Method of evaluating film thickness, method of detecting polishing terminal, and device-manufacturing apparatus
View Patent ↗A method of evaluating a thickness of a film during a polishing process includes the steps of irradiating light onto a surface of the film during the polishing process; obtaining a differential signal of reflection spectra at a polishing time t and a polishing time t−Δt with a time difference Δt from the polishing time t; and analyzing the differential signal to obtain a thickness d of the film at the polishing time t.
1. A method of evaluating a thickness of a film during a polishing process, comprising:
irradiating light for providing spectra onto a surface of the film during the polishing process,
obtaining a differential signal of reflection spectra at a polishing time t and a polishing time t−Δt with a time difference Δt therebetween to obtain a specific component of reflective light with high intensity and low noise components, and
analyzing the differential signal of the reflection spectra to obtain a thickness d of the film at the polishing time t.
2. A method according to claim 1 , wherein in the step of analyzing the differential signal, a cycle of the differential signal is determined so that the thickness d is obtained from the cycle.
3. A method according to claim 1 , wherein in the step of analyzing the differential signal, a thickness change Δd of the film in the time difference Δt is set to have a proportion Δd/d relative to the thickness d less than one-fifth so that the differential signal is analyzed by using the thickness change Δd to obtain the thickness d.
4. A method according to claim 1 , wherein in the step of analyzing the differential signal, a thickness change Δd of the film in the time difference Δt is obtained as a product of the time difference Δt and a known polishing rate so that the differential signal is analyzed by using the thickness change Δd to obtain the thickness d.
5. A method according to claim 1 , wherein in the step of analyzing the differential signal, a thickness change Δd of the film in the time difference Δt is set to be Δd=λ 2 /(4n) or a range of λ 1 /(4n)≦Δd≦λ 2 /(4n), wherein n is a refraction index of the film and a measurement range of the reflection spectra is between λ 1 and λ 2 , so that the differential signal is analyzed by using the thickness change Δd to obtain the thickness d.
6. A method according to claim 1 , wherein in the step of obtaining the differential signal of the reflection spectra, said reflection spectra are expressed by an optical model with a wave number dependency and the differential signal is obtained from a differential component of the reflection spectra so that the differential signal does not have the wave number dependency.
7. A method according to claim 1 , wherein the film is formed on a wafer for producing a plurality of chips, and in the step of irradiating light, the light has a spot size greater than a size of the chips.
8. A method of detecting a polishing terminal during a polishing process of a film, comprising:
irradiating light for providing spectra onto a surface of the film during the polishing process,
obtaining a differential signal of reflection spectra at a polishing time t and a polishing time t−Δt with a time difference Δt therebetween to obtain a specific component of reflective light with high intensity and low noise components,
analyzing the differential signal of the reflection spectra to obtain a thickness of the film at the polishing time t, and
determining the polishing terminal based on the thickness.
9. A method according to claim 1 , wherein the light to be irradiated contains multiple spectra.
10. A method according to claim 9 , wherein the light to be irradiated is a continuous light.