IP Library › Granted Patent US 7,556,982
Granted Patent B2
US 7,556,982 · App. 10/892,736 · Granted Jul 7, 2009

Method to grow pure nanocrystalline diamond films at low temperatures and high deposition rates

Assignee: UChicago Argonne, LLC
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Quick Facts
Patent No.
US 7,556,982
App. No.
10/892,736
Granted
Jul 7, 2009
Kind
B2
Abstract

A method of depositing nanocrystalline diamond film on a substrate at a rate of not less than about 0.2 microns/hour at a substrate temperature less than about 500° C. The method includes seeding the substrate surface with nanocrystalline diamond powder to an areal density of not less than about 10 10 sites/cm 2 , and contacting the seeded substrate surface with a gas of about 99% by volume of an inert gas other than helium and about 1% by volume of methane or hydrogen and one or more of acetylene, fullerene and anthracene in the presence of a microwave induced plasma while maintaining the substrate temperature less than about 500° C. to deposit nanocrystalline diamond on the seeded substrate surface at a rate not less than about 0.2 microns/hour. Coatings of nanocrystalline diamond with average particle diameters of less than about 20 nanometers can be deposited with thermal budgets of 500° C.-4 hours or less onto a variety of substrates such as MEMS devices.

Claims (16)

1. A method of depositing nanocrystalline diamond film on a substrate at a rate of not less than about 0.2 microns/hour at a substrate temperature less than about 500° C., comprising seeding the substrate surface with nanocrystalline diamond powder to an areal density of not less than about 10 10 sites/cm 2 , and contacting the seeded substrate surface with a gas of about 99% by volume of an inert gas other than helium and about 1% by volume of methane or hydrogen and one or more of acetylene, fullerene and anthracene in the presence of a microwave induced plasma while maintaining the substrate temperature less than about 500° C. to deposit nanocrystalline diamond on the seeded substrate surface at a rate not less than about 0.2 microns/hour.

2. The method of claim 1 , wherein the substrate is a semiconductor.

3. The method of claim 1 , wherein the substrate is a complementary metal oxide semiconductor(CMOS).

4. The method of claim 1 , wherein the substrate is maintained at a temperature less than about 400° C. during deposition of the nanocrystalline diamond.

5. The method of claim 1 , wherein the gas contains methane.

6. The method of claim 1 , wherein the gas contains acetylene.

7. The method of claim 1 , wherein the gas contains a fullerene.

8. The method of claim 1 , wherein the gas contains anthracene.

9. The method of claim 1 , wherein the substrate is maintained at a temperature less than about 400°C. during deposition, the nanocrystalline diamond and the deposition rate is at least about 0.5 microns/hour.

10. The method of claim 9 , wherein the substrate temperature is controlled in part by cooling the substrate during deposition.

11. The method of claim 1 , wherein relative movement is provided between the substrate and the plasma during nanocrystalline diamond deposition.

12. The method of claim 1 , wherein a majority of the substrate is maintained out of contact with the plasma during nanocrystalline deposition to control the substrate temperature.

13. The method of claim 1 , wherein the gas is a mixture of argon and acetylene and hydrogen.

14. The method of claim 1 , wherein the substrate is seeded by immersing the substrate in a mixture of an organic solvent and nanometer sized diamond powder.

15. The method of claim 14 , wherein the mixture of solvent and powder is subjected to ultrasonic energy while the substrate is immersed therein for a time sufficient to provide 10 10 to 10 12 nucleation sites/cm 2 on the substrate.

16. The method of claim 15 , wherein the powder has an average particle size of less than about 30 nanometers and the nanocrystalline film has an average particle size of less than about 20 nanometers.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 28, 2006
From: UNIVERSITY OF CHICAGO, THE
To: U CHICAGO ARGONNE LLC
Reel/Frame 018385/0618 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2005
From: CARLISLE, JOHN A.; GRUEN, DIETER M.; AUCIELLO, ORLANDO; XIAO, XINGCHENG
To: THE UNIVERSITY OF CHICAGO
Reel/Frame 015575/0458 →
CONFIRMATORY LICENSE Recorded Nov 30, 2004
From: CHICAGO, UNIVERSITY OF THE
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 016048/0792 →
Continuity (2)
Provisional Application 6049315200 · Aug 7, 2003
Related Publication 20050031785A1 · Feb 10, 2005