IP Library Granted Patent US 7,234,342
Granted Patent B2
US 7,234,342 · App. 10/740,940 · Granted Jun 26, 2007

Fully digital controller for cantilever-based instruments

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Quick Facts
Patent No.
US 7,234,342
App. No.
10/740,940
Granted
Jun 26, 2007
Kind
B2
Abstract

A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.

Claims (18)

1. A controller for an atomic force microscope having a position sensitive detector for detecting cantilever deflection and which outputs a signal indicative thereof and has a corrector part which corrects a vertical position of a cantilever base comprising:

a feedback circuit, including a digital signal processor, connected between the output of the position sensitive detector of said atomic force microscope and the corrector part that corrects the vertical position of the cantilever.

a field programmable gate array programmed to process the signal from the position sensitive detector and at least a signal received from the digital signal processor and which carries out a fully digital phase lock-in based on at least one of said signals; and

wherein the digital signal processor is programmed to process data from the position sensitive detector separately from the field programmable gate array.

2. A controller as in claim 1 , wherein said field programmable gate array is configured to include a direct digital synthesizer.

3. A controller as in claim 1 , wherein said field programmable gate array is further programmed to include a digital low pass filter, filtering the output of said direct digital synthesizer.

4. A controller as in claim 1 , further comprising, within said field programmable gate array, a digital dual phase lock-in mixer.

5. A controller which processes an output signal from an atomic force microscope, comprising:

a field programmable gate array, arranged to include at least a digital dual phase lock-in device, a direct digital synthesizer and a digital filter, which digitally processes the output signal, further comprising a digital signal processor, coupled to an output of the field programmable gate array, and carrying our further processes, said processes being processes which are other than dual phase lock-in, filtering, and mixing, and said processes being for the processing of the output signal.

6. A controller which processes an output signal from an atomic force microscope, comprising:

a field programmable gate array, arranged to include at least a digital dual phase locking device, a direct digital synthesizer and a digital filter, which digitally processes the output signal, wherein said phase lock-in device comprises a peak detector.

7. A controller which processes an output signal from an atomic force microscope, comprising:

a field programmable gate array, arranged to include at least a digital dual phase locking device, a direct digital synthesizer and a digital filter, which digitally processes the output signal, further comprising an A/D converter, receiving the output signal from the atomic force microscope, and converting said output signal into a digital signal indicative thereof, and feeding said digital signal to said field programmable gate array.

8. A method, comprising:

receiving a signal output from an atomic force microscope;

converting said output to a digital signal indicative of said output;

processing said output in a field programmable gate array (FPGA), to carry out at least digital dual phase look in, direct digital synthesis, digital mixing, and filtering; and

producing an output from said FPGA which is further processed by a digital signal processor to carry out additional functions on a signal that has been processed by said FPGA.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF RECEIVING PARTY PREVIOUSLY RECORDED AT REEL: 053231 FRAME: 0814. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 9, 2021
From: OXFORD INSTRUMENTS AFM INC
To: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.
Reel/Frame 056528/0956 →
CHANGE OF NAME Recorded Jul 16, 2020
From: OXFORD INSTRUMENTS AFM INC
To: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC
Reel/Frame 053231/0814 →
CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY NAME PREVIOUSLY RECORDED AT REEL: 29527 FRAME: 221. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Aug 15, 2019
From: ASYLUM RESEARCH CORPORATION
To: OXFORD INSTRUMENTS AFM INC.
Reel/Frame 050114/0282 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 26, 2012
From: ASYLUM RESEARCH CORPORATION
To: OXFORD INSTRUMENTS PLC; OXFORD INSTRUMENTS AFM INC
Reel/Frame 029527/0220 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 22, 2004
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN; DAY, TODD; VIANI, MARIO B.; CALLAHAN, CLINT
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 015485/0325 →