Multiple frequency atomic force microscopy
View Patent ↗An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described.
1. An atomic force microscope operating to determine voltage dependent properties of a sample, comprising:
a cantilever having a probe tip;
an actuator for the cantilever, that is driven to move said cantilever;
a first frequency source driving said actuator for the cantilever at a first frequency;
a second frequency source varying an electrical potential of the cantilever relative to the sample at a second frequency, different than the first frequency; and
a detector detecting cantilever response information to the sample at both values related to said first frequency and said second frequency, wherein said detector measures an amplitude and phase of first and second eigenmodes of the cantilever as a measured characteristics of the sample.
2. The microscope as in claim 1 , further comprising a connection for grounding said sample.
3. The microscope as in claim 1 , wherein said actuator drives said cantilever to avoid touching the sample.
4. The microscope as in claim 1 , wherein said cantilever response information includes values at said first and/or second frequencies or harmonics thereof.
5. The microscope as in claim 1 , wherein said actuator drives the cantilever at or near a flexural resonance thereof.
6. The microscope as in claim 1 , wherein said detector measures an amplitude of the cantilever at the first frequency as an error signal, and also measures information at said second frequency or a harmonic thereof to represent voltage dependent properties of the sample.
7. A method of determining both topographic and material dependent properties of a sample, comprising:
exciting a cantilever probe at a first frequency using a first frequency source driving a first actuator to drive the cantilever at said first frequency;
using a second frequency source at a second frequency different than said first frequency, to vary an electrical potential of said cantilever probe and thereby cause said sample to excite motion in said cantilever probe;
detecting an interaction of said cantilever probe with said sample at values related to said first frequency and said second frequency; and
using interaction information indicative of said interaction, determining topographic and other information about said sample and simultaneously determining voltage dependent and other material properties of the sample,
wherein said detecting comprises measuring an amplitude and phase of first and second eigenmodes of the cantilever to provide information about a response of said sample interacting with a tip of the cantilever probe.
8. A method as in claim 7 , wherein said second frequency varies a voltage on the cantilever probe relative to the sample.
9. A method as in claim 8 , further comprising grounding said sample.
10. A method as in claim 7 , wherein said second frequency varies a magnetic field on the sample.
11. A method as in claim 7 , wherein said cantilever is driven to avoid touching the sample.
12. A method as in claim 7 , wherein said interaction response information includes values at said first and/or second frequencies or harmonics thereof.
13. A method as in claim 7 , wherein said second frequency varies an ultrasonic field on the sample.
14. A method as in claim 13 , further comprising using said cantilever as a waveguide for applying an ultrasonic wave to the sample an ultrasonic field.
15. An atomic force microscope, comprising:
a sample holder, with a surface that holds a sample;
a cantilever probe, having a tip that may be located near said surface;
a first actuator, which drives the cantilever probe at a first frequency;
a first frequency source controlling said first actuator;
a second frequency source at a second frequency different than the first frequency, varying an electrical potential of the cantilever probe and thereby causing said sample to excite motion in said cantilever probe; and
a detector, detecting a response of said cantilever probe interacting with said sample at values related to said first frequency and said second frequency, said detector producing topographic and other information about said sample, and also voltage dependent and other material properties of said-sample, wherein said detecting comprises measuring an amplitude and phase of first and second eigenmodes of the cantilever to provide information about the response, where the response is of said sample interacting with a tip of the cantilever probe.
16. A microscope as in claim 15 , further comprising a connection grounding said sample holder.
17. A microscope as in claim 15 , wherein said second frequency varies a voltage on the cantilever probe relative to the sample.
18. A microscope as in claim 15 , wherein interaction information includes values at said first and/or second frequencies or harmonics thereof.
19. A microscope as in claim 15 , wherein said detecting comprises measuring an amplitude of the cantilever at said first frequency as an error signal, and measuring information at said second frequency or a harmonic thereof to represent voltage dependent and other material properties of the sample.