IP Library Granted Patent US 7,034,399
Granted Patent B2
US 7,034,399 · App. 10/782,329 · Granted Apr 25, 2006

Forming a porous dielectric layer

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Quick Facts
Patent No.
US 7,034,399
App. No.
10/782,329
Granted
Apr 25, 2006
Kind
B2
Abstract

A dielectric layer is made porous by treating the dielectric material after metal interconnects are formed in or through that layer. The porosity lowers the dielectric constant of the dielectric material. The dielectric material may be subjected to an electron beam or a sonication bath to create the pores. The structure has smooth sidewalls for metal interconnects extending through the dielectric layer.

Claims (6)

1. A device comprising:

a semiconductor substrate having at least one layer with conductive metal lines thereon; and

a porous carbon doped oxide between the metal lines, said porous carbon doped oxide having a facing dielectric surface abutting a conductive metal line, the conductive metal line having a smoother sidewall than the facing dielectric surface.

2. The device of claim 1 wherein the carbon doped oxide is at least 50% porous.

3. The device of claim 2 wherein said carbon doped oxide has a dielectric constant below about 3.0.

4. The device of claim 1 wherein said oxide is over a conductive layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061175/0176 →