IP Library Granted Patent US 7,408,428
Granted Patent B2
US 7,408,428 · App. 10/977,398 · Granted Aug 5, 2008

Temperature-compensated film bulk acoustic resonator (FBAR) devices

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Quick Facts
Patent No.
US 7,408,428
App. No.
10/977,398
Granted
Aug 5, 2008
Kind
B2
Abstract

The temperature-compensated film bulk acoustic resonator (FBAR) device comprises an FBAR stack. The FBAR stack comprises an FBAR and a temperature-compensating element. The FBAR is characterized by a resonant frequency having a temperature coefficient, and comprises opposed planar electrodes and a piezoelectric element between the electrodes. The piezoelectric element has a temperature coefficient on which the temperature coefficient of the resonant frequency depends at least in part. The temperature-compensating element has a temperature coefficient opposite in sign to the temperature coefficient of the piezoelectric element.

Claims (86)

1. A temperature-compensated film bulk acoustic resonator (FBAR) device, comprising:

an FBAR stack, comprising:

an FBAR characterized by a resonant frequency having a temperature coefficient, the FBAR comprising opposed planar electrodes and a piezoelectric element between the electrodes, the piezoelectric element having a temperature coefficient on which the temperature coefficient of the resonant frequency depends at least in part, and

a temperature-compensating element having a temperature coefficient opposite in sign to the temperature coefficient of the piezoelectric element, and the temperature-compensating element comprises one of: a niobium-molybdenum (Nb—Mo): a cobalt—palladium (Co—Pd) alloy: or a niobium-molybdenum (Nb—Mo) alloy.

2. The FBAR device of claim 1 , in which the temperature-compensating element comprises a temperature-compensating layer juxtaposed with one of the electrodes.

3. The FBAR device of claim 2 , in which the temperature-compensating element additionally comprises an additional temperature-compensating layer juxtaposed with the other of the electrodes.

4. The FBAR device of claim 2 , in which the temperature-compensating layer is located between the one of the electrodes and the piezoelectric element.

5. The FBAR device of claim 2 , in which:

the FBAR is a lower FBAR; and

the FBAR device additionally comprises:

an upper FBAR stacked on the lower FBAR, the upper FBAR comprising opposed planar electrodes and a piezoelectric element between the electrodes, and

an acoustic decoupler between the FBARs.

6. The FBAR device of claim 5 , in which the temperature-compensating element comprises a temperature-compensating layer juxtaposed with one of the electrodes of each of the FBARs.

7. The FBAR device of claim 6 , in which in each of the FBARs, the temperature-compensating layer is between the one of the electrodes and the piezoelectric element thereof.

8. The FBAR device of claim 6 , in which in each of the FBARs, the one of the electrodes is juxtaposed with the acoustic decoupler.

9. The FBAR device of claim 5 , in which in each of the FBARs, one of the electrodes is juxtaposed with the acoustic decoupler.

10. The FBAR device of claim 5 , in which:

the first FBAR, the second FBAR and the acoustic decoupler constitute a first decoupled stacked bulk acoustic resonator (DSBAR);

the FBAR stack additionally comprises a second DSBAR, comprising a lower FBAR, an upper FBAR stacked on the lower FBAR, and an acoustic decoupler between the FBARs; and

the FBAR device additionally comprises:

a first electrical circuit interconnecting the lower FBARs, and

a second electrical circuit interconnecting the upper FBARs.

11. The FBAR device of claim 10 , in which the temperature-compensating element comprises a temperature-compensating layer juxtaposed with one of the electrodes of each of the FBARs.

12. The FBAR device of claim 11 , in which in each of the FBARs, the temperature-compensating layer is between the one of the electrodes and the piezoelectric element thereof.

13. The FBAR device of claim 11 , in which in each of the FBARs, the one of the electrodes is juxtaposed with the acoustic decoupler.

14. The FBAR device of claim 10 , in which in each of the FBARs, one of the electrodes is juxtaposed with the acoustic decoupler.

15. The FBAR device of claim 2 , in which:

the FBAR is a first FBAR;

the FBAR stack additionally comprises one or more additional FBARs; and

the FBARs are interconnected as a ladder filter.

16. The FBAR device of claim 15 , in which the temperature-compensating element comprises a temperature-compensating layer juxtaposed with one of the electrodes of each of the FBARs.

17. The FBAR device of claim 1 , in which the temperature-compensating element comprises a temperature-compensating layer embedded in the piezoelectric element.

18. The FBAR device of claim 17 , in which:

the FBAR is a lower FBAR; and

the FBAR device additionally comprises:

an upper FBAR stacked on the lower FBAR, the upper FBAR comprising opposed planar electrodes and a piezoelectric element between the electrodes, and

an acoustic decoupler between the FBARs.

19. The FBAR device of claim 18 , in which the temperature-compensating element comprises a temperature-compensating layer embedded in the piezoelectric element of each of the FBARs.

20. The FBAR device of claim 18 , in which;

the lower FBAR, the upper FBAR and the acoustic decoupler constitute a first decoupled stacked bulk acoustic resonator (DSBAR);

the FBAR stack additionally comprises a second DSBAR, comprising a lower FBAR, an upper FBAR, an acoustic decoupler between the FBARs; and

the FBAR device additionally comprises:

a first electrical circuit interconnecting the lower FBARs, and

a second electrical circuit interconnecting the upper FBARs.

21. The FBAR device of claim 20 in which the temperature-compensating element comprises a temperature-compensating layer embedded in the piezoelectric element of each of the FBARs.

22. The FBAR device of claim 17 , in which:

the FBAR is a first FBAR;

the FBAR stack additionally comprises one or more additional FBARs; and

the FBARs are interconnected as a ladder filter.

23. The FBAR device of claim 22 , in which the temperature-compensating element comprises a temperature-compensating layer embedded in the piezoelectric element of each of the FBARs.

24. The FBAR device of claim 1 , in which the temperature-compensating element comprises one of the electrodes.

25. The FBAR device of claim 24 , in which:

the FBAR is a lower FBAR;

the FBAR device additionally comprises:

an upper FBAR stacked on the lower FBAR, the upper FBAR comprising a piezoelectric element, and

an acoustic decoupler between the FBARs; and

the temperature-compensating element additionally comprises opposed temperature-compensating layers between which the piezoelectric element of the upper FBAR is located.

26. The FBAR device of claim 25 , in which the temperature-compensating element comprises one of the electrodes of each of the FBARs.

27. The FBAR device of claim 25 , in which:

the lower FBAR, the upper FBAR and the acoustic decoupler constitute a first decoupled stacked bulk acoustic resonator (DSBAR);

the FBAR stack additionally comprises a second DSBAR, comprising a lower FBAR, an upper FBAR, an acoustic decoupler between the FBARs; and

the FBAR device additionally comprises:

a first electrical circuit interconnecting the lower FBARs, and

a second electrical circuit interconnecting the upper FBARs.

28. The FBAR device claim 27 , in which the temperature-compensating element comprises one of the electrodes of each of the FBARs.

29. The FBAR device of claim 24 , in which:

the FBAR is a first FBAR;

the FBAR stack additionally comprises one or more additional FBARs; and

the FBARs are interconnected as a ladder filter.

30. The FBAR device of claim 29 , in which the temperature-compensating element comprises one of the electrodes of each of the FBARs.

31. The FBAR device of claim 1 , in which the cobalt-palladium alloy has a palladium fraction in the range from about 93% to about 95%.

32. The FBAR device of claim 1 , in which the niobium-molybdenum alloy has a molybdenum fraction in the range from about 17% to about 51%.

33. The FBAR device of claim 1 , in which the niobium-molybdenum alloy has a molybdenum fraction in the range from about 32% to about 36%.

34. The FBAR device of claim 1 , in which the cobalt-palladium alloy has a palladium fraction in the range from about 92% to about 96%.

35. An acoustic device, comprising an acoustic propagation path having a propagation time-related property, the propagation time-related property having a temperature coefficient, the acoustic propagation path comprising:

an acoustic propagation element having a temperature coefficient on which the propagation time-related property of the acoustic propagation path depends at least in part; and

a temperature-compensating element having a temperature coefficient opposite in sign to the temperature coefficient of the acoustic propagation element, and the temperature-compensating element comprises one of: a niobium-molybdenum (Nb—Mo);

a cobalt-palladium (Co—Pd) alloy; or a niobium-molybdenum (Nb—Mo) alloy.

36. A temperature-compensated film bulk acoustic resonator (FBAR) device, comprising:

an FBAR stack, comprising:

an FBAR characterized by a resonant frequency having a temperature coefficient, the FBAR comprising opposed planar electrodes and a piezoelectric element between the electrodes, the piezoelectric element having a temperature coefficient on which the temperature coefficient of the resonant frequency depends at least in part, and a temperature-compensating element having a temperature coefficient opposite in sign to the temperature coefficient of the piezoelectric element, wherein the temperature-compensating element comprises a ferroelectric material, which comprises one of:

lead nickel niobate (Pb(Ni x Nb i-x )O 3 in which the nickel fraction x is about one third; nepheline (KAlSiO 4 )(NaAlSiO 4 ) 3 ; or zirconium tungstate (ZrW 2 O 8 ).

37. An acoustic device, comprising an acoustic propagation path having a propagation time-related property, the propagation time-related property having a temperature coefficient, the acoustic propagation path comprising:

an acoustic propagation element having a temperature coefficient on which the propagation time-related property of the acoustic propagation path depends at least in part; and

a temperature-compensating element having a temperature coefficient opposite in sign to the temperature coefficient of the acoustic propagation element, wherein the temperature compensating element comprises a ferroelectric material, which comprises one of:

lead nickel niobate (Pb(Ni x Nb 1-x )O 3 in which the nickel fraction x is about one third; nepheline (KAlSiO 4 )(NaAlSiO 4 ) 3 ; or zirconium tungstate (ZrW 2 O 8 ).

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE ERROR IN RECORDING THE MERGER PREVIOUSLY RECORDED AT REEL: 047357 FRAME: 0302. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 22, 2019
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CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED ON REEL 047195 FRAME 0658. ASSIGNOR(S) HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09/05/2018. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
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MERGER Recorded Oct 4, 2018
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To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
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PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
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PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
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