Database interpolation method for optical measurement of diffractive microstructures
View Patent ↗A database interpolation method is used to rapidly calculate a predicted optical response characteristic of a diffractive microstructure as part of a real-time optical measurement process. The interpolated optical response is a continuous and (in a preferred embodiment) smooth function of measurement parameters, and it matches the theoretically-calculated optical response at the database-stored interpolation points.
1. A method of evaluating a diffracting structure formed on a semiconductor sample comprising the steps of:
creating a database, said database including interpolation points and associated theoretical optical response characteristics, each interpolation point corresponding to a sample parameter set and with the associated theoretical optical response characteristics being determined by applying a sample model to each of the parameter sets;
measuring the actual optical response characteristics of the sample; and
iteratively interpolating between the interpolation points using an interpolation model that defines a substantially continuous function which intersects with the interpolation points in order to derive a set of interpolated optical response characteristics that best fit the actual optical response characteristics to evaluate the sample.
2. A method as recited in claim 1 , wherein the optical response characteristics are in the form of one or both of complex reflectance coefficients and scattering matrices.
3. A method as recited in claim 1 , wherein said optical response characteristics are created and measured as a function of wavelength.
4. A method as recited in claim 1 , wherein said interpolation model utilizes one or more of linear, multi-cubic, and quadratic functions.
5. A method of evaluating parameters of a diffracting structure formed on semiconductor samples comprising the steps of:
calculating optical response characteristics for selected parameter sets, each set of parameters corresponding to an interpolation point;
defining a continuous model of the optical responses as a function of the parameters that equals the optical responses at the interpolation points;
measuring an optical signal of a sample; and
evaluating the parameters of the sample by iteratively fitting the optical signal with the interpolation model.
6. A method as recited in claim 5 , wherein the calculating comprises calculating one or both the complex reflectance coefficients and scattering matrices.
7. A method as recited in claim 5 , wherein said optical signals are measured as a function of wavelength.
8. A method as recited in claim 5 , wherein said measuring step comprises measuring reflectance of the sample.
9. A method as recited in claim 5 , wherein said interpolation model comprises one or more of linear, multi-cubic, or quadratic functions.
10. A method as recited in claim 5 , wherein fitting comprises calculating a theoretical optical signal from the model.