IP Library Granted Patent US 7,447,492
Granted Patent B2
US 7,447,492 · App. 10/860,519 · Granted Nov 4, 2008

On chip transformer isolator

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Quick Facts
Patent No.
US 7,447,492
App. No.
10/860,519
Granted
Nov 4, 2008
Kind
B2
Abstract

An integrated circuit having voltage isolation capabilities includes a first area of the integrated circuit containing functional circuitry that is located in the substrate of the integrated circuit. A second area of the integrated circuit contains an integrated RF isolation circuitry for voltage isolating the functional circuitry. The RF isolation circuitry is located in the metal layers of the integrated circuit.

Claims (70)

1. An integrated circuit having voltage isolation capabilities, comprising:

a first area of the integrated circuit containing functional circuitry, the functional circuitry located in a substrate of the integrated circuit; and

a second area of the integrated circuit containing integrated RF isolation circuitry for voltage isolating the functional circuitry, the RF isolation circuitry located in metal layers of the integrated circuit wherein the RF isolation circuitry further comprises:

a first coil located on a first metal layer, the first coil connected to the functional circuitry;

a second coil located on a second metal layer above the first metal layer and substantially non-overlapping the first coil, the second coil electromagnetically coupled to the first coil; and

wherein runs of the first coil are diagonally offset from runs of the second coil.

2. The integrated circuit of claim 1 , wherein the RF isolation circuitry further comprises:

first and second terminals located on a third metal layer below the first metal layer for interconnecting the first coil with the functional circuitry.

3. The integrated circuit of claim 2 , wherein the first metal layer and the second metal layer are separated by at least one dielectric layer.

4. The integrated circuit of claim 1 , wherein the first metal layer is the metal one layer and the second metal layer comprises the metal five layer.

5. The integrated circuit of claim 1 further including:

a first pad connected to a first end of the second coil and located within the second coil; and

a second pad connected to a second end of the second coil and located substantially near an edge of the second coil.

6. The integrated circuit of claim 1 , wherein the RF isolation circuitry further comprises a plurality of transformers, each of the plurality of transformers comprising:

a first coil located on a first metal layer, the first coil connected to the functional circuitry;

a second coil located on a second metal layer above the first metal layer and substantially non-overlapping the first coil, the second coil electromagnetically coupled to the first coil.

7. The integrated circuit of claim 6 wherein each transformer further includes:

a first pad connected to a first end of the second coil and located within the second coil;

a second pad connected to a second end of the second coil and located substantially near an edge of the second coil; and

wherein at least two of the plurality of transformers share the second pad for the second coil.

8. The integrated circuit of claim 6 wherein each of the plurality of RF isolation interfaces further includes:

a first pad connected to a first end of the second coil and located within the second coil;

a second pad connected to a second end of the second coil and located substantially near an edge of the second coil; and

wherein at least two of the plurality of RF isolation interfaces share the second pad for the second coil.

9. An integrated circuit having voltage isolation capabilities, comprising:

a first area of the integrated circuit containing functional circuitry, the functional circuitry located in a substrate of the integrated circuit; and

a second area of the integrated circuit containing integrated at least one RF isolation interface for voltage isolating the functional circuitry, the at least one RF isolation interface located in metal layers of the integrated circuit above the substrate, the at least one RF isolation interface comprising:

a first coil located on a first metal layer, the first coil connected to the functional circuitry;

a second coil located on a second metal layer above the first metal layer and substantially non-overlapping the first coil, the second coil electromagnetically coupled to the first coil;

wherein runs of the first coil are diagonally offset from runs of the second coil;

first and second terminals located on a third metal layer below the first metal layer for interconnecting the first coil with the functional circuitry;

a first pad connected to a first end of the second coil and located within the second coil; and

a second pad connected to a second end of the second coil and located substantially near an edge of the second coil.

10. The integrated circuit of claim 9 , wherein the first metal layer and the second metal layer are separated by at least one dielectric layer.

11. The integrated circuit of claim 9 , wherein the first metal layer is the metal one layer and the second metal layer comprises the metal five layer.

12. The integrated circuit of claim 9 , wherein the at least one RF isolation interface further comprises a plurality of RF isolation interfaces, each of the plurality of RF isolation interfaces comprising:

a first coil located on a first metal layer, the first coil connected to the functional circuitry;

a second coil located on a second metal layer above the first metal layer and substantially non-overlapping the first coil, the second coil electromagnetically coupled to the first coil.

13. An integrated circuit having voltage isolation capabilities, comprising:

a first area of the integrated circuit containing a first group of functional circuitry, the first group of functional circuitry located in a substrate of the integrated circuit;

a second area of the integrated circuit containing a second group of functional circuitry, the second group of functional circuitry located in the substrate of the integrated circuit;

a third area of the integrated circuit containing integrated RF isolation circuitry for voltage isolating the first group of functional circuitry from the second group of functional circuitry , the RF isolation circuitry located in metal layers of the integrated circuit; and

wherein the RF isolation circuitry further comprises:

a first coil located on a first metal layer, the first coil connected to the first group of functional circuitry;

a second coil located on a second metal layer above the first metal layer and substantially non-overlapping the first coil, the second coil electromagnetically coupled to the first coil

a third coil located on the first metal layer, the third coil connected to the second group of functional circuitry; and

a fourth coil located on the second metal layer above the first metal layer and substantially non-overlapping the third coil, the fourth coil electromagnetically coupled to the third coil and connected to the second coil.

14. The integrated circuit of claim 13 , wherein the RF isolation circuitry further comprises:

first and second terminals located on a third metal layer below the first metal layer for interconnecting the first coil with the functional circuitry; and

third and fourth terminals located on the third metal layer below the first metal layer for interconnecting the first coil with the second group of functional circuitry.

15. The integrated circuit of claim 13 , wherein runs of the first coil are diagonally offset from runs of the second coil.

16. The integrated circuit of claim 13 wherein runs of the third coil are diagonally offset from runs of the fourth coil.

17. The integrated circuit of claim 13 , wherein the first metal layer and the second metal layer are separated by at least one dielectric layer.

18. The integrated circuit of claim 13 , wherein the first metal layer is the metal one layer and the second metal layer comprises the metal five layer.

19. The integrated circuit of claim 13 further including:

a first pad connected to a first end of the second coil and located within the second coil; and

a second pad connected to a second end of the second coil and located substantially near an edge of the second coil;

a third pad connected to a first end of the fourth coil and located within the fourth coil; and

a fourth pad connected to a second end of the fourth coil and located substantially near an edge of the fourth coil.

20. The integrated circuit of claim 19 wherein each transformer further includes:

a first pad connected to a first end of the second coil and located within the second coil; and

a second pad connected to a second end of the second coil and located substantially near an edge of the second coil;

a third pad connected to a first end of the fourth coil and located within the fourth coil; and

a fourth pad connected to a second end of the fourth coil and located substantially near an edge of the fourth coil; and

wherein at least two of the plurality of transformers share the second pad for the second coil and share the fourth pad for the fourth coil.

21. The integrated circuit of claim 13 , wherein the RF isolation circuitry further comprises a plurality of channels, each of the plurality of channels comprising:

a first coil located on a first metal layer, the first coil connected to the first group of functional circuitry;

a second coil located on a second metal layer above the first metal layer and substantially non-overlapping the first coil, the second coil electromagnetically coupled to the first coil

a third coil located on the first metal layer, the third coil connected to the second group of functional circuitry; and

a fourth coil located on the second metal layer above the first metal layer and substantially non-overlapping the third coil, the fourth coil electromagnetically coupled to the third coil and connected to the second coil.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 29, 2021
From: SILICON LABORATORIES INC.
To: SKYWORKS SOLUTIONS, INC.
Reel/Frame 057033/0579 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2004
From: DUPUIS, TIMOTHY
To: SILICON LABORATORIES, INC.
Reel/Frame 015436/0397 →