IP Library Granted Patent US 7,053,423
Granted Patent B1
US 7,053,423 · App. 10/982,443 · Granted May 30, 2006

Thyristor having a first emitter with relatively lightly doped portion to the base

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Quick Facts
Patent No.
US 7,053,423
App. No.
10/982,443
Granted
May 30, 2006
Kind
B1
Abstract

A thyristor-based semiconductor device exhibits a relatively increased base-emitter capacitance. According to an example embodiment of the present invention, a base region and an adjacent emitter region of a thyristor are doped such that the emitter region has a lightly-doped portion having a light dopant concentration, relative to the base region. In one embodiment, the thyristor is implemented in a memory circuit, wherein the emitter region is coupled to a reference voltage line and a control port is arranged for capacitively coupling to the thyristor for controlling current flow therein. In another implementation, the thyristor is formed on a buried insulator layer of a silicon-on-insulator (SOI) structure. With these approaches, current flow in the thyristor, e.g., for data storage therein, can be tightly controlled.

Claims (9)

1. A semiconductor device comprising:

a thyristor body coupled in series with a pass transistor through a common region, the thyristor having a first region coupled via a junction to a second region that has a lightly-doped portion extending along and adjacent to the junction, the lightly-doped portion having a significantly lighter dopant concentration, relative to the dopant concentration of the first region, the thyristor body further having a third region coupled via another junction to the first region;

a word line disposed above at least a portion of the second region; and

a control port disposed above at least a portion of the third region and configured and arranged for controlling current flow in at least the third region of the thyristor body.

2. The device of claim 1 , wherein the thyristor body includes a fourth region, the third and the fourth regions being contiguous and of opposite polarity.

3. The device of claim 2 , wherein the second region has a heavily-doped portion that is coupled to a reference voltage line.

4. The device of claim 1 , wherein the thyristor body is disposed on a buried insulator layer.

5. The device of claim 1 , further comprising a pass transistor electrically coupled to the thyristor body.

6. The device of claim 5 , wherein the thyristor body and the pass transistor are disposed on a buried insulator layer and connected to each other by said common region, the common region being the fourth region of the thyristor, which is an active element of the pass transistor.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2013
From: T-RAM SEMICONDUCTOR, INC.
To: T-RAM (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
Reel/Frame 031694/0018 →
PURCHASE OPTION AGREEMENT Recorded Jun 3, 2010
From: T-RAM SEMICONDUCTOR, INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 024474/0979 →
RELEASE Recorded May 18, 2010
From: SILICON VALLEY BANK
To: T RAM SEMICONDUCTOR INCORPORATED
Reel/Frame 024492/0651 →
SECURITY AGREEMENT Recorded Aug 7, 2008
From: T-RAM SEMICONDUCTOR INCORPORATED
To: SILICON VALLEY BANK
Reel/Frame 021354/0186 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2004
From: NEMATI, FARID; ROBINS, SCOTT; HORCH, ANDREW
To: T-RAM, INC.
Reel/Frame 015969/0769 →