IP Library Granted Patent US 7,057,933
Granted Patent B2
US 7,057,933 · App. 10/672,122 · Granted Jun 6, 2006

Non-volatile memory device with erase address register

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Quick Facts
Patent No.
US 7,057,933
App. No.
10/672,122
Granted
Jun 6, 2006
Kind
B2
Abstract

A non-volatile memory device includes an array of non-volatile memory cells. The memory has control circuitry to erase the non-volatile memory cells and perform erase verification operations. The memory can be arranged in numerous erasable blocks and/or sub-blocks. An erase register stores data indicating an erase state of corresponding memory sub-blocks. During erase verification, the memory programs the erase register when a non-erased memory cell is located in a corresponding sub-block. Additional erase pulses can be selectively applied to sub-blocks based upon the erase register data. Likewise, erase verification operations can be selectively performed on sub-blocks based upon the erase register data. An address register is provided to store an address of a non-erased memory cell identified during verification. The address from the register is used as a start address for subsequent verification operations on the same array location.

Claims (17)

1. A method for erasing a flash memory, the method comprising:

applying an erase pulse to a block of memory cells;

sequentially reading memory cells of a first sub-block of the block of memory cells;

storing an address of a first memory cell that is determined to be programmed;

applying a second erase pulse to the block of memory cells; and

performing a second sequential reading of the memory cells of the first sub-block starting at the first memory cell address.

2. The method of claim 1 further comprises sequentially reading memory cells of a second sub-block prior to applying the second erase pulse.

3. The method of claim 1 where the address of the first memory cell is stored in an address register corresponding to the first sub-block.

4. The method of claim 1 wherein the address of the first memory cell is loaded into an address counter prior to performing the second sequential reading.

5. A flash memory device comprising:

a memory array comprising a plurality of blocks of addressable memory cells; and

a state machine capable of erasing the flash memory device by applying an erase pulse to a first block of addressable memory cells, sequentially reading memory cells of a first sub-block of the block of addressable memory cells, storing an address of a first memory cell that is determined to be programmed, applying a second erase pulse to the first block of memory cells, and performing a second sequential reading of the memory cells of the first sub-block starting at the first memory cell address.

6. A flash memory system comprising:

a processor for generating memory control signals; and

a flash memory device coupled to the processor, the flash memory device comprising:

a memory array comprising a plurality of blocks of addressable memory cells; and

a state machine that operates in response to the memory control signals, the state machine capable of erasing the flash memory device by applying an erase pulse to a first block of addressable memory cells, sequentially reading memory cells of a first sub-block of the block of addressable memory cells, storing an address of a first memory cell that is determined to be programmed, applying a second erase pulse to the first block of memory cells, and performing a second sequential reading of the memory cells of the first sub-block starting at the first memory cell address.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2010
From: MICRON TECHNOLOGY, INC.
To: ROUND ROCK RESEARCH, LLC
Reel/Frame 023786/0416 →