IP Library › Granted Patent US 7,432,119
Granted Patent B2
US 7,432,119 · App. 11/032,882 · Granted Oct 7, 2008

Light emitting diode with conducting metal substrate

Assignee: Semileds Corporation
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Quick Facts
Patent No.
US 7,432,119
App. No.
11/032,882
Granted
Oct 7, 2008
Kind
B2
Abstract

Systems and methods for fabricating a light emitting diode include forming a multilayer epitaxial structure above a carrier substrate; depositing at least one metal layer above the multilayer epitaxial structure; removing the carrier substrate.

Claims (18)

1. A method for fabricating an n-GaN up light-emitting diode (LED) wafer, comprising:

providing a carrier substrate;

depositing an n-GaN portion above the carrier substrate;

depositing one or more active layers above the n-GaN portion;

depositing a p-GaN portion above the active layers;

depositing one or more first metal layers above the p-GaN portion;

applying a masking layer above the first metal layers;

etching portions of the first metal layers, the p-GaN layer, the active layers, and the n-GaN layer according to the masking layer;

removing the masking layer;

depositing a passivation layer above remaining portions of the first metal layers, the p-GaN layer, the active layers, and the n-GaN layer;

removing a portion of the passivation layer to expose the remaining portions of the first metal layers;

depositing two or more second metal layers to form a metal substrate; wherein depositing the two or more second metal layers comprises at least one of chemical vapor deposition, electrochemical deposition, electroless chemical deposition, plasma enhanced chemical vapor deposition, physical vapor deposition, atomic layer deposition, metal organic chemical vapor deposition, evaporation, ion beam deposition, sputtering and plasma spray; and

removing the carrier substrate to expose the n-GaN portion.

2. The method of claim 1 , wherein the n-GaN up LED wafer is substantially smooth and flat.

3. The method of claim 2 , wherein the n-GaN up LED wafer has a surface roughness less than 10000 angstrom.

4. The method of claim 1 wherein the carrier substrate is sapphire.

5. The method of claim 1 , wherein the metal substrate is a metal or metal alloy comprising at least one of copper, nickel, aluminum, Ti, Ta, Mo, and W.

6. The method of claim 1 , wherein removing the carrier substrate comprises at least one of laser lift-off (LLO), wet etching, and chemical mechanical polishing (CMP).

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 17, 2013
From: CHINA SEMILEDS CO., LTD.
To: FOSHAN NATIONSTAR SEMICONDUCTOR CO., LTD.
Reel/Frame 030621/0276 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF ASSIGNEE PREVIOUSLY RECORDED ON REEL 026211 FRAME 0510. ASSIGNOR(S) HEREBY CONFIRMS THE CHINA SEMILEDS OPTOELECTRONICS CO. LTD.. Recorded May 12, 2011
From: SEMILEDS CORPORATION
To: CHINA SEMILEDS CO., LTD.
Reel/Frame 026267/0168 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2011
From: SEMILEDS CORPORATION
To: CHINA SEMILEDS OPTOELECTRONICS CO., LTD.
Reel/Frame 026211/0510 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2005
From: DOAN, TRUNG TRI
To: SEMILEDS CORPORATION
Reel/Frame 016916/0874 →
Continuity (1)
Related Publication 20060154389A1 · Jul 13, 2006