X-ray microscope with switchable x-ray source
An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.
1. An x-ray imaging system, comprising:
a synchrotron for generating a synchrotron radiation beam;
an integrated x-ray source for generating a source radiation beam; and
an imaging system that alternately receives the source radiation beam of the integrated x-ray source and the synchrotron radiation beam of the synchrotron, and includes a sample stage controlled by linear translation stages, an objective lens, and an x-ray sensitive detector system on a fixed optical table, wherein the objective lens forms an image of a sample, held on the sample stage, on the detector system using the source radiation beam or the synchrotron radiation beam.
2. An x-ray imaging system as claimed in claim 1 , wherein the integrated x-ray source is a electron bombardment source including a rotating anode, a microfocus, or an x-ray tube source.
3. An x-ray imaging system as claimed in claim 1 , wherein the x-ray imaging system includes a zone plate lens as an objective lens.
4. An x-ray imaging system as claimed in claim 1 , wherein the x-ray imaging system includes a compound refractive lens as the objective lens.
5. An x-ray imaging system as claimed in claim 1 , further comprising beam conditioning optics for modifying x-ray emission characteristics of the synchrotron radiation beam to meet requirements of the x-ray imaging system.
6. An x-ray imaging system as claimed in claim 5 , wherein the beam conditioning optics include a diffractive element including a grating or Fresnel zone plate lens.
7. An x-ray imaging system as claimed in claim 5 , wherein the beam conditioning optics include a reflective element including an ellipsoidal lens or a Wolter mirror.
8. An x-ray imaging system as claimed in claim 5 , wherein the beam conditioning optics include a compound refractive lens.
9. An x-ray imaging system as claimed in claim 5 , wherein the beam conditioning optics include a rotating mirror assembly rotating about the beam axis.
10. An x-ray imaging system as claimed in claim 5 , wherein the beam conditioning optics include a capillary lens.
11. An x-ray imaging system as claimed in claim 5 , further comprising an optical assembly comprising the integrated source, an energy filter for filtering the source radiation beam, and a condenser for focusing the source radiation beam that is received by the imaging system.
12. An x-ray imaging system as claimed in claim 11 , wherein the optical assembly replaces the beam conditioning optics in an optical path when the imaging system is configured to receive the source radiation beam.
13. An x-ray imaging system as claimed in claim 1 , wherein the imaging system includes a full-field imaging x-ray microscope.
14. An x-ray imaging system as claimed in claim 1 , wherein the imaging system includes a scanning x-ray microscope.
15. An x-ray imaging system as claimed in claim 1 , further including a grating-based wavelength energy filter for filtering only the source radiation beam.
16. An x-ray imaging system as claimed in claim 1 , further including one or more absorptive energy filters for filtering only the source radiation beam.
17. An x-ray imaging system as claimed in claim 1 , further comprising an optical assembly comprising the integrated source, an energy filter for filtering the source radiation beam, and a condenser for focusing the source radiation beam that is received by the image system.