Spring plunger probe
A single-piece contact probe includes a tip, coil and base formed from a single piece of electrically conductive material. A helical groove is machined around the center portion of the probe then a bore is drilled from the base toward the tip along the longitudinal axis of the probe to form the coils.
1 . A spring contact probe comprising:
a tip portion,
a middle helical spring portion, and
a base portion,
said middle helical spring portion separating said tip portion and said base portion,
wherein said spring contact probe has a unitary construction.
2 . The spring contact probe of claim 1 further comprising a barrel having an open end and a reduced end wherein said tip portion extends from said reduced end and said base portion is secured within said open end.
3 . The spring contact probe of claim 1 further comprising a second tip portion extending from said base portion and axially aligned with said tip portion.
4 . A spring contact probe comprising:
a tip portion,
a middle portion extending from said tip portion,
a base portion extending from said middle portion,
an axial bore extending from said base portion through said middle portion,
said middle portion having a helical groove extending from an outside surface of said middle portion inwardly to said bore,
wherein said bore and said helical groove intersect to present a spring.
5 . A spring contact probe of claim 4 further comprising a barrel, having an open end and a reduced end, wherein said tip portion extends from said reduced end and said base portion is secured within said open end.
6 . A spring contact probe of claim 5 further comprising a barrel wherein said spring contact probe is secured within said barrel.
7 . A spring probe comprising:
a plunger,
a helical spring extending from said plunger,
a base extending from said helical spring,
wherein said plunger, helical spring and base are machined from a single piece of electrically conductive material.
8 . The spring contact probe of claim 7 further comprising a barrel having an open end and a reduced end wherein said tip portion extends from said reduced end and said base portion is secured within said open end.
9 . The spring contact probe of claim 7 further comprising a second tip portion extending from said base portion and axially aligned with said tip portion.