Two-wavelength semiconductor laser device and method of manufacturing the same

1. A two-wavelength semiconductor laser device, comprising:

a first conductive material substrate having an upper surface with first and second regions separated from each other thereon;

a first semiconductor laser diode comprising a first conductive material first clad layer, a first active layer and a second conductive material first clad layer sequentially laminated on the first region of the first conductive material substrate;

a non-active layer formed on the second region of the first conductive material substrate and comprising the same layers as those of the first conductive material first clad layer, the first active layer and the first conductive material second clad layer of the first semiconductor laser diode;

a second semiconductor laser diode comprising a first conductive material second clad layer, a second active layer and a second conductive material second clad layer sequentially laminated on the non-active layer; and

a lateral conductive region formed at least between the first and second semiconductor laser diodes such that the first conductive material second clad layer and the first conductive material substrate can be electrically connected to each other.

2. The device as set forth in claim 1 , wherein the first semiconductor laser diode comprises:

the second conductive material first clad layer having a ridge structure;

a first conductive material first current shield layer formed around the ridge structure; and

a first conductive material first contact layer formed on the first conductive material first current shield layer and the second conductive material first clad layer.

3. The device as set forth in claim 1 , wherein the second semiconductor laser diode comprises:

the second conductive material first and second clad layers having a ridge structure, respectively;

a first conductive material second current shield layer formed around the ridge structures; and

a first conductive material second contact layer formed on the first conductive material second current shield layer and the second conductive material second clad layer.

4. The device as set forth in claim 3 , wherein the first and second current shield layers and the lateral conductive region consist of a first conductive material.

5. The device as set forth in claim 4 , wherein the first and second contact layers consist of a second conductive material and further comprise a second conductive material layer consisting of the same material as that of the first and second contact layers on the lateral conductive region.

6. The device as set forth in claim 1 , further comprising:

a first insulative trench formed between the first semiconductor laser diode and the lateral conductive region while extending from an upper portion of the first semiconductor laser diode to at least a portion of the first conductive material first clad layer.

7. The device as set forth in claim 1 , further comprising: a second insulative trench formed between the second semiconductor laser diode and the lateral conductive region while extending from an upper portion of the second semiconductor laser diode to at least a portion of the first conductive material second clad layer.

8. The device as set forth in claim 1 , wherein the second conductive material first clad layer and the first conductive material second clad layer has a total thickness of about 2 μm or less.

9. The device as set forth in claim 1 , wherein the first conductive material first clad layer of the first semiconductor laser diode and the first conductive clad layer of the non-active region are formed as a single layer.

10. The device as set forth in claim 1 , wherein the lateral conductive region is formed at either side of the second semiconductor laser diode.