Embossed mask lithography
View Patent ↗Disclosed are layered groupings and methods for constructing digital circuitry, such as memory known as Permanent Inexpensive Rugged Memory (PIRM) cross point arrays which can be produced on flexible substrates by patterning and curing through the use of a transparent embossing tool.
1. A digital data circuitry system comprising:
a memory module having digital circuitry having a plurality of formed portions, at least one of said formed portions having at least a first and a second groupings of embossed layers adjacent to a planar surface, said first and second groupings of embossed layers being formed with respective substantially linear trenches and peaks which are in substantially orthogonal juxtaposition to each other on opposite sides of said planar surface.
2. The digital data circuitry system as claimed in claim 1 , wherein said respective substantially linear trenches and peaks of said first and second groupings of embossed layers are formed on a flexible substrate and mask etched through the use of anisotropic etching.
3. The digital data circuitry system as claimed in claim 1 , wherein said forming of said first and second groupings of embossed layers on a flexible substrate is accomplished through the use of UV curing.
4. The digital data circuitry system as claimed in claim 1 , wherein said first and second groupings are embossed using at least one stamper substantially formed from at least one material from a group comprising UV curable silicone rubbers.
5. The digital data circuitry system as claimed in claim 1 , wherein said first and second groupings are embossed using at least one stamper substantially formed from poly dimethyl siloxane (PDMS).
6. The digital data circuitry system as claimed in claim 1 , wherein said respective substantially linear trenches and peaks of said first and second groupings of embossed layers are formed on a flexible substrate and mask etched through the use of reactive ion etching.
7. The digital data circuitry system as claimed in claim 1 , wherein said first and second groupings further comprise at least one thin film formed from at least one material from a group of materials comprising metals, dielectrics, and semiconductors.