IP Library Granted Patent US 7,064,438
Granted Patent B2
US 7,064,438 · App. 10/734,275 · Granted Jun 20, 2006

Low-loss coplanar waveguides

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,064,438
App. No.
10/734,275
Granted
Jun 20, 2006
Kind
B2
Abstract

Coplanar waveguides having a deep trench between a signal line and a ground plane and methods of their fabrication are disclosed. An oxide layer is provided over a silicon substrate and a photoresist is applied and patterned to define areas where the signal line and the ground plane will be formed. A barrier layer is provided over the oxide layer in the defined areas. A metal layer is then deposited over the barrier layer. An etch mask is deposited over the metal layer for the subsequent trench formation. The photoresist and the underlying portion of the oxide and barrier layers are removed and a deep trench is formed in the substrate between the signal line and the ground plane using etching through the mask.

Claims (28)

1. A processor system comprising:

a processor; and

an integrated circuit coupled to said processor, at least one of said integrated circuit and processor comprising:

a substrate;

a signal conductor line formed over said substrate, wherein said signal conductor line comprises a copper layer, said copper layer being over a first insulating layer on said substrate, and wherein said first insulating layer is at least partially between said copper layer and a top surface of said substrate, and an oxide layer over said copper layer;

at least two longitudinal ground conductor planes formed over said substrate and on both sides of said signal conductor line and spaced apart from said signal conductor line to form respective gaps; and

at least two trenches formed in said substrate at said respective gaps, each of said at least two trenches having a radius of about 50,000 Angstroms to about 100,000 Angstroms.

2. The system of claim 1 , wherein said signal conductor line has a width of about 250,000 Angstroms to about 350,000 Angstroms.

3. The system of claim 1 , wherein said ground Angstroms to about 200,000 Angstroms.

4. A processor system comprising:

a processor; and

an integrated circuit coupled to said processor, at least one of said integrated circuit and processor comprising a substrate, a signal conductor line formed over said substrate, wherein said signal conductor line comprises a copper layer, said copper layer being over a first insulating layer on said substrate, and wherein said first insulating layer is at least partially between said copper layer and a top surface of said substrate, at least two longitudinal ground conductor planes formed over said substrate and on both sides of said signal conductor line and spaced apart from said signal conductor line to form respective gaps, wherein said ground conductor planes comprise a conductive layer, said conductive layer being over a second insulating layer on said substrate, and at least two trenches formed in said substrate at said respective gaps.

5. The system of claim 4 , wherein said conductor layer comprises copper.

6. A coplanar waveguide comprising:

a silicon substrate;

a first oxide layer over said substrate;

a titanium nitride barrier layer over said first oxide layer;

a signal conductor line formed over said titanium nitride layer, wherein said first oxide layer and said titanium nitride layers are at least partially between said signal conductor line and a top surface of said substrate;

at least two longitudinal ground conductor planes formed over said silicon substrate on both sides of said signal conductor line and spaced apart from said signal conductor line to form respective gaps; and

at least two trenches formed in said silicon substrate at said respective gaps, each of said trenches having a depth of about 100,000 Angstroms to about 200,000 Angstroms and a width of about 100,000 Angstroms to about 150,000 Angstroms.

7. The coplanar waveguide of claim 6 , further comprising a second oxide layer on said silicon substrate, said ground conductor planes being over said second oxide layer.

8. A coplanar waveguide comprising:

a silicon substrate;

a first oxide layer over said substrate;

a signal conductor line formed over said silicon substrate, wherein said first oxide layer is at least partially between said signal conductor line and a top surface of said substrate, said signal conductor line having silicide layers on sidewalls of said signal conductor line;

at least two longitudinal ground conductor planes formed over said silicon substrate on both sides of said signal conductor line and spaced apart from said signal conductor line to form respective gaps; and

at least two trenches formed in said silicon substrate at said respective gaps, each of said trenches having a radius of about 50,000 Angstroms to about 100,000 Angstroms.

9. The coplanar waveguide of claim 8 , further comprising a second oxide layer on said silicon substrate, said ground conductor planes being over said second oxide layer.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 26, 2010
From: KEYSTONE TECHNOLOGY SOLUTIONS, LLC
To: MICRON TECHNOLOGY, INC.
Reel/Frame 023839/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2010
From: MICRON TECHNOLOGY, INC.
To: ROUND ROCK RESEARCH, LLC
Reel/Frame 023786/0416 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2007
From: MICRON TECHNOLOGY, INC.
To: KEYSTONE TECHNOLOGY SOLUTIONS, LLC
Reel/Frame 019825/0542 →
Continuity (3)
Continuation 1020620500 · Jul 29, 2002
Division 0983564300 · Apr 17, 2001
Related Publication 20040124956A1 · Jul 1, 2004