IP Library › Granted Patent US 7,514,268

Granted Patent B2

US 7,514,268 · App. 10/720,766 · Granted Apr 7, 2009

Method for identifying contaminants

Assignee: The Boeing Company

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Quick Facts

Patent No.: US 7,514,268
App. No.: 10/720,766
Granted: Apr 7, 2009
Kind: B2

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Abstract

A method is provided for identifying contaminants on a surface. In one embodiment, an infrared beam is transmitted onto a sample. A first infrared absorbance of the sample is determined at a first wave number. A second infrared absorbance of the sample is determined at a second wave number. The first absorbance is correlated to a first absorbance peak of a contaminant. The presence of a predetermined level of the contaminant is confirmed by correlating the second infrared absorbance to a second absorbance peak of the contaminant.

Claims (174)

1. A non-destructive method for identifying a contaminant on a substrate, the method comprising:

exposing the substrate to a multi-frequency infrared energy source;

determining at least two infrared energy absorbance peaks, the first absorbance peak at a first wavenumber, and the second absorbance peak at a second wavenumber; and

identifying the contaminant on the surface by correlating the at least two absorbance peaks to the known absorbance peaks of a contaminant at the first and second wavenumbers.

2. The method of claim 1 , wherein determining the at least two absorbance peaks includes utilizing an infrared spectrometer.

3. The method of claim 2 , wherein the infrared spectrometer includes an infrared filter spectrometer.

4. The method of claim 2 , wherein the infrared spectrometer includes an ellipsoidal mirror collector.

5. The method of claim 2 , wherein the infrared spectrometer includes an attenuated total reflectance collector.

6. The method of claim 2 , wherein the infrared spectrometer includes at least two filters.

7. The method of claim 6 , wherein the at least two filters include narrow bandpass infrared filters.

8. The method of claim 1 , wherein the at least two wavenumbers are around 2924 cm−1 and around 1739 cm−1.

9. The method of claim 1 , wherein the at least two wavenumbers are around 2933 cm−1 and around 1739 cm−1.

10. The method of claim 1 , where in the contaminant includes grease.

11. The method of claim 1 , wherein the at least two wavenumbers are around 1071 cm−1 and around 3279 cm−1.

12. The method of claim 1 , wherein the contaminant includes BOELUBE®.

13. The method of claim 1 , wherein the at least two wavenumbers are around 1745 cm−1 and around 1170 cm−1.

14. The method of claim 1 , wherein the contaminant includes MICROCUT®.

15. The method of claim 1 , wherein the at least two wavenumbers are around 2924 cm−1 and around 1060 cm−1.

16. The method of claim 1 , wherein the contaminant includes DiNITROL® AV8.

17. The method of claim 1 , wherein the at least two wavenumbers are around 2924 cm−1 and around 752 cm−1.

18. The method of claim 1 , wherein the contaminant includes DINITROL® AV30.

19. The method of claim 1 , wherein the at least two wavenumbers are around 2924 cm−1 and around 1460 cm−1.

20. The method of claim 1 , wherein the contaminant includes BRAYCOTE® 248.

21. The method of claim 1 , wherein the at least two wavenumbers are around 2924 cm−1 and around 752 cm−1.

22. The method of claim 1 , wherein the at least two wavenumbers are around 925 cm−1 and around 2190 cm−1.

23. The method of claim 1 , wherein the contaminant includes ALODINE® 1200.

24. The method of claim 1 , wherein the at least two wavenumbers are around 1060 cm−1 and around 1600 cm−1.

25. The method of claim 1 , wherein the contaminant includes ALKASOL 27.

26. The method of claim 1 , wherein the at least two wavenumbers are around 1241 cm−1 and around 2551 cm−1.

27. The method of claim 1 , wherein the contaminant includes JET CLEAN E.

28. The method of claim 1 , wherein the at least two wavenumbers are around 1120 cm−1 and around 901 cm−1.

29. The method of claim 1 , wherein the contaminant includes PACE B82.

30. The method of claim 1 , wherein the at least two wavenumbers are around 1180 cm−1 and around 1620 cm−1.

31. The method of claim 1 , wherein the contaminant includes SNOOP.

32. The method of claim 1 , wherein the at least two wavenumbers are around 1170 cm−1 and around 3300 cm−1.

33. The method of claim 1 , wherein the contaminant includes SPRAYLAT.

34. The method of claim 1 , wherein the at least two wavenumbers are around 1730 cm−1 and around 1160 cm−1.

35. The method of claim 1 , wherein the contaminant includes AZTEC.

36. The method of claim 1 , wherein the at least two wavenumbers are around 1259 cm−1 and around 800 cm−1.

37. The method of claim 1 , wherein the contaminant includes silicone.

38. The method of claim 1 , wherein the at least two wavenumbers are around 1212 cm−1 and around 1155 cm−1.

39. The method of claim 1 , wherein the contaminant includes TEFLON®.

40. The method of claim 1 , wherein the at least two wavenumbers are around 1745 cm−1 and around 1180 cm−1.

41. The method of claim 1 , wherein the contaminant includes lanolin.

42. The method of claim 1 , wherein the at least two wavenumbers are around 2924 cm−1 and around 1751 cm−1.

43. The method of claim 1 , wherein the contaminant includes fingerprints.

44. The method of claim 1 , wherein the at least two wavenumbers are around 3425 cm−1 and around 3195 cm−1.

45. The method of claim 1 , wherein the contaminant includes urea.

46. The method of claim 1 , wherein the at least two wavenumbers are around 1650 cm−1 and around 3300 cm−1.

47. The method of claim 1 , wherein the contaminant includes collagen.

48. The method of claim 1 , wherein the at least two wavenumbers are around 1681 cm−1 and around 1230 cm−1.

49. The method of claim 1 , wherein the contaminant includes polyurethane paint.

50. The method of claim 1 , wherein the at least two wavenumbers are around 1502 cm−1 and around 2924 cm−1.

51. The method of claim 1 , wherein the contaminant includes epoxy primer.

52. The method of claim 1 , wherein the at least two wavenumbers are around 1709 cm−1 and around 960 cm−1.

53. The method of claim 1 , wherein the contaminant includes methyl ethyl ketone.

54. A non-destructive method for identifying a contaminant on a sample, the method comprising:

transmitting an infrared beam onto a sample;

detecting a reflected infrared beam reflected by the sample;

determining a first infrared absorbance peak of the sample from the reflected infrared beam at a first wavenumber;

determining a second infrared absorbance peak of the sample from the reflected infrared beam at a second wavenumber; and

identifying the contaminant by correlating the first infrared absorbance peak and the second infrared absorbance peak to a reference sample.

55. The method of claim 54 , wherein the reference sample shows the first infrared absorbance peak at the first wavenumber and the second absorbance peak at the second wavenumber.

56. The method of claim 54 , wherein determining at least one of the first infrared absorbance and the second infrared absorbance includes utilizing an infrared spectrometer.

57. The method of claim 56 , wherein the infrared spectrometer includes an infrared filter spectrometer.

58. The method of claim 56 , wherein the infrared spectrometer includes an ellipsoidal mirror collector.

59. The method of claim 56 , wherein the infrared spectrometer includes an attenuated total reflectance collector.

60. The method of claim 56 , wherein the infrared spectrometer includes at least two filters.

61. The method of claim 60 , wherein the at least two filters include narrow bandpass infrared filters.

62. The method of claim 54 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1739 cm−1.

63. The method of claim 54 , wherein the first wave number is around 2933 cm−1 and the second wavenumber is around 1739 cm−1.

64. The method of claim 54 , wherein the contaminant includes grease.

65. The method of claim 54 , wherein the first wave number is around 1071 cm−1 and the second wavenumber is around 3279 cm−1.

66. The method of claim 54 , wherein the contaminant includes BOELUBE®.

67. The method of claim 54 , wherein the first wave number is around 1745 cm−1 and the second wavenumber is around 1170 cm−1.

68. The method of claim 54 , wherein the contaminant includes MICROCUT®.

69. The method of claim 54 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1060 cm−1.

70. The method of claim 54 , wherein the contaminant includes DINITROL® AV8.

71. The method of claim 54 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 752 cm−1.

72. The method of claim 54 , wherein the contaminant includes DINITROL® AV30.

73. The method of claim 54 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1460 cm−1.

74. The method of claim 54 , wherein the contaminant includes BRAYCOTE® 248.

75. The method of claim 54 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 752 cm−1.

76. The method of claim 54 , wherein the first wave number is around 925 cm−1 and the second wavenumber is around 2190 cm−1.

77. The method of claim 54 , wherein the contaminant includes ALODINIE® 1200.

78. The method of claim 54 , wherein the first wave number is around 1060 cm−1 and the second wavenumber is around 1600 cm−1.

79. The method of claim 54 , wherein the contaminant includes ALKASOL 27.

80. The method of claim 54 , wherein the first wave number is around 1241 cm−1 and the second wavenumber is around 2551 cm−1.

81. The method of claim 54 , wherein the contaminant includes JET CLEAN E.

82. The method of claim 54 , wherein the first wave number is around 1120 cm−1 and the second wavenumber is around 901 cm−1.

83. The method of claim 54 , wherein the contaminant includes PACE B82.

84. The method of claim 54 , wherein the first wave number is around 1180 cm−1 and the second wavenumber is around 1620 cm−1.

85. The method of claim 54 , wherein the contaminant includes SNOOP.

86. The method of claim 54 , wherein the first wave number is around 1170 cm−1 and the second wavenumber is around 3300 cm−1.

87. The method of claim 54 , wherein the contaminant includes SPRAYLAT.

88. The method of claim 54 , wherein the first wave number is around 1730 cm−1 and the second wavenumber is around 1160 cm−1.

89. The method of claim 54 , wherein the contaminant includes AZTEC.

90. The method of claim 54 , wherein the first wave number is around 1259 cm−1 and the second wavenumber is around 800 cm−1.

91. The method of claim 54 , wherein the contaminant includes silicone.

92. The method of claim 54 , wherein the first wave number is around 1212 cm−1 and the second wavenumber is around 1155 cm−1.

93. The method of claim 54 , wherein the contaminant includes TEFLON®.

94. The method of claim 54 , wherein the first wave number is around 1745 cm−1 and the second wavenumber is around 1180 cm−1.

95. The method of claim 54 , wherein the contaminant includes lanolin.

96. The method of claim 54 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1751 cm−1.

97. The method of claim 54 , wherein the contaminant includes fingerprints.

98. The method of claim 54 , wherein the first wave number is around 3425 cm−1 and the second wavenumber is around 3195 cm−1.

99. The method of claim 54 , wherein the contaminant includes urea.

100. The method of claim 54 , wherein the first wave number is around 1650 cm−1 and the second wavenumber is around 3300 cm−1.

101. The method of claim 54 , wherein the contaminant includes collagen.

102. The method of claim 54 , wherein the first wave number is around 1681 cm−1 and the second wavenumber is around 1230 cm−1.

103. The method of claim 54 , wherein the contaminant includes polyurethane paint.

104. The method of claim 54 , wherein the first wave number is around 1502 cm−1 and the second wavenumber is around 2924 cm−1.

105. The method of claim 54 , wherein the contaminant includes epoxy primer.

106. The method of claim 54 , wherein the first wave number is around 1709 cm−1 and the second wavenumber is around 960 cm−1.

107. The method of claim 54 , wherein the contaminant includes methyl ethyl ketone.

108. A non-destructive method for detecting a contaminant on a sample, the method comprising:

transmitting an infrared beam onto a sample;

detecting a reflected infrared beam reflected by the sample;

determining a first infrared absorbance peak of the sample from the reflected infrared beam at a first wavenumber;

correlating the first infrared absorbance peak to a first absorbance peak of a contaminant at the first wavenumber;

determining a second infrared absorbance peak of the sample from the reflected infrared beam at a second wavenumber; and

confirming a presence of a predetermined amount of the contaminant on the surface by correlating the second infrared absorbance peak to a second absorbance peak of the contaminant at the second wavenumber.

109. The method of claim 108 , wherein determining at least one of the first infrared absorbance and the second infrared absorbance includes utilizing an infrared spectrometer.

110. The method of claim 109 , wherein the infrared spectrometer includes an infrared filter spectrometer.

111. The method of claim 109 , wherein the infrared spectrometer includes an ellipsoidal mirror collector.

112. The method of claim 109 , wherein the infrared spectrometer includes an attenuated total reflectance collector.

113. The method of claim 109 , wherein the infrared spectrometer includes at least two filters.

114. The method of claim 113 , wherein the at least two filters include narrow bandpass infrared filters.

115. The method of claim 108 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1739 cm−1.

116. The method of claim 108 , wherein the first wave number is around 2933 cm−1 and the second wavenumber is around 1739 cm−1.

117. The method of claim 108 , wherein the contaminant includes grease.

118. The method of claim 108 , wherein the first wave number is around 1071 cm−1 and the second wavenumber is around 3279 cm−1.

119. The method of claim 108 , wherein the contaminant includes BOELUBE®.

120. The method of claim 108 , wherein the first wave number is around 1745 cm−1 and the second wavenumber is around 1170 cm−1.

121. The method of claim 108 , wherein the contaminant includes MICROCUT®.

122. The method of claim 108 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1060 cm−1.

123. The method of claim 108 , wherein the contaminant includes DINITROL® AV8.

124. The method of claim 108 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 752 cm−1.

125. The method of claim 108 , wherein the contaminant includes DINITROL® AV30.

126. The method of claim 108 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1460 cm−1.

127. The method of claim 108 , wherein the contaminant includes BRAYCOTE® 248.

128. The method of claim 108 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 752 cm−1.

129. The method of claim 108 , wherein the first wave number is around 925 cm−1 and the second wavenumber is around 2190 cm−1.

130. The method of claim 108 , wherein the contaminant includes ALODINE® 1200.

131. The method of claim 108 , wherein the first wave number is around 1060 cm−1 and the second wavenumber is around 1600 cm−1.

132. The method of claim 108 , wherein the contaminant includes ALKASOL 27.

133. The method of claim 108 , wherein the first wave number is around 1241 cm−1 and the second wavenumber is around 2551 cm−1.

134. The method of claim 108 , wherein the contaminant includes JET CLEAN E.

135. The method of claim 108 , wherein the first wave number is around 1120 cm−1 and the second wavenumber is around 901 cm−1.

136. The method of claim 108 , wherein the contaminant includes PACE B82.

137. The method of claim 108 , wherein the first wave number is around 1180 cm−1 and the second wavenumber is around 1620 cm−1.

138. The method of claim 108 , wherein the contaminant includes SNOOP.

139. The method of claim 108 , wherein the first wave number is around 1170 cm−1 and the second wavenumber is around 3300 cm−1.

140. The method of claim 108 , wherein the contaminant includes SPRAYLAT.

141. The method of claim 108 , wherein the first wave number is around 1730 cm−1 and the second wavenumber is around 1160 cm−1.

142. The method of claim 108 , wherein the contaminant includes AZTEC.

143. The method of claim 108 , wherein the first wave number is around 1259 cm−1 and the second wavenumber is around 800 cm−1.

144. The method of claim 108 , wherein the contaminant includes silicone.

145. The method of claim 108 , wherein the first wave number is around 1212 cm−1 and the second wavenumber is around 1155 cm−1.

146. The method of claim 108 , wherein the contaminant includes TEFLON®.

147. The method of claim 108 , wherein the first wave number is around 1745 cm−1 and the second wavenumber is around 1180 cm−1.

148. The method of claim 108 , wherein the contaminant includes lanolin.

149. The method of claim 108 , wherein the first wave number is around 2924 cm−1 and the second wavenumber is around 1751 cm−1.

150. The method of claim 108 , wherein the contaminant includes fingerprints.

151. The method of claim 108 , wherein the first wave number is around 3425 cm−1 and the second wavenumber is around 3195 cm−1.

152. The method of claim 108 , wherein the contaminant includes urea.

153. The method of claim 108 , wherein the first wave number is around 1650 cm−1 and the second wavenumber is around 3300 cm−1.

154. The method of claim 108 , wherein the contaminant includes collagen.

155. The method of claim 108 , wherein the first wave number is around 1681 cm−1 and the second wavenumber is around 1230 cm−1.

156. The method of claim 108 , wherein the contaminant includes polyurethane paint.

157. The method of claim 108 , wherein the first wave number is around 1502 cm−1 and the second wavenumber is around 2924 cm−1.

158. The method of claim 108 , wherein the contaminant includes epoxy primer.

159. The method of claim 108 , wherein the first wave number is around 1709 cm−1 and the second wavenumber is around 960 cm−1.

160. The method of claim 108 , wherein the contaminant includes methyl ethyl ketone.

Assignments (1)

ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2003

From: SHELLEY, PAUL H.; LARIVIERE, DIANE R.

To: BOEING COMPANY, THE

Reel/Frame 014747/0314 →

Continuity (1)

Related Publication 20050124074A1 · Jun 9, 2005