Quantitative measurements using multiple frequency atomic force microscopy
View Patent ↗The imaging mode presented here combines the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the second resonant drive frequency operates in FM mode and is adjusted to keep the phase at 90 degrees, on resonance. With this approach, frequency feedback on the second resonant mode and topographic feedback on the first are decoupled, allowing much more stable, robust operation.
1. An atomic force microscope, comprising:
an atomic force microscope cantilever, having a base and a probe tip;
a surface for holding a sample to be measured by the cantilever, adjacent to the cantilever;
a controller; and
a cantilever driving element, driven by said controller,
the controller receiving a signal indicative of cantilever motion,
the controller exciting the cantilever at both of first and second eigenmodes, including one of the eigenmodes that provides attractive interactions between the cantilever and sample, and another of the eigenmodes that provides repulsive interactions between the cantilever and sample,
the controller exciting the cantilever at the first and second eigenmodes while controlling a distance between the cantilever and the sample, and
the controller measuring the amplitude and/or phase of the cantilever at least at one of first and second frequencies associated with one of the first and second eigenmodes.
2. The microscope as in claim 1 , wherein the controller measures amplitude and/or phase at both of the first and second frequencies.
3. The microscope as in claim 1 , wherein the controller measures amplitude and/or phase at one of the frequencies, and keeps constant amplitude and/or phase of the other of the frequencies.
4. The microscope as in claim 1 , wherein said first frequency is a resonant frequency of the cantilever.
5. The microscope as in claim 1 , wherein said controller is connected into a feedback loop, and maintain the probe tip of the cantilever in a pre-established relationship with respect to the surface of the sample in a Z axis direction defined between the probe tip and the sample, while scanning the sample.
6. The microscope as in claim 5 , wherein said first eigenmode is at a first resonant frequency of the cantilever, wherein said probe tip oscillates at said resonant frequency, and said resonant frequency is applied to said feedback loop to control interactions between the cantilever and sample to maintain an amplitude of oscillation at the first resonant frequency of the probe tip essentially constant at an amplitude setpoint.
7. The microscope as in claim 5 , wherein said second eigenmode is at a second resonant frequency of the cantilever.
8. The microscope as in claim 1 , wherein the measured amplitude and/or phase is used to determine information about the sample surface.
9. The microscope as in claim 1 , wherein the first eigenmode excites in a first mode, and the second eigenmode excites in a second mode, and in the absence of any second mode excitation, the first eigenmode is interacting with the surface in the attractive mode, and after the second mode is added, the first eigenmode is in a repulsive mode, induced by the addition of the second eigenmode energy.
10. A method of operating an atomic force microscope, comprising:
exciting an atomic force microscope cantilever, having a base and a probe tip relative to a surface for holding a sample to be measured by the cantilever, adjacent to the cantilever; and
establishing a feedback loop between the cantilever and a controller that carries out the exciting, the controller receiving a signal indicative of cantilever motion,
said exciting being at both of first and second eigenmodes, including one of the eigenmodes that provides attractive interactions between the cantilever and sample, and another of the eigenmodes that provides repulsive interactions between the cantilever and sample,
said exciting also controlling a distance between the cantilever and the sample, and
measuring the amplitude and/or phase of the cantilever at least at one of first and second frequencies associated with one of the first and second eigenmodes.
11. The method as in claim 10 , wherein the measuring comprises measuring amplitude and/or phase at both of the first and second frequencies.
12. The method as in claim 10 , wherein the measuring measures amplitude and/or phase at one of the frequencies, and keeps constant amplitude and/or phase of the other of the frequencies.
13. The method as in claim 10 , wherein said first eigenmode is at a first resonant frequency of the cantilever, wherein said probe tip oscillates at said resonant frequency, and said resonant frequency is applied to said feedback loop to control interactions between the cantilever and sample to maintain an amplitude of oscillation at the first resonant frequency of the probe tip essentially constant at an amplitude setpoint.
14. The method as in claim 10 , wherein the first eigenmode excites in a first mode, and the second eigenmode excites in a second mode, and in the absence of any second mode excitation, the first eigenmode is interacting with the surface in the attractive mode, and after the second mode is added, the first eigenmode is in a repulsive mode, induced by the addition of the second eigenmode energy.