Method and apparatus for detecting materials
View Patent ↗An apparatus for detecting materials includes a database for storing detecting spectra of detecting materials, and a tera-hertz wave applying unit for applying tera-hertz waves having a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency, to a predetermined position of an inspecting object. The apparatus includes an output wave receiving unit for receiving an output wave that is the tera-hertz wave having been applied to the inspecting object, and a determining unit for determining whether or not the output wave includes the detecting spectrum.
1. A method for detecting materials, comprising the steps of:
applying tera-hertz waves of a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency to a predetermined position of an inspecting object by using a tera-hertz wave applying means; and
detecting the presence or absence of a detecting material by determining whether or not an output wave includes a detecting spectrum of the detecting material, wherein the output wave is the tera-hertz wave that has been applied to the inspecting object,
wherein the tera-hertz wave applying means includes white light applying means for applying white light of a plurality of different frequencies to the inspecting object, and wherein a spectrum obtaining means for performing Fourier transformation on the output wave to obtain a spectrum formed by the respective different frequencies is used to receive the output wave and to determine whether or not the output wave includes the detecting spectrum of the detecting material.
2. A method for detecting materials according to claim 1 , further comprising the steps of:
setting as the detecting spectrum a detecting target spectrum of the detecting target material and an adjunct spectrum of an adjunct material; and
determining whether or not the output wave includes the adjunct spectrum along with the detecting target spectrum.
3. An apparatus for detecting materials, comprising:
a database for storing detecting spectra of detecting materials;
tera-hertz wave applying means for applying tera-hertz waves having a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency, to a predetermined position of an inspecting object;
output wave receiving means for receiving an output wave that is the tera-hertz wave having been applied to the inspecting object; and
determining means for determining whether or not the output wave includes the detecting spectrum,
wherein the tera-hertz wave applying means includes white light applying means for applying white light of a plurality of different frequencies to the inspecting object,
and the apparatus further includes spectrum obtaining means for performing Fourier transformation on the output wave to obtain a spectrum formed by the respective different frequencies.
4. An apparatus for detecting materials according to claim 3 , wherein the detecting spectra include a detecting target spectrum of a detecting target material and an adjunct spectrum of an adjunct material.
5. A method for detecting materials according to claim 1 , further comprising the step of:
displaying a detected result when the output wave includes the detecting spectrum.