IP Library Granted Patent US 6,936,302
Granted Patent B2
US 6,936,302 · App. 10/765,046 · Granted Aug 30, 2005

Electroless Ni-B plating liquid, electronic device and method for manufacturing the same

Assignees: Ebara Corporation; Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 6,936,302
App. No.
10/765,046
Granted
Aug 30, 2005
Kind
B2
Abstract

There is provided an electroless Ni—B plating liquid for forming, a Ni—B alloy film on at least part of the interconnects of an electronic device having an embedded interconnect structure, the electroless Ni—B plating liquid comprising nickel ions, a complexing agent for nickel ions, a reducing agent for nickel ions, and ammonums (NH 4 + ). The electroless Ni—B plating liquid can lower the boron content of the resulting plated film without increasing the plating rate and form a Ni—B alloy film having an FCC crystalline structure.

Claims (8)

1. A method for manufacturing an electronic device, said method comprising:

electroless plating an electronic device having an embedded interconnect structure with an electroless Ni—B plating liquid to form a protective layer of a Ni—B alloy film having a thickness of 10 to 100 nm selectively on a surface of an interconnect of said electronic device;

wherein said electroless Ni—B plating liquid comprises nickel ions, a complex agent for nickel ions, a reducing agent for nickel ions, and ammonium ions (NH 4 + ).

2. The method according to claim 1 , wherein said Ni—B alloy film has an FCC crystalline structure.

3. The method according to claim 1 , wherein said Ni—B alloy film has a boron content within the range from 0.01 at % to 10 at %.

4. The method according to claim 1 , wherein said ammonium ions are prepared from ammonia water.

5. The method according to claim 1 , wherein a pH of said electroless Ni—B plating liquid is adjusted within the range from 8 to 12.

6. The method according to claim 1 , wherein a temperature of said electroless Ni—B plating liquid is adjusted within the range from 50° C. to 90° C.

Priority Claims (2)
JP 2000-360807 · Nov 28, 2000 · national
JP 2001-034428 · Feb 9, 2001 · national
Continuity (2)
Division 0999483400 · Nov 28, 2001
Related Publication 20040182277A1 · Sep 23, 2004