Multi-function probe card
A multi-function probe card ( 40 ) includes a PCB ( 41 ), a plurality of probe needles ( 47 ), a counter ( 71 ) to acquire a “piece sequence parameter”, a signal-measuring device ( 72 ) via the probe needles ( 71 ) to acquire a current, and a voltage parameters etc. as well as a parametric processing system ( 74 ). The parametric processing system ( 74 ) includes an I/O unit ( 51 )/( 59 ), a processing unit ( 52 ), a time providing unit ( 55 ), a real time display unit ( 56 ), and a storing unit ( 57 ). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit ( 52 ) through the I/O unit ( 51 )/( 59 ). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card ( 40 ) through the real time display unit ( 56 ).
1. A multi-function probe card, comprising:
a PCB ( 41 );
a plurality of probe needles ( 47 ), an end of each of the probe needles ( 47 ) is connected to the PCB ( 41 );
a counter ( 71 ), for detecting the probe needles ( 47 ) to count the piece of the DUT bare die ( 46 ) and generate a “piece sequence parameter”;
a signal-measuring device ( 72 ), for measuring the current and voltage passing through the probe needles ( 47 ) to generate current and voltage parameters; and
a parameter processing system ( 74 ), further comprising an I/O unit ( 51 )/( 59 ), a processing unit ( 52 ), a time providing unit ( 55 ), a real time display unit ( 56 ), and a storing unit ( 57 );
whereby, the “piece sequence parameter” as well as the current and voltage parameters can be input into the processing unit ( 52 ) through the I/O unit ( 51 )/( 59 ); the processing unit ( 52 ) employs the “piece sequence parameter” as a datum for piece of DUT while the “time providing unit” ( 55 ) provides processing unit ( 52 ) with a time datum for each of the DUT bare dies ( 46 ); thereafter, the processing unit ( 52 ) sets up a parametric data structure in terms of the piece datum of the DUT bare die ( 46 ), current parameter, voltage parameter, and time datum for recording the service process and condition of the probe; subsequently, the processing unit ( 52 ) real timely calculate the conditions of the probe card ( 40 ) and display the service process and conditions of the probe card ( 40 ).
2. The multi-function probe card as claimed in claim 1 , wherein the counter ( 71 ) can measure the switching time slot interval of the current or voltage signals to generate the “piece sequence parameter” to fulfill the function of counting of the DUT bare die ( 46 ).
3. The multi-function probe card as claimed in claim 1 , wherein the processing unit ( 52 ) can be selected from the group consisting of a microprocessor, a program-executing memory, and a data register memory, to fulfill the function for program execution and processing data register.
4. The multi-function probe card as claimed in claim 1 , wherein the real time display unit ( 56 ) can be a visible device selected from the group consisting of an LCD (liquid crystal display), a seven-segment display, a CRT (cathode ray tube) display unit, a real time printing device, as well as a warning lamp & a buzzer of a warning device, to fulfill the functions of displaying, warning, and monitoring the condition of the probe card.
5. The multi-function probe card as claimed in claim 1 , wherein the storing unit ( 57 ) can be selected from the group consisting of a disk-recording device, a flash memory, and a portable memory card, to store the parametric data built up by the storing unit; the storing unit ( 57 ) can also be a portable memory card selected from the group consisting of a CF Card (compact flash card) and SM card (smart media card).
6. A multi-function probe card, comprising:
a PCB ( 41 );
a plurality of probe needles ( 47 ), an end of each of the probe needles ( 47 ) is connected to the PCB ( 41 );
a counter ( 71 ), for detecting the probe needles ( 47 ) to count the piece of the DUT bare die ( 46 ) and generate a “piece sequence parameter”; and
a parameter processing system ( 74 ), further comprising an I/O unit ( 51 )/( 59 ), a processing unit ( 52 ), a time providing unit ( 55 ), a real time display unit ( 56 ), and a storing unit ( 57 );
whereby, the “piece sequence parameter” as well as the current and voltage parameters can be input into the processing unit ( 52 ) through the I/O unit ( 51 )/( 59 ); the processing unit ( 52 ) employs the “piece sequence parameter” as a datum for piece of DUT while the “time providing unit” ( 55 ) provides processing unit ( 52 ) with a time datum for each of the DUT bare dies ( 46 ); thereafter, the processing unit ( 52 ) sets up a parametric data structure in terms of the piece datum of the DUT bare die ( 46 ), current parameter, voltage parameter, and time datum for recording the service process and condition of the probe; subsequently, the processing unit ( 52 ) real timely calculate the conditions of the probe card ( 40 ) and display the service process and conditions of the probe card ( 40 ).
7. The multi-function probe card as claimed in claim 6 , wherein the counter ( 71 ) can measure the switching time slot interval of the current or voltage signals to generate the “piece sequence parameter” to fulfill the function of counting of the DUT bare die ( 46 ).
8. The multi-function probe card as claimed in claim 6 , wherein the processing unit ( 52 ) can be selected from the group consisting of a microprocessor, a program-executing memory, and a data register memory, to fulfill the function for program execution and processing data register.
9. The multi-function probe card as claimed in claim 6 , wherein the real time display unit ( 56 ) can be a visible device selected from the group consisting of an LCD (liquid crystal display), a seven-segment display, a CRT (cathode ray tube) display unit, a real time printing device, as well as a warning lamp & a buzzer of a warning device, to fulfill the functions of displaying, warning, and monitoring the condition of the probe card.
10. The multi-function probe card as claimed in claim 6 , wherein the storing unit ( 57 ) can be selected from the group consisting of a disk-recording device, a flash memory, and a portable memory card, to store the parametric data built up by the storing unit; the storing unit ( 57 ) can also be a portable memory card selected from the group consisting of a CF Card (compact flash card) and SM card (smart media card).