IP Library Granted Patent US 7,025,663
Granted Patent B2
US 7,025,663 · App. 10/947,332 · Granted Apr 11, 2006

Chemical mechanical polishing apparatus having conditioning cleaning device

Assignee: Samsung Electronics Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,025,663
App. No.
10/947,332
Granted
Apr 11, 2006
Kind
B2
Abstract

A chemical mechanical polishing apparatus having a conditioning cleaning device capable of efficiently cleaning a diamond pad is disclosed. The conditioner cleaning device of the present invention is capable of increasing cleaning efficiency by uniformly spraying a cleaning solution on upper and side faces of a diamond disk. When the diamond disk is efficiently cleaned, the process reliability of a wafer is increased.

Claims (38)

1. A pad conditioner cleaning device, comprising:

a cup housing member having a recess that forms a cleaning solution storage section, a circular region of the cleaning solution storage section being dedicated to accommodate a disk of a pad conditioner of a chemical mechanical polishing apparatus;

a first cleaning solution supply unit mounted to the cup housing and oriented to supply cleaning solution into the cleaning solution storage section; and

a second cleaning solution supply unit including a horizontal spray pipe having an arcuate section whose radius of curvature is greater than the radius of the circular region of the cleaning solution storage section, the spray pipe being disposed above the circular region as extending around at least a portion of the circular region, and the arcuate section of the spray pipe having a plurality of spray holes extending radially through a lower portion thereof, the spray holes being arrayed in both the circumferential and longitudinal directions of the spray pipe, wherein the spray holes are oriented to direct cleaning solution onto upper and side surfaces of the disk when the disk is set in the circular region of the cleaning section and cleaning solution is supplied through the spray pipe.

2. The pad conditioner cleaning device of claim 1 , wherein said second cleaning solution supply unit includes a main supply pipe extending vertically from the cup housing member, the arcuate spray pipe being connected to the main supply pipe and having an inner diameter smaller than that of the main supply pipe.

3. The pad conditioner cleaning device of claim 1 , and further comprising a support disposed on an upper portion of the cup housing member and supporting the spray pipe.

4. The pad conditioner cleaning device of claim 3 , wherein the support comprises a U-shaped prop through which the spray pipe extends.

5. The pad conditioner cleaning device of claim 1 , wherein the spray pipe is a U-shaped pipe.

6. The pad conditioner cleaning device of claim 1 , and further comprising a plate having holes therethrough disposed at the bottom of the cleaning solution storage section to generate air bubbles in the cleaning solution supplied into the cleaning solution storage section.

7. A chemical mechanical polishing apparatus, comprising:

a table;

a polishing pad disposed on the table and supported so as to be rotatable relative to the table;

a polishing head disposed above the table and operative to hold a substrate to be polished against the polishing pad;

a pad conditioner including an arm, and an abrasive disk that conditions the polishing pad, the abrasive disk being mounted to an end of the arm; and

a pad conditioner cleaning device including

a cup housing member mounted to the table, the cup housing member having a recess that forms a cleaning solution storage section, a circular region of the cleaning solution storage section being dedicated to accommodate the disk of the pad conditioner,

a first cleaning solution supply unit mounted to the cup housing and oriented to supply cleaning solution into the cleaning solution storage section, and

a second cleaning solution supply unit including an spray pipe having an arcuate section whose radius of curvature is greater than the radius of the circular region of the cleaning solution storage section, the spray pipe being disposed above the circular region as extending around at least a portion of the circular region, and the arcuate section of the spray pipe having a plurality of spray holes extending radially though a lower portion thereof, the spray holes being arrayed in both the circumferential and longitudinal directions of the spray pipe, wherein the spray holes are oriented to direct cleaning solution onto upper and side surfaces of the disk of the pad conditioner when the disk is set in the circular region of the cleaning section and cleaning solution is supplied through the spray pipe.

8. The chemical mechanical polishing apparatus of claim 7 , wherein the second cleaning solution supply unit of the pad conditioner cleaning device includes a main supply pipe extending vertically from the cup housing member, the arcuate spray pipe being connected to the main supply pipe and having an inner diameter smaller than that of the main supply pipe.

9. The chemical mechanical polishing apparatus of claim 7 , wherein the pad conditioner cleaning device further includes a support disposed on an upper portion of the cup housing member and supporting the spray pipe.

10. The chemical mechanical polishing apparatus of claim 9 , wherein the support comprises a U-shaped prop through which the spray pipe extends.

11. The chemical mechanical polishing apparatus of claim 7 , wherein the spray pipe of the pad conditioner cleaning device is a U-shaped pipe.

12. The chemical mechanical polishing apparatus of claim 7 , wherein the pad conditioner cleaning device further includes a plate having holes therethrough disposed at the bottom of the cleaning solution storage section to generate air bubbles in the cleaning solution supplied into the cleaning solution storage section.

13. A chemical mechanical polishing apparatus, comprising:

a table;

a polishing pad disposed on the table and supported so as to be rotatable relative to the table;

a polishing head disposed above the table and operative to hold a substrate to be polished against the polishing pad;

a pad conditioner mounted to the table at the side of the polishing pad, the pad conditioner including an arm, and an abrasive disk mounted to the arm, the arm being supported to move the disk between a conditioning position at which the disk is disposed over the polishing pad and a cleaning position at which the disk is disposed to the side of the polishing pad; and

a pad conditioner cleaning device including

a cup housing member mounted to the table, the cup housing member having a recess that forms a cleaning solution storage section at a location corresponding the cleaning position,

a first cleaning solution supply unit mounted to the cup housing and oriented to supply cleaning solution into the cleaning solution storage section, and

a second cleaning solution supply unit including a spray pipe that is U-shaped so as to have an opening at one side thereof, the width of the opening being greater than the diameter of the disk of the pad conditioner, the spray pipe being disposed above the cleaning solution storage section with the opening at said one side facing in the direction of movement of the disk such that the disk is positioned inwardly of the U-shaped pipe when the disk is moved to the cleaning position, and the U-shaped spray pipe having a plurality of nozzles spaced along the length thereof and oriented to direct cleaning solution onto upper and side surfaces of the disk of the pad conditioner when the disk is set at the cleaning position and cleaning solution is supplied though the U-shaped spray pipe.

14. The chemical mechanical polishing apparatus of claim 13 , wherein the U-shaped spray pipe of the pad conditioner cleaning device has a plurality of spray holes extending radially though a lower portion thereof, respective groups of the spray holes constituting the nozzles.

15. The chemical mechanical polishing apparatus of claim 14 , wherein the spray holes are arrayed in both the circumferential and longitudinal directions of the U-shaped spray pipe.

16. The chemical mechanical polishing apparatus of claim 13 , wherein the second cleaning solution supply unit of the pad conditioner cleaning device includes a main supply pipe extending vertically from the cup housing member, the U-shaped spray pipe being connected to the main supply pipe and having an inner diameter smaller than that of the main supply pipe.

17. The chemical mechanical polishing apparatus of claim 13 , wherein the pad conditioner cleaning device further includes a support disposed on an upper portion of the cup housing member and supporting the U-shaped spray pipe.

18. The chemical mechanical polishing apparatus of claim 17 , wherein the support comprises a U-shaped prop through which the spray pipe extends.

19. The chemical mechanical polishing apparatus of claim 13 , wherein the pad conditioner spray device further includes a plate having holes therethrough disposed at the bottom of the cleaning solution storage section to generate air bubbles in the cleaning solution supplied into the cleaning solution storage section.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2004
From: KIM, TAE-BONG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 015826/0376 →
Priority Claims (1)
KR 10-2003-0066518 · Sep 25, 2003 · national
Continuity (1)
Related Publication 20050070215A1 · Mar 31, 2005