IP Library › Patent Application 10828389
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App. No. 10/828,389 · Confirmation No. 4832

Method and apparatus for multilayer thickness measurement

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2006-03-27 ABN Abandonment 2 View
2006-03-27 EXIN Examiner Interview Summary Record (PTOL - 413) 2 View
2006-03-27 BIB Bibliographic Data Sheet 1 View
2006-03-09 PETDEC Petition Decision 1 View
2005-09-07 CTNF Non-Final Rejection 10 View
2005-09-07 892 List of references cited by examiner 1 View
2005-09-07 SRFW Search information including classification, databases and other search related notes 1 View
2005-09-07 FWCLM Index of Claims 1 View
2005-09-07 BIB Bibliographic Data Sheet 2 View
2005-09-03 SRNT Examiner's search strategy and results 2 View
2004-10-25 WFEE Fee Worksheet (SB06) 1 View
2004-10-25 FWCLM Index of Claims 1 View
2004-08-26 PEFR Applicant Response to Pre-Exam Formalities Notice 3 View
2004-08-26 OATH Oath or Declaration filed 2 View
2004-06-30 PEFN Pre-Exam Formalities Notice 2 View
2004-04-19 136A Authorization for Extension of Time all replies 3 View
2004-04-19 SPEC Specification 20 View
2004-04-19 CLM Claims 5 View
2004-04-19 ABST Abstract 1 View
2004-04-19 DRW Drawings-only black and white line drawings 15 View
2004-04-19 ADS Application Data Sheet 3 View
2004-04-19 WFEE Fee Worksheet (SB06) 1 View
2004-04-19 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/828,389
Filed
2004-04-19
Pub. No.
US20040261532A1
Art Unit
2856