Diode and method for manufacturing the same
View Patent ↗A diode is provided which includes a first-conductivity-type cathode layer, a first-conductivity-type drift layer placed on the cathode region and having a lower concentration than the cathode layer, a generally ring-like second-conductivity-type ring region formed in the drift layer, second-conductivity-type anode region formed in the drift layer located inside the ring region, a cathode electrode formed in contact with the cathode layer, and an anode electrode formed in contact with the anode region, wherein the lowest resistivity of the second-conductivity-type anode region is at least 1/100 of the resistivity of the drift layer, and the thickness of the anode region is smaller than the diffusion depth of the ring region.
1. A diode comprising:
a first-conductivity-type first region having a first impurity concentration;
a first-conductivity-type second region placed on said first region and having a second impurity concentration that is lower than said first impurity concentration;
a generally ring-like second-conductivity-type third region formed in a surface layer of said second region;
a second-conductivity-type fourth region formed in a surface layer of said second region located inside said third region;
a first-conductivity-type fifth region formed in contact with a portion of said first region that is located below said fourth region surrounded by said third region, said fifth region having a lower resistivity than said second region;
a first main electrode formed in contact with said first region; and
a second main electrode formed in contact with said fourth region,
wherein said fifth region is formed only inside a vertical projection of said third region, and said second region includes a first portion located on said fifth region, and a second portion located under said third region, said first portion having a smaller thickness than said second portion.
2. A diode according to claim 1 , wherein said fifth region is formed inside the vertical projection of said third region, with a spacing of 5 μm or larger between a periphery of the fifth region and the vertical projection.