IP Library Granted Patent US 7,800,072
Granted Patent B2
US 7,800,072 · App. 11/278,836 · Granted Sep 21, 2010

Low pass X-ray scintillator system

Assignee: Xradia, Inc.
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Quick Facts
Patent No.
US 7,800,072
App. No.
11/278,836
Granted
Sep 21, 2010
Kind
B2
Abstract

A scintillated CCD detector system for imaging x rays uses x-rays having a photon energy in the range of 1 to 20 keV. The detector differs from existing systems in that it provides extremely high resolution of better than a micrometer, and high detection quantum efficiency of up to 95%. The design of this detector also allows it to function as an energy filter to remove high-energy x-rays. This detector is useful in a wide range of applications including x-ray imaging, spectroscopy, and diffraction. The scintillator optical system has scintillator material with a lens system for collecting the light that is generated in the scintillator material. A substrate is used for spacing the scintillator material from the lens system.

Claims (21)

1. A scintillator optical system, comprising:

scintillator material for producing light from X-rays, the scintillator material being single crystal and having a thickness in direction of an optical axis that is less than 15 micrometers to function as a low pass filter of the X-rays by only converting lower energy X-rays to the light; and

a substrate, to which the scintillator material is bonded, the substrate having a refractive index that is matched to the scintillator material.

2. A scintillator optical system as claimed in claim 1 , wherein the scintillator material is thallium doped CsI or LSO.

3. A scintillator optical system as claimed in claim 1 , wherein the scintillator material is less than 10 micrometers thick.

4. A scintillator optical system as claimed in claim 1 , wherein the substrate is glass.

5. A scintillator optical system as claimed in claim 1 , wherein the substrate is sapphire.

6. A scintillator optical system, comprising scintillator material for producing light from X-rays, the scintillator material being doped with thallium through a surface of the scintillator material to a depth of less than 15 micrometers in a direction of an optical axis selected to function as a low pass filter of the X-rays by only converting lower energy X-rays to the light.

7. A scintillator optical system as claimed in claim 6 , wherein the scintillator material is crystalline.

8. A scintillator optical system as claimed in claim 6 , wherein the scintillator material is thallium doped CsI or LSO.

9. A scintillator optical system as claimed in claim 6 , wherein depth of the doping is less than 10 micrometers thick.

10. A method for configuring a scintillator optical system, comprising:

selecting a single crystal scintillator material;

selecting a thickness of the scintillator material for producing light from X-rays in direction of an optical axis to be less than 15 micrometers to function as a low pass filter of the X-rays by only converting lower energy X-rays to the light; and

bonding the scintillator material to a substrate having a refractive index that is matched to the scintillator material.

11. A method as claimed in claim 10 , wherein the scintillator material is less than 10 micrometers thick.

12. A method as claimed in claim 10 , wherein the substrate is glass.

13. A method as claimed in claim 10 , wherein the substrate is sapphire.

14. A method for configuring a scintillator optical system, comprising:

selecting scintillator material for producing light from X-rays; and

doping through a surface of the scintillator material with thallium to a depth, which is less than a thickness of the scintillator material, in a direction of an optical axis selected to function as a low pass filter of the X-rays by only converting lower energy X-rays to the light.

Assignments (1)
MERGER Recorded Jan 10, 2014
From: XRADIA, INC.
To: CARL ZEISS X-RAY MICROSCOPY, INC.
Reel/Frame 031938/0108 →
Continuity (2)
Division 1070438200 · Nov 7, 2003
Related Publication 20060163501A1 · Jul 27, 2006