Patent Assignment
Reel/Frame 031938/0108
Merger
Recorded: 2014-01-10
Pages: 9
Assignor
XRADIA, INC.
Executed: 2013-07-12
Assignee
CARL ZEISS X-RAY MICROSCOPY, INC.
4385 HOPYARD ROAD, SUITE 100, PLEASANTON, CALIFORNIA, 94588
Covered Properties
(39)
Compound X-Ray Lens Having Multiple Aligned Zone Plates
Patent:
8,737,565 →
Application:
13/941,036 →
Stacked Zone Plates for Pitch Frequency Multiplication
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruction System and Method
Element-Specific X-Ray Fluorescence Microscope and Method of Operation
Element-Specific X-Ray Fluorescence Microscope and Method of Operation
Phase Contrast Microscope for Short Wavelength Radiation and Imaging Method
Short Wavelength Metrology Imaging System
Fabrication Methods for Micro Compound Optics
X-Ray Microscope Capillary Condenser System
Patent:
7,170,969 →
Application:
10/704,381 →
Scintillator Optical System and Method of Manufacture
Patent:
7,057,187 →
Application:
10/704,382 →
Low Pass X-Ray Scintillator System
Lens Bonded X-Ray Scintillator System and Manufacturing Method Therefor
Optimized X-Ray Energy for High Resolution Imaging of Integrated Circuits Structures
Patent:
7,394,890 →
Application:
10/983,415 →
High Resolution Direct-Projection Type X-Ray Microtomography System Using Synchrotron or Laboratory-Based X-Ray Source
Patent:
7,130,375 →
Application:
11/035,749 →
High Resolution Direct-Projection Type X-Ray Microtomography System Using Synchrotron or Laboratory-Based X-Ray Source
Patent:
7,400,704 →
Application:
11/537,806 →
X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality
Patent:
7,215,736 →
Application:
11/072,635 →
X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality
X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality
Dual-Band Detector System for X-Ray Imaging of Biological Samples
Near-Field X-Ray Fluorescence Microprobe
Patent:
7,095,822 →
Application:
11/191,611 →
Fast X-Ray Lenses and Fabrication Method Therefor
Patent:
7,365,918 →
Application:
11/200,654 →
X-Ray Mammography
Patent:
7,412,024 →
Application:
11/244,825 →
X-Ray Microscope with Microfocus Source and Wolter Condenser
Patent:
7,406,151 →
Application:
11/533,863 →
Structured Anode X-Ray Source for X-Ray Microscopy
Patent:
7,443,953 →
Application:
11/609,266 →
System and Method for Fuel Cell Material X-Ray Analysis
High Aspect-Ratio X-Ray Diffractive Structure Stabilization Methods and Systems
Cd-Gisaxs System and Method
Five Axis Compensated Rotating Stage
Alignment Assembly
X-Ray Microscope with Switchable X-Ray Source
Patent:
7,813,475 →
Application:
12/401,740 →
Mechanism for Switching Sources in X-Ray Microscope
Patent:
7,796,725 →
Application:
12/401,750 →
Process for Examining Mineral Samples with X-Ray Microscope and Projection Systems
Patent:
8,068,579 →
Application:
12/421,380 →
System and Method for Quantitative Reconstruction of Zernike Phase-Contrast Images
Patent:
7,787,588 →
Application:
12/506,946 →
Metrology and Registration System and Method for Laminography and Tomography
Patent:
7,974,379 →
Application:
12/556,341 →
Method and System for Tomographic Projection Correction
Patent:
8,353,628 →
Application:
12/631,739 →
Verification of Integrated Circuits Against Malicious Circuit Insertions and Modifications Using Non-Destructive X-Ray Microscopy
Method for Examining Structures on a Semiconductor Substrate
Compound X-Ray Lens Having Multiple Aligned Zone Plates
Patent:
8,526,575 →
Application:
12/855,463 →
Achromatic Fresnel Optics for Ultraviolet and X-Ray Radiation
Related Assignments
(12)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 29, 2002
From: YUN, WENBING; NILL, KENNETH W.
To: XRADIA, INC.
Reel/Frame 012949/0655 →
Assignment of Assignor's Interest
Feb 12, 2004
From: YUN, WENBING; WANG, YUXIN; FESER, MICHAEL; LYON, ALAN
To: XRADIA, INC.
Reel/Frame 014326/0645 →
Assignment of Assignor's Interest
Apr 9, 2004
From: YUN, WENBING; DUEWER, FREDERICK WILLIAM; WANG, YUXIN
To: XRADIA, INC.
Reel/Frame 014490/0334 →
Assignment of Assignor's Interest
Apr 15, 2004
From: YUN, WENBING; WANG, YUXIN
To: XRADIA, INC.
Reel/Frame 014504/0722 →
Assignment of Assignor's Interest
May 19, 2004
From: YUN, WEINBING; WANG, YUXIN; TRAPP, DAVID R.
To: XRADIA, INC.
Reel/Frame 014651/0531 →
Assignment of Assignor's Interest
Jun 14, 2004
From: YUN, WENBING; WANG, YUXIN; TRAPP, DAVID R.
To: XRADIA, INC.
Reel/Frame 015451/0937 →
Assignment of Assignor's Interest
Mar 3, 2005
From: YUN, WENBING; WANG, YUXIN; SCOTT, DAVID DEAN
To: XRADIA, INC.
Reel/Frame 015830/0444 →
Assignment of Assignor's Interest
Apr 1, 2005
From: WANG, YUXIN; YUN, WENBING; SCOTT, DAVID DEAN
To: XRADIA, INC.
Reel/Frame 015995/0340 →
Assignment of Assignor's Interest
Apr 13, 2005
From: WANG, YUXIN; YUN, WENBING; DUEWER, FREDERICK WILLIAM
To: XRADIA, INC.
Reel/Frame 016062/0884 →
Assignment of Assignor's Interest
Jul 11, 2005
From: YUN, WENBING; SCOTT, DAVID DEAN; TRAPP, DAVID R.; DUEWER, FREDERICK WILLIAM
To: XRADIA, INC.
Reel/Frame 016497/0175 →
Assignment of Assignor's Interest
Apr 11, 2013
From: CASE, THOMAS A.; CANDELL, SUSAN; SESHADRI, SRIVATSAN; MCGUINNESS, PAUL
To: XRADIA, INC.
Reel/Frame 030193/0276 →
Assignment of Assignor's Interest
Dec 12, 2013
From: FESER, MICHAEL; LYON, ALAN FRANCIS
To: CARL ZEISS X-RAY MICROSCOPY, INC.
Reel/Frame 031770/0443 →