Method and system for multisite RF transceiver testing
According to one embodiment of the invention, a system for testing electronic devices includes a first RF source operable to output a first signal, a second RF source operable to output a second signal, a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal, one or more down converters operable to receive respective output signals from respective electronic devices and create respective down converted signals, and a set of switches operable to switch the second RF source to a local oscillator function that couples to the one or more down converters for inputting respective reference signals into the one or more down converters.
1. A system for testing electronic devices, comprising:
a first RF source operable to output a first signal;
a second RF source operable to output a second signal;
a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal;
one or more down converters operable to receive respective output signals from respective electronic devices and create respective down converted signals; and
a set of switches operable to switch the second RF source to a local oscillator function that couples to the one or more down converters for inputting respective reference signals into the one or more down converters.
2. The system of claim 1 , further comprising a splitter coupled to the combiner and operable to split the third signal into two or more input signals for respective electronic devices.
3. The system of claim 1 , further comprising a load board configured to couple the respective electronic devices thereto.
4. The system of claim 3 , wherein the electronic devices are each selected from the group consisting of RF receivers, RF transmitters, RF transceivers, low noise amplifiers, and voltage controlled oscillators.
5. The system of claim 3 , wherein the electronic devices each operate in a frequency band between approximately 800 MHz and 1.9 GHz.
6. The system of claim 1 , wherein the first RF source comprises modulation capability and the second RF source comprises continuous wave capability.
7. The system of claim 1 , further comprising an oscillator operable to phase lock the first and second RF sources.
8. The system of claim 7 , wherein the oscillator is a 260 MHz crystal oscillator.
9. The system of claim 7 , further comprising: a first divider coupled between the oscillator and the first and second RF sources;
a second divider coupled between the oscillator and the one or more digitizers; and
wherein the first and second dividers have different divide ratios.
10. The system of claim 9 , further comprising a phase locked loop coupled to the first divider and selectively coupled to the second divider.
11. A system for testing electronic devices, comprising:
a tester configured to couple to a load board for testing one or more electronic components, the tester comprising:
no more than two RF source, wherein a first one of the RF sources is operable to output a first signal and a second one of the RF sources is operable to output a second output signal;
a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal;
a splitter coupled to the combiner and operable to split the third signal into two or more input signals for respective electronic devices;
one or more digitizers operable to receive output signals from respective electronic devices;
an oscillator operable to phase lock the first and second RF sources and the one or more digitizers; and
a set of switches operable to switch the second RF source to a local oscillator function.
12. The system of claim 11 , wherein the tester further comprises one or of claim 11 , wherein the first RF source comprises modulation capability and the second RF source comprises continuous wave capability.
13. The system of claim 11 , wherein the first RF source comprises modulation capability and the second RF source comprises continuous wave capability.
14. A system for testing electronic devices, comprising:
a first RF source operable to output a first signal;
a second RF source operable to output a second signal; a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal;
a splitter coupled to the combiner and operable to split the third signal into two or more signals; and
a plurality of programmable RF attenuators coupled to the splitter for creating input signals for respective electronic devices, each programmable RF attenuator operable to calibrate a respective input signal into a respective electronic device to correct for the signal loss difference between the input signals for the respective electronic devices.
15. The system of claim 14 , further comprising a load board configured to couple the respective electronic devices thereto.
16. The system of claim 15 , wherein the electronic devices are each selected from the group consisting of RF receivers, RF transmitters, RF transceivers, low noise amplifiers, and voltage controlled oscillators.
17. The system of claim 15 , wherein the electronic devices each operate in a frequency band between approximately 800 MHz and 1.9 GHz.
18. The system of claim 14 , further comprising an oscillator operable to phase lock the first and second RF sources.
19. The system of claim 18 , further comprising a divider coupled between the oscillator and the first and second RF sources.
20. The system of claim 19 , further comprising a phase locked loop coupled to the divider.