IP Library Granted Patent US 7,226,856
Granted Patent B1
US 7,226,856 · App. 10/990,273 · Granted Jun 5, 2007

Nano-electrode-array for integrated circuit interconnects

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Quick Facts
Patent No.
US 7,226,856
App. No.
10/990,273
Granted
Jun 5, 2007
Kind
B1
Abstract

An integrated circuit and a method of manufacturing an integrated circuit is provided including providing an integrated circuit having a trench and via provided in a dielectric layer. A nano-electrode-array is formed over the dielectric layer in the trench and via, and a conductor is deposited over the nano-electrode-array. The conductor and the nano-electrode-array are coplanar with a surface of the dielectric layer.

Claims (31)

1. A method of manufacturing an integrated circuit comprising:

providing an integrated circuit having a trench and via provided in a dielectric layer;

forming a self-assembly monolayer on the dielectric layer in the trench and via;

forming a nano-electrode-array over the dielectric layer in the trench and via;

forming the nano-electrode-array at least partially embedded in the self-assembly monolayer

depositing a conductor over the nano-electrode-array; and

planarizing the conductor and the nano-electrode-array to be coplanar with a surface of the dielectric layer.

2. The method of manufacturing an integrated circuit as claimed in claim 1 further comprising:

depositing a barrier layer on the dielectric layer in the trench and via; and

forming the nano-electrode-array on the barrier layer.

3. The method of manufacturing an integrated circuit as claimed in claim 1 further comprising:

removing the self-assembly monolayer; and

forming the nano-electrode-array on the dielectric layer from which the self-assembly monolayer has been removed.

4. The method of manufacturing an integrated circuit as claimed in claim 1 further comprising:

depositing a metallization on the nano-electrode array.

5. A method of manufacturing an integrated circuit comprising:

providing an integrated circuit having a trench and via provided in a dielectric layer;

forming a self-assembly monolayer having a radical or tether connection to the dielectric layer in the trench and via, the dielectric layer being of a porous low dielectric constant material;

forming a nano-electrode-array for a double layer diffusion by activation or electroless deposition over the dielectric layer in the trench and via;

forming the nano-electrode-array at least partially embedded in the self-assembly monolayer;

depositing a conductor by electroless deposition or electroplating over the nano-electrode-array; and

planarizing the conductor and the nano-electrode-array by electrochemical, chemical, or chemical-mechanical polishing to be coplanar with a surface of the dielectric layer.

6. The method of manufacturing an integrated circuit as claimed in claim 5 further comprising:

depositing a barrier layer on the dielectric layer in the trench and via; and

forming the nano-electrode-array on the barrier layer; and

depositing the conductor on the nano-electrode-array.

7. The method of manufacturing an integrated circuit as claimed in claim 5 further comprising:

removing at least one of the radical, the tether connection, the self-assembly monolayer, or the combination thereof from the dielectric layer; and

forming the nano-electrode-array on the dielectric layer.

8. The method of manufacturing an integrated circuit as claimed in claim 5 further comprising:

depositing a metallization containing a barrier material on the nano-electrode array by electroless deposition.

Assignments (2)
SECURITY AGREEMENT Recorded Oct 2, 2006
From: BLUE 29, LLC
To: KLA-TENCOR CORPORATION
Reel/Frame 018323/0734 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 24, 2005
From: LOPATIN, SERGEY D.; FIORDALICE, ROBERT; PINTCHOVSKI, FAIVEL; IVANOV, IGOR; KONG, WEN Z.; KOLICS, ARTUR
To: KLA-TENCOR TECHNOLOGIES CORPORATION
Reel/Frame 015816/0147 →