chip according to claim 8 , wherein the marker has a substantial round shape.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2023
From: NEOPHOTONICS SEMICONDUCTOR GK
To: NEOPHOTONICS CORPORATION
Reel/Frame 063148/0468 →
CHANGE OF NAME Recorded Oct 22, 2013
From: OKI SEMICONDUCTOR CO., LTD.
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 031627/0671 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 20, 2013
From: LAPIS SEMICONDUCTOR CO., LTD.
To: NEOPHOTONICS SEMICONDUCTOR GK
Reel/Frame 031040/0194 →
CHANGE OF NAME Recorded Dec 18, 2008
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022038/0711 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2003
From: MURAISHI, MITSUMASA
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 014548/0092 →