IP Library › Granted Patent US 6,949,736
Granted Patent B2
US 6,949,736 · App. 10/934,329 · Granted Sep 27, 2005

Method of multi-turn time-of-flight mass analysis

Assignee: JEOL Ltd.
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Quick Facts
Patent No.
US 6,949,736
App. No.
10/934,329
Granted
Sep 27, 2005
Kind
B2
Abstract

A method of mass analysis using a multi-turn time-of-flight mass spectrometer starts with recording plural heterogeneous turn number spectra F 1 (t), F 2 (t), . . . , F q (t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure using a multi-correlation function for reconstructing a single turn number spectrum.

Claims (230)

1. A method of multi-turn time-of-flight mass analysis implemented using a multi-turn time-of-flight mass spectrometer for measuring and recording flight times, said mass spectrometer having a portion for producing ions in a pulsed manner, a multi-turn ion trajectory portion for causing the ions to travel in the same circulating trajectory many times, an ejection portion for ejecting the ions out of the trajectory portion, and an ion detection portion for detecting the ejected ions, the mass spectrometer being designed to eject the ions after the ions make many turns in the trajectory portion and to disperse the ions according to flight time, thus obtaining a mass spectrum, said method comprising the steps of:

recording plural heterogeneous turn number spectra F 1 (t), F 2 (t), . . . , F q (t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure; and

finding a definable multi-correlation function G(t) from the heterogeneous turn number spectra, whereby reconstructing a single turn number spectrum;

wherein said function G(t) is given by

G

⁡

(

T

)

=

⁢

∫

y

l

y

u

⁢

H

[

F

1

⁢

{

N

1

⁡

(

T

)

×

T

+

y

}

,

⁢

F

2

⁢

{

N

2

⁡

(

T

)

×

T

+

y

}

,

⋯

⁢

,

F

r

⁢

{

N

r

⁡

(

T

)

×

T

+

y

}

]

⁢

ⅆ

y

where N j (T)(j=1, 2, . . . , q) is an integer determined by the time T taken for ions to make one turn in the circulating trajectory, y u is an upper limit value of a deviation time from one turn time T, y l , is a lower limit value of the deviation time from one turn time T, and H is a function determined by the value of F j {N j (t)×T+y} (j=1, 2, . . . , r).

2. A method of multi-turn time-of-flight mass analysis implemented using a multi-turn time-of-flight mass spectrometer for measuring and recording flight times, said mass spectrometer having a portion for producing ions in a pulsed manner, a multi-turn ion trajectory portion for causing the ions to travel in the same circulating trajectory many times, an ejection portion for ejecting the ions out of the trajectory portion, and an ion detection portion for detecting the ejected ions, the mass spectrometer being designed to eject the ions after the ions make many turns in the trajectory portion and to disperse the ions according to flight time, thus obtaining a mass spectrum; said method comprising the steps of:

recording plural heterogeneous turn number spectra F 1 (t), F 2 (t), . . . , F q (t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure; and

finding a definable multi-correlation function G(t) from the heterogeneous turn number spectra, whereby reconstructing a single turn number spectrum;

wherein said function G(t) is given by

G

⁡

(

T

)

=

⁢

∫

y

l

y

u

⁢

H

[

F

1

⁢

{

N

1

⁡

(

T

)

×

T

+

y

}

,

⁢

F

2

⁢

{

N

2

⁡

(

T

)

×

T

+

y

}

,

⋯

⁢

,

F

r

⁢

{

N

r

⁡

(

T

)

×

T

+

y

}

]

⁢

ⅆ

y

where N j (T) (j=1, 2, . . . , q) is an integer determined by the time T taken for ions to make one turn in the circulating trajectory, y u is an upper limit value of a deviation time from one turn time T, y l is a lower limit value of the deviation time from one turn time T, and H is a function determined by the value of F j {N j (t)×T+y} (j=1, 2, . . . , r), and wherein a range bounded by the limit values y u and y l is wider than a range in which ions of one turn time T are forecast to be detected.

3. A method of multi-turn time-of-flight mass analysis implemented using a multi-turn time-of-flight mass spectrometer for measuring and recording flight times, said mass spectrometer having a portion for producing ions in a pulsed manner, a multi-turn ion trajectory portion for causing the ions to travel in the same circulating trajectory many times, an ejection portion for ejecting the ions out of the trajectory portion, and an ion detection portion for detecting the ejected ions, the mass spectrometer being designed to eject the ions after the ions make many turns in the trajectory portion and to disperse the ions according to flight time, thus obtaining a mass spectrum; said method comprising the steps of:

recording plural heterogeneous turn number spectra F 1 (t), F 2 (t), . . . , F q (t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure; and

finding a definable multi-correlation function G(t) from the heterogeneous turn number spectra, whereby reconstructing a single turn number spectrum;

wherein said function G(t) is given by

G

⁡

(

T

)

=

⁢

∫

y

l

y

u

⁢

H

[

F

1

⁢

{

N

1

⁡

(

T

)

×

T

+

y

}

,

⁢

F

2

⁢

{

N

2

⁡

(

T

)

×

T

+

y

}

,

⋯

⁢

,

F

r

⁢

{

N

r

⁡

(

T

)

×

T

+

y

}

]

⁢

ⅆ

y

where N j (T) (j=1, 2, . . . , q) is an integer determined by the time T taken for ions to make one turn in the circulating trajectory, y u is an upper limit value of a deviation time from one turn time T, y l is a lower limit value of the deviation time from one turn time T, and H is a function determined by the value of F j {N j (t)×T+y} (j=1, 2, . . . , r), and wherein the limit values y u and y l are functions of one turn time T.

4. A method of multi-turn time-of-flight mass analysis as set forth in any one of claims 1 to 3 , wherein if it is assumed that ions of one turn time T are contained in a heterogeneous turn number spectrum F j (t), said integer N j (T) is a forecast number of turns of the ions.

5. A method of multi-turn time-of-flight mass analysis as set forth in any one of claims 1 to 3 , wherein said function H provides a calculation for taking the arithmetic mean of F j {N j (t)×T+y} (j=1, 2, . . . , r).

6. A method of multi-turn time-of-flight mass analysis as set forth in any one of claims 1 to 3 , wherein said function H provides a calculation for taking a minimum value of F j {N j (t)×T+y} (j=1, 2, . . . , r).

7. A method of multi-turn time-of-flight mass analysis as set forth in any one of claims 1 to 3 , wherein said function H provides a calculation for taking the geometric mean of F j {N j (t)×T+y} (j=1, 2, . . . , r).

8. A method of multi-turn time-of-flight mass analysis as set forth in any one of claims 1 to 3 , wherein said function H provides a calculation for taking the harmonic mean of F j {N j (t)×T+y} (j=1, 2, . . . , r).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2005
From: ISHIHARA, MORIO
To: JEOL LTD.
Reel/Frame 016126/0784 →
Priority Claims (1)
JP 2003-311317 · Sep 3, 2003 · national
Continuity (1)
Related Publication 20050092913A1 · May 5, 2005