IP Library Assignment 053231/0814
Patent Assignment
Reel/Frame 053231/0814

Change of Name

Recorded: 2020-07-16 Pages: 3
Assignor
OXFORD INSTRUMENTS AFM INC
Executed: 2013-01-31
Assignee
OXFORD INSTRUMENTS ASYLUM RESEARCH, INC
6310 HOLLISTER AVE, GOLETA, CALIFORNIA, 93117
Covered Properties (44)
Noncontact Sensitivity and Compliance Calibration Method for Cantilever-Based Instruments
Patent: 7,066,005 →
Application: 10/087,196 →
Publication: US 2002/0162388
Diffractive Optical Position Detector
Patent: 6,884,981 →
Application: 10/226,625 →
Publication: US 2003/0047675
Tactile Force and/or Position Feedback for Cantilever-Based Force Measurement Instruments
Patent: 7,266,997 →
Application: 10/288,877 →
Publication: US 2004/0000189
Linear Variable Differential Transformer with Digital Electronics
Patent: 8,269,485 →
Application: 10/447,297 →
Publication: US 2004/0056653
Linear Variable Differential Transformers for High Precision Position Measurements
Patent: 7,038,443 →
Application: 10/683,592 →
Publication: US 2004/0075428
Fully Digital Controller for Cantilever-Based Instruments
Patent: 7,234,342 →
Application: 10/740,940 →
Publication: US 2004/0206166
Digital Control of Quality Factor in Resonant Systems Including Cantilever Based Instruments
Patent: 7,165,445 →
Application: 10/926,787 →
Publication: US 2005/0188752
Linear Variable Differential Transformers for High Precision Position Measurements
Patent: 7,271,582 →
Application: 11/401,781 →
Publication: US 2006/0186876
Linear Variable Differential Transformers for High Precision Position Measurements
Patent: 7,262,592 →
Application: 11/401,782 →
Publication: US 2006/0186877
Position Sensing Assembly with Sychronizing Capability
Patent: 7,233,140 →
Application: 11/402,482 →
Publication: US 2006/0202683
Linear Force Detecting Element Formed Without Ferromagnetic Materials Which Produces a Resolution in a Range of Microns or Less
Patent: 7,372,254 →
Application: 11/404,165 →
Publication: US 2006/0192551
Noncontact Sensitivity and Compliance Calibration Method for Cantilever-Based Instruments
Patent: 7,434,445 →
Application: 11/426,567 →
Publication: US 2007/0062252
Multiple Frequency Atomic Force Microscopy
Patent: 7,603,891 →
Application: 11/544,130 →
Publication: US 2007/0245815
Variable Density Scanning
Patent: 7,941,286 →
Application: 11/563,822 →
Publication: US 2007/0176101
Digital Q Control for Enhanced Measurement Capability in Cantilever-Based Instruments
Patent: 7,387,017 →
Application: 11/621,914 →
Publication: US 2007/0157711
Active Damping of High Speed Scanning Probe Microscope Components
Patent: 8,302,456 →
Application: 11/678,018 →
Publication: US 2007/0214864
Precision Position Sensor Using a Nonmagnetic Coil Form
Patent: 7,459,904 →
Application: 11/744,754 →
Publication: US 2007/0200559
Fully Digitally Controller for Cantilever-Based Instruments
Patent: 7,937,991 →
Application: 11/768,854 →
Publication: US 2008/0011067
Apparatus and Method for Scanning Capacitance Microscopy and Spectroscopy
Patent: 7,856,665 →
Application: 11/985,597 →
Publication: US 2009/0084952
Digital Q Control for Enhanced Measurement Capability in Cantilever-Based Instruments
Patent: 8,042,383 →
Application: 12/140,836 →
Publication: US 2008/0245141
Material Property Measurements Using Multiple Frequency Atomic Force Microscopy
Patent: 8,024,963 →
Application: 12/214,031 →
Publication: US 2009/0013770
Method for Microfabricating a Probe with Integrated Handle, Cantilever, Tip and Circuit
Patent: 7,861,315 →
Application: 12/316,287 →
Publication: US 2009/0178166
Multiple Frequency Atomic Force Microscopy
Patent: 8,448,501 →
Application: 12/582,045 →
Publication: US 2010/0043107
Modular Atomic Force Microscope
Patent: 8,370,960 →
Application: 12/587,943 →
Publication: US 2010/0275334
Integrated Micro Actuator and Lvdt for High Precision Position Measurements
Patent: 8,502,525 →
Application: 12/587,947 →
Publication: US 2010/0213930
Nanoindenter
Patent: 8,196,458 →
Application: 12/729,339 →
Publication: US 2010/0180356
Fully Digitally Controller for Cantilever-Based Instruments
Patent: 8,205,488 →
Application: 12/826,541 →
Publication: US 2010/0333240
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
Patent: 8,677,809 →
Application: 12/925,442 →
Publication: US 2011/0154546
Variable Density Scanning
Patent: 8,489,356 →
Application: 13/104,189 →
Publication: US 2011/0219479
Material Property Measurements Using Multiple Frequency Atomic Force Microscopy
Patent: 8,555,711 →
Application: 13/241,689 →
Publication: US 2012/0079631
Digital Q Control for Enhanced Measurement Capability in Cantilever-Based Instruments
Patent: 8,459,102 →
Application: 13/280,549 →
Publication: US 2012/0216322
Nanoindenter
Patent: 9,063,042 →
Application: 13/494,526 →
Publication: US 2012/0272411
Fully Digitally Controller for Cantilever-Based Instruments
Patent: 8,925,376 →
Application: 13/533,078 →
Publication: US 2012/0266336
Transducer Assembly with Digitally Created Signals
Patent: 9,024,623 →
Application: 13/621,915 →
Publication: US 2013/0024162
Quantitative Measurements Using Multiple Frequency Atomic Force Microscopy
Patent: 9,297,827 →
Application: 13/694,095 →
Publication: US 2013/0117895
Multiple Frequency Atomic Force Microscopy
Patent: 9,069,007 →
Application: 13/903,152 →
Publication: US 2013/0340126
Fully Digitally Controller for Cantilever-Based Instruments
Patent: 9,689,890 →
Application: 14/590,150 →
Publication: US 2015/0113687
Transducer Assembly with Digitally Created Signals
Patent: 9,528,859 →
Application: 14/702,028 →
Publication: US 2015/0308862
Material Property Measurements Using Multiple Frequency Atomic Force Microscopy
Application: 15/064,405 →
Publication: US 2016/0258980
Quantitative Measurements Using Multiple Frequency Atomic Force Microscopy
Patent: 9,696,342 →
Application: 15/083,727 →
Publication: US 2016/0282384
Integrated Micro Actuator and LVDT for High Precision Position Measurements
Application: 15/377,458 →
Publication: US 2017/0089733
Modular Atomic Force Microscope and View System for Same, Having Parallel Light Emitting and Image Receiving Axes
Application: 15/465,947 →
Publication: US 2017/0254834
Fully Digitally Controller for Cantilever-Based Instruments
Application: 15/632,664 →
Publication: US 2017/0292971
Quantitative Measurements Using Multiple Frequency Atomic Force Microscopy
Application: 15/640,984 →
Publication: US 2017/0299628
Related Assignments (20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 25, 2003
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN
To: ASYLUM RESEARCH CORP.
Reel/Frame 014551/0199 →
Assignment of Assignor's Interest Nov 6, 2003
From: BOCEK, DAN; PROKSCH, ROGER
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 014674/0347 →
Assignment of Assignor's Interest Jun 22, 2004
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN; DAY, TODD
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 015485/0325 →
Assignment of Assignor's Interest Jun 23, 2004
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN; DAY, TODD
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 015508/0483 →
Assignment of Assignor's Interest Jun 24, 2004
From: PROKSCH, ROGER
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 015508/0470 →
Assignment of Assignor's Interest May 10, 2005
From: BOCEK, DAN; CLEVELAND, JASON
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 016210/0822 →
Assignment of Assignor's Interest Sep 13, 2006
From: PROKSCH, ROGER
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018242/0390 →
Assignment of Assignor's Interest Nov 28, 2006
From: PROKSCH, ROGER B.; CALLAHAN, ROGER C.
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018556/0753 →
Assignment of Assignor's Interest Dec 18, 2006
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018677/0033 →
Assignment of Assignor's Interest Dec 18, 2006
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018677/0074 →
Assignment of Assignor's Interest Dec 18, 2006
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018677/0092 →
Assignment of Assignor's Interest Dec 18, 2006
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018677/0097 →
Assignment of Assignor's Interest Dec 27, 2006
From: PROKSCH, ROGER B.
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 018682/0105 →
Assignment of Assignor's Interest Mar 26, 2007
From: BOCEK, DAN; CLEVELAND, JASON
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 019073/0278 →
Assignment of Assignor's Interest Jun 7, 2007
From: PROKSCH, ROGER; CLEVELAND, JASON; BOCEK, DAN
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 019398/0039 →
Assignment of Assignor's Interest Jun 8, 2007
From: PROKSCH, ROGER
To: ASYLUM RESEARCH CORPORATION
Reel/Frame 019401/0710 →
Assignment of Assignor's Interest Dec 26, 2012
From: ASYLUM RESEARCH CORPORATION
To: OXFORD INSTRUMENTS PLC; OXFORD INSTRUMENTS AFM INC
Reel/Frame 029527/0220 →
Assignment of Assignor's Interest Dec 31, 2012
From: ASYLUM RESEARCH CORPORATION
To: OXFORD INSTRUMENTS PLC; OXFORD INSTRUMENTS AFM INC.
Reel/Frame 029546/0552 →
Corrective Assignment to Correct the Receiving Party Name Previously Recorded at Reel: 29527 Frame: 221. Assignor(S) Hereby Confirms the Assignment. Aug 15, 2019
From: ASYLUM RESEARCH CORPORATION
To: OXFORD INSTRUMENTS AFM INC.
Reel/Frame 050114/0282 →
Corrective Assignment to Correct the Name of Receiving Party Previously Recorded at Reel: 053231 Frame: 0814. Assignor(S) Hereby Confirms the Assignment. Jun 9, 2021
From: OXFORD INSTRUMENTS AFM INC
To: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.
Reel/Frame 056528/0956 →