Method and apparatus for cleaning and surface conditioning objects with plasma
A method and apparatus for cleaning and surface conditioning objects using plasma is disclosed. One embodiment of the method discloses providing a plurality of elongated dielectric barrier plates arranged adjacent each other, the plates having inner electrodes connected therein, introducing the objects proximate the plates, and producing a dielectric barrier discharge to form plasma between the objects and the plates for cleaning at least a portion of the objects. One embodiment of the apparatus for cleaning objects using plasma discloses a plurality of elongated dielectric barrier plates arranged adjacent each other, and a plurality of inner electrodes, each contained within, and extending substantially along the length of, respective ones of the elongated dielectric barrier plates.
1 . An apparatus for cleaning objects using plasma, comprising:
a plurality of elongated dielectric barrier plates, arranged adjacent each other and spaced apart to define predetermined gaps therebetween; and
a plurality of inner electrodes, each contained within, and extending substantially along the length of, respective ones of the elongated dielectric barrier plates.
2 . The apparatus of claim 1 , wherein each plate comprises a top and a bottom having a height “h” defined therebetween, and each inner electrode is positioned substantially equidistant between the top and bottom and extends between the top and bottom less than the height “h”.
3 . The apparatus of claim 1 , wherein the objects comprise a plurality of conductive probes, the probes arranged and configured to be introduced proximate the elongated dielectric barrier plates.
4 . The apparatus of claim 3 , further comprising a voltage source electrically coupled to the inner electrodes for producing a dielectric barrier discharge between the conductive probes and the elongated dielectric barrier plates, whereby plasma is formed to clean at least a portion of the probes.
5 . The apparatus of claim 3 , wherein the elongated dielectric barrier members are arranged to define a plane.
6 . The apparatus of claim 5 , wherein the elongated dielectric barrier members are spaced apart from each other at substantially regular intervals to define substantially regular predetermined gaps therebetween.
7 . The apparatus of claim 6 , wherein each predetermined gap is sized to allow at least a portion of the conductive probes to be introduced between the elongated dielectric barrier plates.
8 . The apparatus of claim 7 , wherein each predetermined gap is sized from about 0 mm to about 10 mm.
9 . The apparatus of claim 1 , wherein each elongated dielectric barrier plate is arranged in parallel to the next adjacent elongated plate.
10 . The apparatus of claim 1 , further comprising a plurality of ground electrodes, each arranged within each of the predetermined gaps.
11 . The apparatus of claim 10 , wherein the objects comprise a plurality of non-conductive probes, the probes arranged and configured to be introduced proximate the elongated dielectric barrier plates and ground electrodes.
12 . The apparatus of claim 11 , further comprising a voltage source electrically coupled to the inner electrodes for producing a dielectric barrier discharge between the ground electrodes and the elongated dielectric barrier plates, whereby plasma is formed to clean at least a portion of the non-conductive probes.
13 . The apparatus of claim 10 , wherein the shape of the ground electrodes is selected from a group consisting of spherical, square, rectangular, oval, polygonal, triangular and irregularly geometric.
14 . The apparatus of claim 1 , further comprising a plurality of ground electrodes positioned on the outer surfaces, and spaced apart along the length, of the elongated dielectric barrier plates.
15 . The apparatus of claim 14 , wherein each electrode comprises upwardly extending portions.
16 . The apparatus of claim 15 , wherein the objects comprise a plurality of non-conductive probes, the probes arranged and configured to be introduced proximate the elongated dielectric barrier plates and between the upwardly extending portions of the ground electrodes.
17 . The apparatus of claim 16 , further comprising a voltage source electrically coupled to the inner electrodes for producing a dielectric barrier discharge between the upwardly extending portions of the ground electrodes along the outer surfaces of the elongated dielectric barrier plates, whereby plasma is formed to clean at least a portion of the non-conductive probes.
18 . The apparatus of claim 14 , wherein the plurality of ground electrodes are discrete ground electrode extending outwardly and substantially perpendicular to the outer surface of the elongated dielectric barrier plates.
19 . The apparatus of claim 1 , wherein the elongated dielectric barrier plates are arranged in a microtiter plate matrix format.
20 . The apparatus of claim 1 , wherein the elongated dielectric barrier plates are arranged in a non-planar configuration.
21 . A method for cleaning a plurality of non-conductive objects, comprising:
providing a plurality of elongated dielectric barrier plates, each having inner electrodes arranged therein, the plates spaced apart to define a predetermined gap therebetween;
providing a plurality of ground electrodes adjacent the elongated dielectric barrier plates;
introducing non-conductive objects proximate the elongated dielectric barrier plates and the ground electrodes; and
generating a dielectric barrier discharge to form plasma between the elongated dielectric barrier plates and respective ground electrodes for cleaning at least a portion of each of the non-conductive objects.
22 . The method of claim 21 , wherein the plasma comprises energetic and reactive particles selected from a group consisting of electrons, ions, excited and metastable species, and free radicals.
23 . The method of claim 21 , wherein the plasma comprises energetic and reactive particles selected from a group consisting of: excited and metastable species of N 2 , N, O 2 , O; free radicals such as OH, NO, O, and O 3 ; and ultraviolet photons ranging in wavelengths from 200 to 400 nanometers resulting from N 2 , NO, and OH emissions.