IP Library Granted Patent US 7,192,812
Granted Patent B2
US 7,192,812 · App. 10/734,246 · Granted Mar 20, 2007

Method for manufacturing electro-optical substrate

Assignee: Seiko Epson Corporation
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Quick Facts
Patent No.
US 7,192,812
App. No.
10/734,246
Granted
Mar 20, 2007
Kind
B2
Abstract

To provide a method for manufacturing an electro-optical substrate having high reliability with high yield. The method for manufacturing an electro-optical substrate including a composite base plate obtained by joining a support plate to a semiconductor plate having single-crystal silicon precursor layer (semiconductor precursor layer) can include a step of forming a light-shielding layer, having a predetermined pattern, on the support plate, a step of forming an insulating layer on the light-shielding layer having the predetermined pattern, a step of providing semiconductor layers on the insulating layer, a step of oxidizing parts of the semiconductor layers to form oxide layers, and a step of removing the oxide layers. The oxide layers can have a thickness smaller than that of the insulating layer.

Claims (16)

1. A method for manufacturing an electro-optical substrate including a composite base plate obtained by joining a support plate to a semiconductor plate having semiconductor layers, comprising:

forming a light-shielding layer, having a predetermined pattern, on a support plate;

forming an insulating layer on the light-shielding layer having the predetermined pattern;

providing semiconductor layers on the insulating layer;

partially oxidizing the semiconductor layer to form an oxide layer; and

completely removing the oxide layer, the oxid layer having a thickness smaller than that of the insulating layer.

2. The method for manufacturing an electro-optical substrate according to claim 1 , further comprising:

patterning the semiconductor layer; and

oxidizing parts of the semiconductor layers having a predetermined pattern to form the oxide layer,

the patterning step and oxidizing step being performed after the semiconductor layer-providing step.

3. The method for manufacturing an electro-optical substrate according to claim 1 , the oxide layers having a thickness smaller than that of parts of the insulating layer disposed in areas above which the semiconductor layer is not placed, and which are disposed on the light-shielding layer.

4. The method for manufacturing an electro-optical substrate according to claim 1 , further comprising:

forming a silicon nitride layer or silicon oxide nitride layer between the light-shielding layer and the insulating layer.

5. The method for manufacturing an electro-optical substrate according to claim 1 , the semiconductor layer-providing step including a sub-step of joining a single-crystal semiconductor plate including the semiconductor layers to a support plate including the insulating layer.

6. The method for manufacturing an electro-optical substrate according to claim 1 , the light-shielding layer containing a high-melting metal or a silicide containing a high-melting metal.

7. A method for manufacturing an electro-optical apparatus including a semiconductor element, comprising manufacturing an electro-optical substrate including the semiconductor element by the manufacturing method according to claim 1 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2018
From: SEIKO EPSON CORPORATION
To: 138 EAST LCD ADVANCEMENTS LIMITED
Reel/Frame 046551/0423 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2004
From: YASUKAWA, MASAHIRO
To: SEIKO EPSON CORPORATION
Reel/Frame 014496/0214 →
Priority Claims (1)
JP 2002-369951 · Dec 20, 2002 · national
Continuity (1)
Related Publication 20040140515A1 · Jul 22, 2004