Method of manufacturing semiconductor chip having supporting member

1. A method of forming a semiconductor chip, comprising:

providing a substrate having a main surface, the main surface including a frame-shaped first area, which is along sides of the main surface, and a second area encompassed by the first area;

forming a pad in the first area;

forming a bump electrode on the pad;

forming a first barrier metal formed under the bump electrode,

forming at least one supporting member in the second area, wherein forming the supporting member and the bump electrode includes forming the supporting member and the bump electrode of the same material, and

forming a second barrier metal formed under the supporting member, the first and second barrier metals being formed of the same material, and the first and second barrier metals having the same thickness.

2. A method of forming a semiconductor chip as claimed in claim 1 , wherein forming the pad includes forming the pad to have a second thickness, forming the bump electrode includes forming the bump electrode to have a third thickness and forming the support member includes forming the support member to have a first thickness, which is substantially equals to the sum of the second and third thicknesses.

3. A method of forming a semiconductor chip as claimed in claim 1 , wherein forming the pad includes forming the pad to have a second thickness, forming the bump electrode includes forming the bump electrode to have a third thickness and forming the support member includes forming the support member to have a first thickness, which is less than the sum of the second and third thicknesses.

4. A method of forming a semiconductor chip as claimed in claim 1 , further comprising, forming a resin connector on the support member.

5. A method of forming a semiconductor package, comprising:

providing a substrate having a main surface, the main surface including a frame-shaped first area, which is along sides of the main surface, and a second area encompassed by the first area;

forming a pad in the first area;

forming a bump electrode on the pad;

forming at least one supporting member on the second area, the support member having a tip;

providing a tape substrate having a land electrode;

connecting the bump electrode to the land electrode; and

connecting the tip of the supporting member to the tape substrate.

6. A method of forming a semiconductor package as claimed in claim 5 , wherein connecting the tip of the supporting member to the tape substrate includes connecting the tip of the supporting member to the tape substrate by a connector resin.

7. A method of forming a semiconductor package as claimed in claim 5 , wherein the tape substrate further includes a dummy land electrode, and connecting the supporting member to the tape substrate includes connecting the supporting member to the tape substrate by connecting the tape substrate to the dummy land electrode.

8. A method of forming a semiconductor package, comprising:

providing a semiconductor chip including a main substrate having a main surface, the main surface including a frame-shaped first area, which is along sides of the main surface, and a second area encompassed by the first area, a pad formed in the first area, a bump electrode formed on the pad, and at least one supporting member formed on the second area;

preparing an assemble apparatus having a recess at its center;

providing a tape substrate having a land electrode;

placing the tape substrate on the assemble apparatus wherein an area on the tape substrate, which is encompassed by the land electrode, is disposed on the recess of the assemble apparatus; and

mounting the semiconductor chip on the tape substrate, and connecting the bump electrode to the land electrode.

9. A method of forming a semiconductor package as claimed in claim 7 , further comprising:

forming a solder ball on the dummy land electrode,

wherein the supporting member is connected to the tape substrate by the solder ball.

10. method of forming a semiconductor package as claimed in claim 7 , wherein the dummy land electrode is arranged under the supporting member.