IP Library › Granted Patent US 7,189,654
Granted Patent B2
US 7,189,654 · App. 10/769,852 · Granted Mar 13, 2007

Manufacturing method for wiring

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 7,189,654
App. No.
10/769,852
Granted
Mar 13, 2007
Kind
B2
Abstract

In the case in which a film for a resist is formed by spin coating, there is a resist material to be wasted, and the process of edge cleaning is added as required. Further, when a thin film is formed on a substrate using a vacuum apparatus, a special apparatus or equipment to evacuate the inside of a chamber vacuum is necessary, which increases manufacturing cost. The invention is characterized by including: a step of forming conductive layers on a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method; a step of discharging a compound to form resist masks so as to come into contact with the conductive layer; a step of etching the conductive layers with plasma generating means using the resist masks under the atmospheric pressure or a pressure close to the atmospheric pressure; and a step of ashing the resist masks with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure. With the above-mentioned characteristics, efficiency in use of a material is improved, and a reduction in manufacturing cost is realized.

Claims (52)

1. A manufacturing method for wiring, comprising:

forming a first conductive layer and a second conductive layer over a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method;

discharging a compound to selectively form a first resist layer over the first conductive layer and to selectively form a second resist layer over the second conductive layer wherein the first resist layer comprises a first resist mask selectively provided over the first conductive layer and wherein the second resist layer comprises a second resist mask selectively provided over the second conductive layer;

etching the first conductive layer and the second conductive layer with plasma generating means using the first resist mask and the second resist mask under an atmospheric pressure or a pressure close to the atmospheric pressure; and

ashing the first resist mask and the second resist mask with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure.

2. A manufacturing method for wiring, comprising:

forming a first conductive layer and a second conductive layer over a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method;

discharging a compound to selectively form a first resist layer over the first conductive layer and to selectively form a second resist layer over the second conductive layer wherein the first resist layer comprises a first resist mask selectively provided over the first conductive layer and wherein the second resist layer comprises a second resist mask selectively provided over the second conductive layer;

irradiating an ultraviolet ray on the first resist layer and the second resist layer via a photo mask;

etching the first conductive layer and the second conductive layer with plasma generating means using the first resist mask and the second resist mask, under an atmospheric pressure or a pressure close to the atmospheric pressure; and

ashing the first resist mask and the second resist mask with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure.

3. A manufacturing method for wiring according to claim 1 or 2 , wherein the first conductive layer and the second conductive layer are formed using a metal mask in a selective manner.

4. A manufacturing method for wiring according to claim 1 or 2 , wherein the compound contains a photosensitive agent.

5. A manufacturing method for wiring according to claim 1 or 2 , wherein the plasma generating means has first and second electrodes, and the first electrode surrounds the periphery of the second electrode and has a cylindrical shape having a nozzle-like supply port for the gas at tips thereof.

6. A manufacturing method for wiring according to claim 1 or 2 , wherein the plasma generating means has first and second electrodes, gas supplying means that introduces a gas between the first and the second electrodes, and a power supply that applies a voltage to the first or the second electrodes.

7. A manufacturing method for a display device, comprising:

forming a first conductive layer and a second conductive layer over a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method;

discharging a compound to selectively form a first resist layer over the first conductive layer and to selectively form a second resist layer over the second conductive layer wherein the first resist layer comprises a first resist mask selectively provided over the first conductive layer and wherein the second resist layer comprises a second resist mask selectively provided over the second conductive layer;

etching the first conductive layer and the second conductive layer with plasma generating means using the first resist mask and the second resist mask under an atmospheric pressure or a pressure close to the atmospheric pressure; and

ashing the first resist mask and the second resist mask with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure.

8. A manufacturing method for a display device according to claim 7 , wherein the first conductive layer and the second conductive layer are formed using a metal mask in a selective manner.

9. A manufacturing method for a display device according to claim 7 , wherein the compound contains a photosensitive agent.

10. A manufacturing method for a display device according to claim 7 , wherein the plasma generating means has first and second electrodes, and the first electrode surrounds the periphery of the second electrode and has a cylindrical shape having a nozzle-like supply port for the gas at tips thereof.

11. A manufacturing method for a display device according to claim 7 , wherein the plasma generating means has first and second electrodes, gas supplying means that introduces a gas between the first and the second electrodes, and a power supply that applies a voltage to the first or the second electrodes.

12. A manufacturing method for a display device, comprising:

forming a first conductive layer and a second conductive layer over a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method;

discharging a compound to selectively form a first resist layer over the first conductive layer and to selectively form a second resist layer over the second conductive layer wherein the first resist layer comprises a first resist mask selectively provided over the first conductive layer and wherein the second resist layer comprises a second resist mask selectively provided over the second conductive layer;

irradiating an ultraviolet ray on the first resist layer and the second resist layer via a photo mask;

etching the first conductive layer and the second conductive layer with plasma generating means using the first resist mask and the second resist mask, under an atmospheric pressure or a pressure close to the atmospheric pressure; and

ashing the first resist mask and the second resist mask with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure.

13. A manufacturing method for a display device according to claim 12 , wherein the first conductive layer and the second conductive layer are formed using a metal mask in a selective manner.

14. A manufacturing method for a display device according to claim 12 , wherein the compound contains a photosensitive agent.

15. A manufacturing method for a display device according to claim 12 , wherein the plasma generating means has first and second electrodes, and the first electrode surrounds the periphery of the second electrode and has a cylindrical shape having a nozzle-like supply port for the gas at tips thereof.

16. A manufacturing method for a display device according to claim 12 , wherein the plasma generating means has first and second electrodes, gas supplying means tat introduces a gas between the first and the second electrodes, and a power supply that applies a voltage to the first or the second electrodes.

17. A manufacturing method for wiring, comprising:

forming a first conductive layer and a second conductive layer over a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method;

discharging a compound from a nozzle to selectively form a first resist layer over the first conductive layer and to selectively form a second resist layer over the second conductive layer wherein the first resist layer comprises a first resist mask selectively provided over the first conductive layer and wherein the second resist layer comprises a second resist mask selectively provided over the second conductive layer;

scanning the substrate during the discharging of the compound;

etching the first conductive layer and the second conductive layer with plasma generating means using the first resist mask and the second resist mask under an atmospheric pressure or a pressure close to the atmospheric pressure; and

ashing the first resist mask and the second resist mask with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure.

18. A manufacturing method for wiring according to claim 17 , wherein the first conductive layer and the second conductive layer are formed using a metal mask in a selective manner.

19. A manufacturing method for wiring according to claim 17 , wherein the plasma generating means has first and second electrodes, and the first electrode surrounds the periphery of the second electrode and has a cylindrical shape having a nozzle-like supply port for the gas at tips thereof.

20. A manufacturing method for wiring according to claim 17 , wherein the plasma generating means has first and second electrodes, gas supplying means that introduces a gas between the first and the second electrodes, and a power supply that applies a voltage to the first or the second electrodes.

21. A manufacturing method for wiring, comprising:

forming a first conductive layer and a second conductive layer over a substrate having a dielectric surface in a selective manner with a CVD method, an evaporation method, or a sputtering method;

discharging a compound from a nozzle to selectively form a first resist layer over the first conductive layer and to selectively form a second resist layer over the second conductive layer wherein the first resist layer comprises a first resist mask selectively provided over the first conductive layer and wherein the second resist layer comprises a second resist mask selectively provided over the second conductive layer;

scanning the nozzle during the discharging of the compound;

etching the first conductive layer and the second conductive layer with plasma generating means using the first resist mask and the second resist mask under an atmospheric pressure or a pressure close to the atmospheric pressure; and

ashing the first resist mask and the second resist mask with the plasma generating means under the atmospheric pressure or a pressure close to the atmospheric pressure.

22. A manufacturing method for wiring according to claim 21 , wherein the first conductive layer and the second conductive layer are formed using a metal mask in a selective manner.

23. A manufacturing method for wiring according to claim 21 , wherein the plasma generating means has first and second electrodes, and the first electrode surrounds the periphery of the second electrode and has a cylindrical shape having a nozzle-like supply port for to gas at tips thereof.

24. A manufacturing method for wiring according to claim 21 , wherein the plasma generating means has first and second electrodes, gas supplying means that introduces a gas between the first and the second electrodes, and a power supply that applies a voltage to the first or the second electrodes.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2004
From: YAMAZAKI, SHUNPEI; KUWABARA, HIDEAKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 014958/0731 →
Priority Claims (2)
JP 2003-028853 · Feb 5, 2003 · national
JP 2003-028878 · Feb 5, 2003 · national
Continuity (1)
Related Publication 20050011752A1 · Jan 20, 2005