X-ray micro-tomography system optimized for high resolution, throughput, image quality
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
1. A projection x ray imaging system for imaging three dimensional structures, comprising:
an x-ray source for generating an x ray beam;
a sample motion stage system for rotating a sample around both polar (φ roll) and azimuthal (θ pitch) axes with respect to the x ray beam to enable tomographic data acquisition and comprising two rotation stages, with a φ stage located on a θ stage;
a detector system for detecting the x ray beam after interaction with the sample; and
a controller that receives image data of multiple images from the detector system taken while rotating the sample using the φ stage and the θ stage and performing tomographic reconstruction to create three dimensional images of the structures in the sample from the multiple images.
2. A projection x ray imaging system as claimed in claim 1 , wherein the x-ray source is a micro-focused or nano-focused x-ray source.
3. A projection x ray imaging system as claimed in claim 1 , wherein a source size of the x ray source is less than 50 μm.
4. A projection x ray imaging system as claimed in claim 1 , wherein a source size of the x ray source is less than 5 μm.
5. A projection x ray imaging system as claimed in claim 1 , wherein the θ stage has an axis of rotation that is perpendicular to the x-ray beam, and the φ stage has an axis of rotation that is perpendicular to a plane of the sample, to perform conical tilt tomography data acquisition.
6. A projection x ray imaging system as claimed in claim 5 , wherein the φ-stage has a restricted rotation range of between −90 and +90 degrees.
7. A projection x ray imaging system as claimed in claim 5 , wherein the φ-stage has a restricted rotation range of between −45 and +45 degrees.
8. A projection x ray imaging system as claimed in claim 5 , wherein the θ stage has a restricted rotation range of between −70 and +70 degrees.
9. A projection x ray imaging system as claimed in claim 5 , wherein the φ-stage comprises a goniometer.
10. A projection x ray imaging system as claimed in claim 5 , wherein the φ-stage has only about two positions with about 90 degrees of separation.
11. A projection x ray imaging system as claimed in claim 1 , wherein a distance between the sample and the source is between 1 and 10 millimeters (mm).
12. A projection x ray imaging system as claimed in claim 1 , wherein a distance between the sample and the source is less than 2 mm.
13. A projection x ray imaging system as claimed in claim 1 , further comprising:
a sample holder for holding the sample; and
an x, y, z alignment stage on the φ stage for carrying the sample holder, the x, y, z alignment stage enabling positioning of the sample on the φ stage.
14. A projection x ray imaging system as claimed in claim 13 , wherein the x, y, z alignment stage comprises a first axis rail for positioning along a first axis and supporting the sample holder, a second axis rail for positioning along a second axis and supporting the first axis rail; and third axis rail for positioning along a third axis and supporting the second axis rail.