IP Library Granted Patent US 6,856,568
Granted Patent B1
US 6,856,568 · App. 10/843,784 · Granted Feb 15, 2005

Refresh operations that change address mappings in a non-volatile memory

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Quick Facts
Patent No.
US 6,856,568
App. No.
10/843,784
Granted
Feb 15, 2005
Kind
B1
Abstract

A multi-bit-per-cell non-volatile memory performs refresh operations that move data to different physical storage locations. The movement of data may extend the life of a non-volatile memory by avoiding repetitive erasing and writing of the same data value in the same memory cell. A memory mapping circuit in the memory adjusts for different storage configuration that the refresh operations create. In a particular embodiment, a refresh operation swaps the physical locations of two data blocks, and alternates between two mappings of physical addresses to logical addresses.

Claims (21)

1. A method for operating a non-volatile memory, comprising:

performing a first refresh operation that reads data from a first location having first physical address in the non-volatile memory and writes the data to a second location having a second physical address in the memory;

operating the memory using a first address mapping that maps a logical address corresponding to the data to the second physical address;

performing a second refresh operation that reads the data from the second location in the non-volatile memory and writes the data to the first location in the memory; and

operating the memory using a second address mapping that maps the logical address corresponding to the data to the second physical address.

2. The method of claim 1 , wherein performing the first refresh operation and performing the second refresh operation are separated by a time selected according to a ratio of a maximum tolerable drift in a threshold voltage of a memory cell and an expected rate of drift of the threshold voltage of the memory cell.

3. The method of claim 1 , further comprising:

performing a third refresh operation that reads data from the first location and writes the data to the second location; and

operating the memory using the first address mapping that maps a logical address corresponding to the data to the second physical address.

4. The method of claim 1 , wherein:

the first refresh operation writes a portion of the data into a first sector of the non-volatile memory, wherein the second address mapping does not map any logical address to the first sector; and

the second refresh operation writes a portion of the data into a second sector of the non-volatile memory, wherein the first address mapping does not map any logical address to the second sector.

5. The method of claim 4 , wherein the first refresh operation further comprises erasing the second sector, and then

performing a dummy write operation on the second sector.

6. The method of claim 5 , wherein the second refresh operation further comprises erasing the first sector; and then

performing a dummy write operation on the first sector.

7. A method for operating a non-volatile memory, comprising:

performing a series of refresh operations wherein the refresh operations in the series alternate between a first type of refresh operation and a second type of refresh operation, wherein the first type of refresh operation that reads data from a first location having first physical address in the non-volatile memory and writes the data to a second location having a second physical address in the memory, and the second type of refresh operation reads the data from the second location in the non-volatile memory and writes the data to the first location in the memory;

operating the memory using a first address mapping that maps a logical address corresponding to the data to the second physical address; and

operating the memory using a second address mapping that maps the logical address corresponding to the data to the second physical address.

8. The method of claim 7 , wherein performances of refresh operations in the series are separated by a time selected according to a ratio of a maximum tolerable drift in a threshold voltage of a memory cell and an expected rate of drift of the threshold voltage of the memory cell.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2006
From: INTERNATIONAL DEVELOPMENT AND LICENSING
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 017230/0319 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2005
From: MULTI LEVEL MEMORY TECHNOLOGY
To: INTERNATIONAL DEVELOPMENT AND LICENSING
Reel/Frame 017176/0517 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2005
From: MULTI LEVEL MEMORY TECHNOLOGY (CALIFORNIA)
To: MULTI LEVEL MEMORY TECHNOLOGY (NEVADA)
Reel/Frame 016800/0640 →