IP Library Granted Patent US 6,980,455
Granted Patent B2
US 6,980,455 · App. 10/770,675 · Granted Dec 27, 2005

Remote sensed pre-amplifier for cross-point arrays

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Quick Facts
Patent No.
US 6,980,455
App. No.
10/770,675
Granted
Dec 27, 2005
Kind
B2
Abstract

In a particular embodiment, there are a plurality of parallel electrically conductive rows and a plurality of parallel electrically conductive columns crossing the rows, thereby forming a cross-point array with a plurality of intersections. Resistive devices, such as magnetic memory cells, also known as spin valve memory cells, are provided in electrical contact with and located at each intersection. A feedback controlled sense pre-amplifier is also provided to maintain an equi-potential for a given memory cell. A reference voltage is provided to the sense pre-amplifier. As voltage potential, VA′, is provided to the first end of a selected column, contacting a selected memory cell, a feedback voltage VA is provided to the sense pre-amplifier by an independent sense path. The independent sense path connects to the second end of the selected column. The sense pre-amplifier adjusts the applied potential VA to minimize the difference between the feedback and reference voltage.

Claims (70)

1. A data storage device comprising:

a cross-point array of resistive devices; and

a feedback controlled sense pre-amplifier receiving a reference voltage and feedback from the cross-point array when a potential is applied to a selected resistive device within the array, the sense pre-amplifier adjusting the applied potential to minimize the difference between the feedback and reference voltage;

wherein the feedback is received from an independent sense path.

2. The data storage device of claim 1 , wherein the feedback controlled sense pre-amplifier is an equi-potential sense pre-amplifier.

3. The data storage device of claim 1 , wherein the cross-point array includes:

a plurality of parallel electrically conductive rows; and

a plurality of parallel electrically conductive columns crossing the rows, each thereby forming a cross point array with a plurality of intersections;

wherein each resistive device is in electrical contact with and located at an intersection between a row and column.

4. The data storage device of claim 3 , wherein each column has a first end and a second end, and a select element coupled to each end.

5. The data storage device of claim 4 , wherein the feedback is obtained from the select element at the second end of a selected column, and the potential is applied to the select element at the first end of the selected column.

6. The data storage device of claim 3 , wherein the resistive devices are magnetic memory cells, each memory cell including:

at least one ferromagnetic data layer characterized by an alterable orientation of magnetization;

an intermediate layer in contact with the data layer; and

at least one ferromagnetic reference layer in contact with the intermediate layer, opposite from the data layer.

7. The data storage device of claim 6 , wherein the reference layer is a soft-reference layer.

8. A resistive cross-point array comprising:

a plurality of parallel electrically conductive rows, each having a first and second end;

a plurality of parallel electrically conductive columns crossing the rows, each having a first and second end, thereby forming a cross point array with a plurality of intersections;

a plurality of resistive devices, each device in electrical contact with and located at an intersection between a row and column;

a feedback controlled sense pre-amplifier receiving a reference voltage and a feedback voltage from the second end of a selected column when a potential is applied to a selected resistive device connected to the first end of the selected column, the sense pre-amplifier adjusting the applied potential to minimize the difference between the feedback and reference voltage.

9. The resistive cross-point array of claim 8 , wherein the potential is applied to the first end of the selected column.

10. The resistive cross-point array of claim 8 , wherein the feedback controlled sense pre-amplifier is an equi-potential sense pre-amplifier.

11. The resistive cross-point array of claim 8 , wherein the feedback is received from an independent sense path.

12. The resistive cross-point array of claim 8 , wherein the resistive devices are magnetic memory cells, each memory cell including:

at least one ferromagnetic data layer characterized by an alterable orientation of magnetization;

an intermediate layer in contact with the data layer; and

at least one ferromagnetic reference layer in contact with the intermediate layer, opposite from the data layer.

13. The resistive cross-point array of claim 12 , wherein the reference layer is a soft-reference layer.

14. The resistive cross-point array of claim 8 , further including a circuit for sensing resistance states of a selected resistive device during read operations on the selected resistive device, the circuit;

applying a first voltage to the first end of a selected row conductor;

applying a second voltage to at least a subset of unselected row and unselected column conductors;

applying a third voltage to the first end of a selected column conductor, the third voltage being substantially equi-potential to the second voltage;

sensing a feedback voltage from the second end of the selected column conductor; and

adjusting the third voltage by the feedback controlled sense pre-amplifier to minimize the difference between the feedback and reference voltage.

15. The resistive cross-point array of claim 14 , wherein the third voltage is adjusted as the resistance state of the resistive device is changed.

16. The resistive cross-point array of claim 14 , wherein the reference voltage applied to the feedback controlled sense pre-amplifier is substantially equal to the second voltage.

17. A magnetic memory device with remote sensed pre-amplifier comprising:

a plurality of parallel electrically conductive rows, each having a first and second end;

a plurality of parallel electrically conductive columns crossing the rows, each having a first and second end, thereby forming a cross point array with a plurality of intersections;

a plurality of magnetic memory cells, each cell in electrical contact with and located at an intersection between a row and column;

a feedback controlled sense pre-amplifier receiving a reference voltage and feedback from the second end of a selected column when a potential is applied to a selected memory cell connected to the first end of the selected column, the sense pre-amplifier adjusting the applied potential to minimize the difference between the feedback and reference voltage.

18. The magnetic memory device of claim 17 , wherein the each memory cells includes:

at least one ferromagnetic data layer characterized by an alterable orientation of magnetization;

an intermediate layer in contact with the data layer; and

at least one ferromagnetic reference layer in contact with the intermediate layer, opposite from the data layer.

19. The magnetic memory device of claim 18 , wherein the reference layer is a soft-reference layer.

20. The magnetic memory device of claim 17 , wherein the feedback is received from an independent sense path.

21. The magnetic memory device of claim 17 , wherein including a circuit for sensing resistance states of a selected memory cell during read operations on the selected memory cell, the circuit;

applying a first voltage to the first end of a selected row conductor;

applying a second voltage to at least a subset of unselected row and unselected column conductors;

applying a third voltage to the first end of a selected column conductor, the third voltage being substantially equi-potential to the second voltage;

sensing a feedback voltage from the second end of the selected column conductor; and

adjusting the third voltage by the feedback controlled sense pre-amplifier to minimize the difference between the feedback and reference voltage.

22. The magnetic memory device of claim 21 , wherein the third voltage is adjusted as the resistance state of the selected memory cell is changed.

23. The magnetic memory device of claim 21 , wherein the reference voltage applied to the feedback controlled sense pre-amplifier is substantially equal to the second voltage.

24. A computer system comprising:

a main board;

at least one central processing unit (CPU) coupled to the main board; and

at least one memory store joined to the CPU by the main board, the memory store including;

a plurality of parallel electrically conductive rows, each having a first and second end;

a plurality of parallel electrically conductive columns crossing the rows, each having a first and second end, thereby forming a cross point array with a plurality of intersections;

a plurality of magnetic memory cells, each cell in electrical contact with and located at an intersection between a row and column;

a feedback controlled sense pre-amplifier receiving a reference voltage and feedback from the second end of a selected column when a potential is applied to a selected memory cell connected to the first end of the selected column, the sense pre-amplifier adjusting the applied potential to minimize the difference between the feedback and reference voltage.

25. The computer system of claim 24 , wherein the feedback is received from an independent sense path.

26. The computer system of claim 24 , wherein the memory store further includes a circuit for sensing resistance states of a selected memory cell during read operations on the memory cell, the circuit;

applying a first voltage to the first end of a selected row conductor applying a second voltage to at least a subset of unselected row and unselected column conductors;

applying a third voltage to the first end of a selected column conductor, the third voltage being substantially equi-potential to the second voltage;

sensing a feedback voltage from the second end of the selected column conductor; and

adjusting the third voltage by the feedback controlled sense pre-amplifier to minimize the difference between the feedback and reference voltage.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 22, 2007
From: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 019733/0202 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2004
From: PERNER, FREDERICK A.
To: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
Reel/Frame 014959/0880 →