Modular atomic force microscope
View Patent ↗A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available.
1. An atomic force microscope system operating to characterize a sample, comprising:
an atomic force microscope cantilever;
a view system that has optical features, including an objective lens located below the view system in the head system, which allow optical viewing in an area of the cantilever or of the sample;
a head system that directs the optical beam onto the cantilever and obtains a return beam from the cantilever indicative of movement of the cantilever, said system including said objective lens which directs the optical beam to the back of the cantilever opposite the tip and a mechanism for translating the head system in the Z direction relative to the cantilever thereby enabling the optical beam to be brought into focus on the back of the cantilever;
a scanner system that includes a holder for the cantilever, a holder for the sample which is mounted below the cantilever, a mechanism for scanning the sample in the X, Y and Z dimensions and a mechanism for translating the cantilever in the Z direction relative to the sample, said mechanism for translating the cantilever permitting the cantilever to move in tandem with the head system vertically downward in identical distances to the point where the tip of the cantilever engages the sample; and
a mechanical path between the cantilever and the sample which includes only the scanner system and its subsystems, the cantilever holder and the sample holder, so that the noise coupled into images and measurements of the sample is minimized.
2. The system as in claim 1 , wherein said head system is replaceable as a whole to replace with a different head having different characteristics.
3. The system as in claim 1 further comprising an isolation system, that encloses a chassis that holds said mechanical path, and provides acoustic and active thermal isolation for the atomic force microscope system.