IP Library Granted Patent US 7,563,343
Granted Patent B2
US 7,563,343 · App. 10/718,653 · Granted Jul 21, 2009

Film lamination apparatus and method and a manufacturing method of a semiconductor apparatus

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Quick Facts
Patent No.
US 7,563,343
App. No.
10/718,653
Granted
Jul 21, 2009
Kind
B2
Abstract

In a film lamination apparatus and method, there is no one-side contact of a pressing roller that presses a film to be laminated. The film is laminated using a rotatable pressing roller having a heater incorporated therein. The pressing roller is pressed onto the film placed on a semiconductor substrate while generating heat by the heater inside the pressing roller. The pressing roller is rolled on the film so as to laminate the film on the semiconductor substrate by partially heating the film by the pressing roller while moving the pressing roller.

Claims (17)

1. A film lamination method for laminating a film on a principal surface of a semiconductor substrate by using a rotatable roller having a diameter of about 20-50 mm, a heat-generating part therein and an elastically deformable resin layer on an outer surface thereof, the film lamination method comprising:

pressing the roller onto the film placed on the principal surface of the semiconductor substrate while generating heat by the heat-generating part;

rolling the roller on the film so as to laminate the film on the semiconductor substrate by heat only from the heat-generating part while absorbing unevenness of the outer surface of the roller and unevenness of a surface of the film by elastic deformation of the elastically deformable resin layer;

wherein said roller presses the film with a pressing load of 10-20N;

wherein the heat-generating part is heated to about 200° C.; and

about 5 seconds after the roller is pressed to an area of the principal surface of the semiconductor substrate said area returns to a temperature about equal to the area's temperature prior to contact with the roller.

2. The film lamination method as claimed in claim 1 , wherein said roller includes a cylindrical metal body and the resin layer formed on an outer surface of the cylindrical metal member, and wherein the heat-generating part is provided in a central portion of the cylindrical metal member so as to extend in an axial direction of the cylindrical metal member.

3. The film lamination method as claimed in claim 2 , wherein said resin layer is formed of a fluoride resin.

4. A manufacturing method of a semiconductor device, comprising the steps of:

grinding another principal surface of the semiconductor substrate so as to thin the semiconductor substrate;

applying an attachment film onto the another principal surface of the semiconductor substrate; and

individualizing the semiconductor substrate into a plurality of semiconductor elements,

wherein the attachment film is laminated on the semiconductor substrate by pressing the attachment film placed on the another principal surface of the semiconductor substrate by a rotatable roller having a diameter of about 20-50 mm, a heat-generating part therein and an elastically deformable resin layer on an outer surface thereof, and rolling the roller on the attachment film while generating heat by only the heat-generating part while absorbing unevenness of the outer surface of the roller and unevenness of a surface of the film by elastic deformation of the elastically deformable resin layer;

wherein said roller presses the film with a pressing load of 10-20N;

wherein the heat-generating part is heated to about 200° C.; and

about 5 seconds after the roller is pressed to an area of the principal surface of the semiconductor substrate said area returns to a temperature about equal to the area's temperature prior to contact with the roller.

5. The film lamination method as claimed in claim 1 , wherein the difference in temperature between said heat generating part and said film during rolling is about 20° C.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2003
From: TESHIROGI, KAZUO; SHIMOBEPPU, YUZO; SHINJO, YOSHIAKI
To: FUJITSU LIMITED
Reel/Frame 014739/0434 →