IP Library Granted Patent US 7,071,675
Granted Patent B2
US 7,071,675 · App. 10/792,810 · Granted Jul 4, 2006

Band distribution inspecting device and band distribution inspecting method

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Quick Facts
Patent No.
US 7,071,675
App. No.
10/792,810
Granted
Jul 4, 2006
Kind
B2
Abstract

An object of this invention is to provide a band distribution inspecting device and band distribution inspecting method capable of carrying out inspection on whether or not a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency as a reference point has a band distribution rapidly, with a simple way and at a cheap price. A scattered oscillation signal SSS inputted to a band distribution detecting section 22 is outputted as a predetermined band pass signal SBP through a band pass filter 17 having a predetermined pass band of a predetermined narrow-band width Δf within a band distribution. This signal is converted to a root-mean-square value by a smoother 19 , smoothed by a capacitor C 1 and transferred to a general purpose inspecting device 21 as a DC signal SAV. The DC signal SAV is compared with a predetermined voltage value VX by a comparator 25 and its comparison result is judged by a judging section 25 and then, an inspection result is outputted as a judging signal J. As a result, an edge frequency in the band distribution of the scattered oscillation signal SSS and disturbance of frequency variation within/out of the band and dullness in waveform and the like can be inspected for.

Claims (32)

1. A band distribution inspecting device for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency of the fundamental oscillation signal as a reference point, comprising:

a band pass filter which the scattered oscillation signal is inputted to and has a predetermined pass band of a predetermined narrow-band width with respect to the band distribution; and

a signal strength detector which receives a predetermined band pass signal outputted from the band pass filter and outputs a band strength signal corresponding to a signal amplitude; and

an oscillator section for setting the fundamental frequency of the fundamental oscillation signal so that it is adjustable,

wherein the band distribution is inspected according to a change in the position of band distribution shifted corresponding to the fundamental oscillation signal in which the fundamental frequency changes, with respect to the predetermined band pass signal.

2. The band distribution inspecting device according to claim 1 wherein the signal strength detector has an amplitude amplifier for amplifying a signal amplitude of a band pass signal.

3. The band distribution inspecting device according to claim 1 wherein the signal strength detector includes a first smoother for smoothing a band pass signal or an output signal from an amplitude amplifier in an oscillation frequency band of the scattered oscillation signal.

4. The band distribution inspecting device according to claim 1 wherein the signal strength detector includes a second smoother for smoothing a band pass signal according to the period of the frequency variation of the scattered oscillation signal.

5. The band distribution inspecting device according to claim 1 wherein the signal strength detector includes a peak value holding circuit for holding a peak value of a band pass signal.

6. A band distribution inspecting device for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency as a reference point, comprising:

plural band pass filters which include pass band of a predetermined narrow-band width for each band position in the band distribution and which the scattered oscillation signal is to be inputted;

a signal strength detector which receives a band pass signal outputted from each of the band pass filters and outputs a band strength signal corresponding to the signal amplitude; and

a switch section which selects a band pass filter from the plural band pass filters and sends a band pass signal of a pass band selected to the scattered oscillation signal to the signal strength detector,

wherein the band distribution is inspected corresponding to a band pass signal from each of the band pass filters.

7. The band distribution inspecting device according to claim 6 wherein the signal strength detector has an amplitude amplifier for amplifying a signal amplitude of a band pass signal.

8. The band distribution inspecting device according to claim 6 wherein the signal strength detector includes a first smoother for smoothing a band pass signal in an oscillation frequency band of the scattered oscillation signal.

9. The band distribution inspecting device according to claim 3 wherein an output signal from the signal strength detector is inputted to a frequency counter or/and a frequency analyzer.

10. The band distribution inspecting device according to claim 6 wherein the signal strength detector includes a second smoother for smoothing a band pass signal according to the period of the frequency variation of the scattered oscillation signal.

11. The band distribution inspecting device according to claim 6 wherein the signal strength detector includes a peak value holding circuit for holding a peak value of a band pass signal.

12. A band distribution inspecting method for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency of the fundamental oscillation signal as a reference point, comprising:

a frequency setting step of changing the fundamental frequency of the fundamental oscillation signal successively; and

every time the fundamental frequency is set in the frequency setting step, performing a predetermined band selecting step of selecting a predetermined band signal of a predetermined narrow-band width with respect to a band distribution at a predetermined band position in the scattered oscillation signal, and a signal strength detecting step of outputting a band strength signal corresponding to a signal amplitude of a selected predetermined band signal, so as to inspect the band distribution.

13. The band distribution inspecting method according to claim 12 wherein a band strength signal is outputted corresponding to a first smoothing signal obtained by smoothing a band signal in the oscillation frequency band of the scattered oscillation signal in the signal strength detecting step.

14. The band distribution inspecting method according to claim 13 further has a frequency variation characteristic inspecting step of measuring oscillation period or/and oscillation duty of a band strength signal.

15. The band distribution inspecting method according to claim 13 wherein, in the signal strength detecting step, a band strength signal is outputted corresponding to a band signal obtained by smoothing a first smoothing signal according to a period of the frequency variation of the scattered oscillation signal.

16. The band distribution inspecting method according to claim 12 wherein the signal strength detecting step includes a peak value holding step of holding a peak value of a band signal.

17. A band distribution inspecting method for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency as a reference point, comprising:

a band selecting step of selecting a band signal of a predetermined narrow-band width successively for each band position with respect to a band distribution of the scattered oscillation signal; and

a signal strength detecting step of outputting a band strength signal corresponding to a signal amplitude of the band signal for each selected band signal, so as to inspect the band distribution.

18. The band distribution inspecting method according to claim 17 wherein a band strength signal is outputted corresponding to a first smoothing signal obtained by smoothing a band signal in the oscillation frequency band of the scattered oscillation signal in the signal strength detecting step.

19. The band distribution inspecting method according to claim 18 wherein, in the signal strength detecting step, a band strength signal is outputted corresponding to a band signal obtained by smoothing a first smoothing signal according to a period of the frequency variation of the scattered oscillation signal.

20. The band distribution inspecting method according to claim 17 wherein the signal strength detecting step includes a peak value holding step of holding a peak value of a band signal.

Assignments (9)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040911/0238 →
PARTIAL RELEASE OF SECURITY INTEREST IN PATENTS Recorded Aug 11, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 039708/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036039/0001 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2013
From: FUJITSU SEMICONDUCTOR LIMITED
To: SPANSION LLC
Reel/Frame 031205/0461 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 5, 2004
From: ONO, YASUKAZU; OKADA, KOJI; MATSUNAMI, HIROYUKI
To: FUJITSU LIMITED
Reel/Frame 015048/0736 →