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App. No. 11/020,057 · Confirmation No. 4460

Methods for minimizing defects when transferring a semiconductor useful layer

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2007-05-17 ABN Abandonment 2 View
2006-10-19 CTNF Non-Final Rejection 8 View
2006-10-19 892 List of references cited by examiner 1 View
2006-10-19 1449 List of References cited by applicant and considered by examiner 2 View
2006-10-19 BIB Bibliographic Data Sheet 1 View
2006-10-19 FWCLM Index of Claims 1 View
2006-10-19 SRFW Search information including classification, databases and other search related notes 1 View
2006-10-06 SRNT Examiner's search strategy and results 1 View
2005-04-04 FWCLM Index of Claims 1 View
2005-03-23 FRPR Certified Copy of Foreign Priority Application 30 View
2005-02-17 PEFR Applicant Response to Pre-Exam Formalities Notice 3 View
2005-02-17 SPEC Specification 13 View
2005-02-17 CLM Claims 3 View
2005-02-17 ABST Abstract 1 View
2005-02-17 DRW Drawings-only black and white line drawings 2 View
2005-02-17 OATH Oath or Declaration filed 2 View
2005-02-17 PA.. Power of Attorney 7 View
2005-02-17 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2005-02-17 FOR Foreign Reference 17 View
2005-02-17 FOR Foreign Reference 11 View
2005-02-03 PEFN Pre-Exam Formalities Notice 2 View
2004-12-21 TRNA Transmittal of New Application 2 View
2004-12-21 SPEC Specification 13 View
2004-12-21 CLM Claims 3 View
2004-12-21 ABST Abstract 1 View
2004-12-21 DRW Drawings-only black and white line drawings 2 View
2004-12-21 OATH Oath or Declaration filed 2 View
2004-12-21 WFEE Fee Worksheet (SB06) 1 View
2004-12-21 WFEE Fee Worksheet (SB06) 1 View
2004-12-21 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
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Quick Facts
App. No.
11/020,057
Filed
2004-12-21
Pub. No.
US20060040470A1
Art Unit
2822